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Cameras

Within this work [7] a method and model to determine the optical transfer function (OTF) for the detector chain without detailed knowledge of the internal detector and camera characteristics was developed. The expected value of the signal S0.2 is calculated with... [Pg.211]

The eombination in a compact system of an infrared sensor and a laser as excitation source is called a photothermal camera. The surface heating is aehieved by the absorption of the focused beam of a laser. This localisation of the heating permits a three-dimensional heat diffusion in the sample to be examined. The infrared (IR) emission of the surface in the neighbourhood of the heating spot is measured by an infrared detector. A full surface inspection is possible through a video scanning of the excitation and detection spots on the piece to test (figure 1). [Pg.393]

Figure 2 Surface-breaking crack signal of a Photothermal camera (theory)... Figure 2 Surface-breaking crack signal of a Photothermal camera (theory)...
The principle of the photothermal camera is known for decades (see ref. 1) but did not offer sufficient performances to permit this instrument to find an industrial issue. The main reason of that lack of success Is the poor efficiency of the previous configurations when applied on industrial products (figures 3, 4, 5) ... [Pg.394]

Figure 5 Fig 4. part inspection with a conventional nhotothermal camera the crack indications can he seen hut not much than optical indications associated to the rough... [Pg.395]

To overcome these limitations, the new photothermal camera developed by FRAMATOME and ONERA (figure 6) ... [Pg.395]

Figure 6 Fig 4. part inspection with the new desien ofnhotothermal camera only the crack indications can be seen in spite of the rough surface condition (no more false alarms). [Pg.396]

Figure 7 New photothermal camera versus penetrant testing on a crack (width 5 pm) at the surface of Fig 4. part The large arrow shows that the PT indication almost extinguishes at thinner width (approx. I pm) locations along the crack the photothermal signal does not. The bottom little arrow indicates a place where the crack splits in two, which is not revealed on the PT image because of the spreading of the penetrant liquuid. Figure 7 New photothermal camera versus penetrant testing on a crack (width 5 pm) at the surface of Fig 4. part The large arrow shows that the PT indication almost extinguishes at thinner width (approx. I pm) locations along the crack the photothermal signal does not. The bottom little arrow indicates a place where the crack splits in two, which is not revealed on the PT image because of the spreading of the penetrant liquuid.
Figure 8 Sensitivity of the new photothermal camera to small depth defects. lmage of an EDM notch of 1mm long, 100 pm width and 200 pm depth on ANSI 304 stainless steel with a bad surface condition (ground surface, "Vi 2 -6 ). Figure 8 Sensitivity of the new photothermal camera to small depth defects. lmage of an EDM notch of 1mm long, 100 pm width and 200 pm depth on ANSI 304 stainless steel with a bad surface condition (ground surface, "Vi 2 -6 ).
A new design of an old concept of thermal surface inspection permits the photothermal camera to be considered as an interesting alternative to NDT methods like penetrant or magnetic testing, particularly when the testing has to be made in a remote or automatic way. [Pg.398]

For a few months, results obtained on a pre-industrial version of this new photothermal camera allow this technology to enter into the industrial step of its development. [Pg.398]

For the examination of the applied metallic or ceramic layer, the test object is heated up from the outside The heat applying takes place impulse-like (4ms) by xenon-flash lamps, which are mounted on a rack The surface temperature arises to approx 150 °C Due to the high temperature gradient the warmth diffuses quickly into the material An incorrect layer, e g. due to a delamiation (layer removal) obstructs the heat transfer, so that a higher temperature can be detected with an infrared camera. A complete test of a blade lasts approximatly 5 minutes. This is also done automatically by the system. In illustration 9, a typical delamination is to be recognized. [Pg.405]

Table 4 shows, the sources are available with physical sizes ranging from 1 mm x 1 mm up to 3 mm x 3 mm. They are produced from firmly compressed selenium pellets of cylindrical shape. The activities range up to 3 TBq or 80 Ci, which is the maximum allowed loading of the GammaMat SE portable isotope transport and working container, as well as the Source Projector M-Se crawler camera. [Pg.425]

The GammaMat M isotope pipeline crawlers previously have been used with exposure cameras for iridium the models M6 and Ml 8 used exposure units designed for a maximum loading of 2.2 TBq (60Ci) and 3.7 TBq (lOOCi), respectively. [Pg.427]

