Camera flat plate

The SAXS intensity distribution was measured with a rotating anode x-ray generator (Rigaku Denki, Rotaflex, RTP 300 RC) operated at 40 kV and 100 mA. The x-ray source was monochrolmatized to CuK (A = 0.154 nm) radiation. The SAXS patterns were taken with a fine-focused x-ray source using a flat plate camera (Rigaku Denki, RU-lOO). In the measurement of the solution sample, we used a glass capillary (< = 2.0 mm Mark-Rohrchen Ltd.) as a holder vessel. 

Figure 3. X-ray diffraction diagram of an oriented bundle of complex crystals in a fine glass capillary. Needle axis is vertical, and pattern was recorded with flat plate camera...

Film diffraction data can be obtained by several techniques flat plate camera, cylindrical camera or precession camera. We chose the latter, because it records a relatively undistorted "slice" of diffraction transform (reciprocal space) (19,20). We felt that this characteristic of the precession technique outweighed the disadvantages of longer exposure times (this was lessened by use of a Helium atmosphere in the camera enclosure). For potassium bromide amylose, the fiber studied, this required exposure of a 79y x 79y x 300y fiber specimen for 45 hours (35kv,... 

Selected stretched films were Investigated using wide angle X-ray diffraction (UAXD). Sandwiches from the SAXS experiments were also used for WAXD. Samples were Irradiated for 12 hours using a flat plate film camera. A Philips Cu Ra radiation source was used, with power settings of 20 kV and 30 mA. 

Staudenmann, J.-L., Horning, R. D., and Knox, R. D. Buerger precession camera and overall characterization of thin films and flat-plate crystals. J. Appl. Cryst. 20, 210-221 (1987). 

Basically, a diffractometer is designed somewhat like a Debye-Scherrer camera, except that a movable counter replaces the strip of film. In both instruments, essentially monochromatic radiation is used and the x-ray detector (film or counter) is placed on the circumference of a circle centered on the powder specimen. The essential features of a diffractometer are shown in Fig. 7-1. A powder specimen C, in the form of a flat plate, is supported on a table H, which can be rotated about an axis O perpendicular to the plane of the drawing. The x-ray source is S, the line focal spot on the target T of the x-ray tube S is also normal to the plane of the drawing and therefore parallel to the diffractometer axis O. X-rays diverge from this source and are diffracted by the specimen to form a convergent diffracted beam which comes to a focus at the slit F and then enters the counter G. A and... 

The magnetic field is maintained for 2 h, and the sample is cooled rapidly on a cold metal surface or with liquid nitrogen as soon as the power supply of the magnet is turned off. The film is then placed in the sample holder of a suitable X-ray diffractometer (with axis vertically aligned) and the diffraction pattern is recorded with a flat-plate camera. 

Flat plate cells are usually made with electrodes spread on screens or grids like lead-acid batteries or industrial Ni-Cd batteries. In these types of batteries the electrodes itself are good metallic conductors To build manganese dioxide batteries as plate cells good conductive screens would be needed. A well known example for a bipolar Mn02-Zn cell in commercial production is the 6 Volt Polaroid camera film battery, a primary battery with a weakly acidic electrolyte. 

Smith undertook an exhaustive study of the nature of these films. To do so, he had to build his own specialized vacuum system because he had to deposit his films on flat plates in order to examine them by electron diffraction. He also had to be able to transfer them into the electron diffraction camera without exposure to atmospheric contamination. For pressure measurements he, too, used a McLeod gauge because the ionization gauges one could build at that time were prone to outgassing, which would contaminate the films. He made films of a great many transition metals, in addition to nickel. 

Calculate the separation of the (221) spots along the layer line for / = 1 for a polymer that crystallises in an orthorhombic unit cell with a = 1.03, b = 0.54, c = 0.50 nm if the fibre pattern is obtained using X-rays of wavelength 0.154 nm in a flat-plate camera with separation 8.0 cm between fibre and film. (Approximate by assuming that the curvature of the layer line can be neglected.)... 

The degree of orientation in drawn samples was determined from Laue diffraction patterns obtained with a Phillips PW1030 flat plate camera using unfiltered Cu-Ka radiation in transmission. The azimuthal intensity profiles from the diffraction patterns were obtained by measuring light transmission through the developed flat... 

Wide-angle X-ray diffraction patterns were taken with a Phillips Universal Flat-Plate Camera type PW 1030. The X-ray facility consisted of a Phillips ultrastable generator model PW 1310/PW 1320. 

They are designated, alphabetically, PP-A to PP-F. The densities of these films, measured at 295.2 K using an ethyl alcohol/water density gradient column, are tabulated in Fig. 1, together with a summary of the results of a qualitative wide-angle x-ray diffraction study of the crystalline orientation(s) in the films using a flat plate camera. Three diffraction patterns were recorded for each film with the x-ray beam parallel to the film normal (N), to the machine direction (M), and to the transverse direction (T). 

C/min were used. IR spectra were recorded with a Bomem Michelson 110 FT-IR spectrophotometer at a resolution of 4 cm The sample was dispersed in a KBr pellet 50 scans were used for each spectrum. Flat plate X-ray patterns were recorded under vacuum on Kodak No-Screen film using Ni-filtered Cu Ka radiation (X - 1.5418 A) and a Searle toroidal focusing camera with pinhole collimation. WAXD spectra were also recorded as diffractometer scans, using a Phillips APD 3520 automated diffractometer using Ni-filtered Cu Ka radiation in the reflection mode. 

X-ray measurements were made on dried pellets of cellulose products. The X-ray diagrams were recorded on a Warhus vacuum flat plate X-Ray camera mounted on a Philips PW 1720 X-ray generator operated with Cu Ka radiation at 20 mA and 30 kV. Diffraction images were converted into 20-intensity profiles using specific software. 

Technique 2. All wedges analyzed using Technique 2 had a flat portion extending beyond the end of the normal wedge face. The shock position was determined from ratios of disturbed vs undisturbed positions measured on the film image and wedge face. Times were obtained from the known writing speed of the camera and from film meaurements. A film trace is obtained when the shock arrives at the free surface of.the attenuator plate. Another is obtained when the detonation arrives at the flee surface of the flat part of the sample. 

Texture studies on wires and plates are very important. Initial information can be acquired from transmission and reflection patterns recorded with a flat-film camera (see Fig. 1.5). The type and degree of texture can be determined more or less exactly, depending on the object of investigation and the type of instrument used. One of the best-developed instruments is the Liicke texture goniometer [125]. With this apparatus, the distribution of given net planes can be directly imaged in a pole figure. 

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