Kiessig camera

Kiessig camera and the X-ray radiation was nickel-filtered copper Ka. Due to the presence of barium in the samples the diffractograms were of poor quality but they could nevertheless confirm the phase assignations obtained by polarizing microscopy. 

Low-Angle X-Rav Diffraction Measurements. Low-angle X-ray diffraction measurements were obtained by a Kiessig low-angle camera from Richard Seifert, Germany. Ni filtered Cu radiation was used and the reflections determined by Tennelec Position Sensitive detector system (Model PSD-1100). 

W. H. Warhus Co., 406 Rowland Park Blvd, Barrcroft Wilmington, Delaware 19803. Kiessig, H. (1942). Kolloid-Z., 98, 213 (1957). Ibid., 152, 62 (Camera available from Richard Seifert Co., Hamberg 13, Germany). 

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