Practical applications [2] of a GammaMat M model using the new Selenium crawler camera loaded with approx. 1 TBq (30Ci) on a pipeline of diameter 12 and wall thickness of 0.25 showed 6-7 m axial distance to the exposed source as limit of the radiation controlled area (40pSv/h) and 22m perpendicular to the pipeline. Other authors [3] have reported about a comparison for Ir-192 and Selenium source on a 4.5 diameter pipe and 0,125 steel thickness they have found for 0.7 Tbq (18Ci) Selenium a value of 1 Om behind the film (in the unshielded beam) comparing under same conditions to approx. 40m for Iridium. [Pg.428]

X-ray specimen image inter sifier tandem optics camera digital image processing monitor... [Pg.436]

The zoom optics between the image intensifier and the video camera gives the freedom to magnify details of the image for more detailed inspection. [Pg.455]

Three Dimensional Defect Analysis Using Stereoradioscopy Based on Camera Modelling. [Pg.484]

In the following sections our approach to stereoradioscopy will be described in detail. At first, the camera model and the calibration procedure are introduced, in the second part, the calculation of 3D defect positions and the volume estimation procedure are explained. [Pg.485]

To describe the X-ray imaging system the projection of 3D object points onto the 2D image plane, and nonlinear distortions inherent in the image detector system have to, be modelled. A parametric camera model based on a simple pinhole model to describe the projection in combination with a polynomal model of the nonlinear distortions is used to describe the X-ray imaging system. The parameters of the model are estimated using a two step approach. First the distortion parameters for fixed source and detector positions are calculated without any knowledge of the projection parameters. In a second step, the projection parameters are calculated for each image taken with the same source and detector positions but with different sample positions. [Pg.485]

In this section the camera model based on a projection model and the polynomal model of the image detector distortions will be described (figure 2). [Pg.485]

The camera model has a high number of parameters with a high correlation between several parameters. Therefore, the calibration problem is a difficult nonlinear optimization problem with the well known problems of instable behaviour and local minima. In out work, an approach to separate the calibration of the distortion parameters and the calibration of the projection parameters is used to solve this problem. [Pg.486]

Based on the camera model the distortion parameters are calculated for fixed source and detector positions without any knowledge of the projection parameters. [Pg.486]

The epipolar constrains calculated using the estimated camera parameters restrict the search for corresponding image features in different images to a ID search. Taking the uncertainty of the epipolar constrains into account, in our approach, the search is restricted to a small area around the epipolar lines in the images. [Pg.489]


See other pages where Cameras is mentioned: [Pg.210]    [Pg.211]    [Pg.211]    [Pg.393]    [Pg.393]    [Pg.393]    [Pg.393]    [Pg.394]    [Pg.394]    [Pg.398]    [Pg.398]    [Pg.400]    [Pg.401]    [Pg.402]    [Pg.402]    [Pg.436]    [Pg.443]    [Pg.444]    [Pg.450]    [Pg.450]    [Pg.484]    [Pg.485]    [Pg.485]    [Pg.486]    [Pg.488]    [Pg.489]    [Pg.490]   
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12 bit CCD-camera

A Camera Using

Alignment camera

Angular dispersive cameras

Anomalous Dispersion Camera

Auger cameras

Automatic camera cells

Back-reflection Laue camera

Back-reflection focusing camera

Back-reflection pinhole camera

Birmingham positron camera

Block camera system

Bonse Hart camera

Bonse-Hart Camera Ultrasmall Angle X-Ray Scattering (USAXS)

Buerger camera

Buerger precession camera

CCD camera

CCD camera image

CMOS-Camera

Camera (helicopter

Camera 0 rotation alignment

Camera Obscured

Camera Technologies

Camera batteries

Camera calibration

Camera cells

Camera characterisation

Camera constant

Camera cylindrical

Camera design

Camera devices, types

Camera film

Camera flat plate

Camera length

Camera lenses

Camera lucida

Camera obscura

Camera oscillation

Camera point focus

Camera precession

Camera rotation

Camera system

Camera technologies charge-coupled devices

Camera trap

Camera types

Camera, cameras

Camera, cameras

Camera, cameras video

Camera, printers

Camera, streak imaging

Camera-based monitoring systems

Camera-based systems

Camera-ready artwork

Camera-vision systems

Cameras Debye-Scherrer cylindrical powder

Cameras and Diffractometers

Cameras focusing

Cameras for special conditions

Cameras for x-ray diffraction

Cameras moving-film

Cameras powder

Cameras recycling

Cameras rotation/oscillation

Cameras single-crystal rotation

Cameras small-angle

Cameras, measuring (thermographic imagers)

Cameras, nonmeasuring (thermal viewers)

Cell phone cameras

Charge-Injection devices camera system

Charge-coupled device camera

Charge-coupled device camera systems

Charge-coupled television camera

Charged coupled device camera

Coincidence scintillation camera

Color Cameras

Colorimetrically-based camera characterisation

Colour cameras

Computer-controlled display camera

Cooled charge-coupled device camera

Debye-Scherrer Cylindrical Powder Camera The Plan View

Debye-Scherrer camera

Debye-Scherrer powder camera

Detector CCD camera

Detectors streak camera

Diffraction camera

Digital camera characterisation

Digital camera circuit

Digital cameras

Digital cameras, quantitative evaluation with

Digital optical cameras

Digital scintillation cameras

Direct Calibration for the Kratky Camera

Direct measurement of static contact angle by video camera or goniometer

Documentation With Digital Cameras

Double focussing, mirror-monochromator cameras

Double monochromator camera

Dual-head coincidence cameras

Electronic camera

Elliott toroid camera

Energy-dispersive camera

Evaluation Using a Digital Camera

Evolution of IR Cameras

Experimental high-speed camera imaging

Femtosecond streak camera

Flat film camera

Fluorescence imaging, camera selection

Focal plane camera

Framing camera

Franks camera

Fuel cells laptops/digital cameras

Gamma camera

Gamma camera imaging

Guinier camera

High Flux Camera

High molecular weight cameras

High-Speed Photographic Cameras

High-speed CCD camera

High-speed camera

High-speed camera device

High-speed streak camera

High-speed video camera

High-temperature cameras

IR camera

Image converter camera

Infrared Array Camera

Infrared Cameras—Qualitative and Quantitative

Infrared camera

Infrared cameras (thermal imagers)

Instant-image camera

Instrumentation streak cameras

Integrating camera

Intensified cameras

Jitter free streak camera

Jitter free streak camera signal averaging

Jong-Boumann and Precession Camera

Kiessig camera

Kodak camera

Kratky camera

Laser-streak camera system

Laue camera

Laue cameras, back-reflection transmission

Leica camera

Low-light camera

Low-temperature cameras

Making a Pinhole Camera

Microfocus Camera

Models camera calibration

Modern Cameras

Near Infrared Camera Multiobject Spectrometer on the Hubble Space Telescope

Neutron camera

Nitrogen camera

Nuclear medicine imaging scintillation camera

Olfactory camera

Optical fibres streak camera technique

Other Cameras

PET-camera

Performance comparisons of FPA measuring cameras

Performance parameters of quantitative cameras

Photochromic camera filters

Photographic documentation using single lens reflex cameras

Photography Using 35-mm Cameras

Photography polaroid camera

Photography, 73 without camera

Picosecond lasers streak camera detection

Pinhole camera

Pinhole method, cameras

Point collimation camera

Polaroid cameras

Powder samples, Debye-Scherrer camera

Precision camera

Precision cameras types

Reconnaissance camera

Retinal camera

Rigaku-Denki camera

Rotating drum camera

Safety cameras

Scintillation camera

Scintillation gamma camera

Security cameras

Security: camera technologies

Seemann-Bohlin camera

Simple Drum Camera

Single crystals camera

Single-lens reflex camera

Single-use cameras

Small Angle Resolution of a SAXS Camera

Small scattering camera

Spectral-based camera characterisation

Speed cameras

Statton camera

Step and repeat camera

Streak Camera Record from Wedge Shot

Streak camera

Streak camera applications

Streak camera detection

Streak camera detection system

Streak camera detection, picosecond systems

Streak camera system

Streak-camera techniques

Survey camera

The Franks Camera

The Guinier Camera

The Streak Camera

The electron diffraction camera

Thermal imaging cameras

Trail camera

Transmission Laue camera

Twin-channel camera

Types of Synchrotron Radiation Small-Angle Scattering Cameras

UV with camera holder

Used disposable Kodak cameras

Vacuum cameras

Video camera charge-coupled devices

Video cameras

Video cameras systems

Video cameras with charge-coupled device

Vidicon camera

Web camera

Weissenberg Camera and Moving Film Technique

Weissenberg camera

Wide-Field Planetary camera

X-ray camera

X-ray diffraction camera

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