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Electrons Auger

Fig. VIII-10. (a) Intensity versus energy of scattered electron (inset shows LEED pattern) for a Rh(lll) surface covered with a monolayer of ethylidyne (CCH3), the structure of chemisorbed ethylene, (b) Auger electron spectrum, (c) High-resolution electron energy loss spectrum. [Reprinted with permission from G. A. Somoijai and B. E. Bent, Prog. Colloid Polym. ScL, 70, 38 (1985) (Ref. 6). Copyright 1985, Pergamon Press.]... Fig. VIII-10. (a) Intensity versus energy of scattered electron (inset shows LEED pattern) for a Rh(lll) surface covered with a monolayer of ethylidyne (CCH3), the structure of chemisorbed ethylene, (b) Auger electron spectrum, (c) High-resolution electron energy loss spectrum. [Reprinted with permission from G. A. Somoijai and B. E. Bent, Prog. Colloid Polym. ScL, 70, 38 (1985) (Ref. 6). Copyright 1985, Pergamon Press.]...
ADAM Angular-distribution Auger microscopy [85] Surface atoms silhouetted by Auger electrons from atoms in bulk Surface structure... [Pg.313]

AES ARABS Auger electron spectroscopy [77, 112-114, 117] Angle-resolved AES [85, 115] An incident high-energy electron ejects an inner electron from an atom an outer electron (e.g., L) falls into the vacancy and the released energy is given to an ejected Auger electron Surface composition... [Pg.314]

INS Ion neutralization An inert gas hitting surface is spectroscopy [147] neutralized with the ejection of an Auger electron from a surface atom Spectroscopy of Emitted Ions or Molecules Kinetics of surface reactions chemisorption... [Pg.315]

APS Appearance potential spectroscopy (see AES) Intensity of emitted x-ray or Auger electrons is measured as a function of incident electron energy Surface composition... [Pg.316]

AEAPS, SXAPS Auger electron APS, Soft x-ray APS Same as APS Same as APS... [Pg.316]

Electronic spectra of surfaces can give information about what species are present and their valence states. X-ray photoelectron spectroscopy (XPS) and its variant, ESC A, are commonly used. Figure VIII-11 shows the application to an A1 surface and Fig. XVIII-6, to the more complicated case of Mo supported on TiOi [37] Fig. XVIII-7 shows the detection of photochemically produced Br atoms on Pt(lll) [38]. Other spectroscopies that bear on the chemical state of adsorbed species include (see Table VIII-1) photoelectron spectroscopy (PES) [39-41], angle resolved PES or ARPES [42], and Auger electron spectroscopy (AES) [43-47]. Spectroscopic detection of adsorbed hydrogen is difficult, and... [Pg.690]

Figure Al.7.12. Secondary electron kinetic energy distribution, obtained by measuring the scadered electrons produced by bombardment of Al(lOO) with a 170 eV electron beam. The spectrum shows the elastic peak, loss features due to the excitation of plasmons, a signal due to the emission of Al LMM Auger electrons and the inelastic tail. The exact position of the cutoff at 0 eV depends on die surface work fimction. Figure Al.7.12. Secondary electron kinetic energy distribution, obtained by measuring the scadered electrons produced by bombardment of Al(lOO) with a 170 eV electron beam. The spectrum shows the elastic peak, loss features due to the excitation of plasmons, a signal due to the emission of Al LMM Auger electrons and the inelastic tail. The exact position of the cutoff at 0 eV depends on die surface work fimction.
A popular electron-based teclmique is Auger electron spectroscopy (AES), which is described in section Bl.25.2.2. In AES, a 3-5 keV electron beam is used to knock out iimer-shell, or core, electrons from atoms in the near-surface region of the material. Core holes are unstable, and are soon filled by either fluorescence or Auger decay. In the Auger... [Pg.307]

Powell C J, Jablonski A, Tilinin I S, Tanuma S and Penn D R 1999 Surface sensitivity of Auger-electron spectroscopy and x-ray photoelectron spectroscopy J. Eiectron Spec. Reiat. Phenom. 98-9 1... [Pg.318]

Powell C J 1994 Inelastic interactions of electrons with surfaces applications to Auger-electron spectroscopy and x-ray photoelectron spectroscopy Surf. Sc/. 299-300 34... [Pg.318]

Egelhoff W F Jr 1990 X-ray photoelectron and Auger electron forward scattering a new tool for surface crystallography CRC Crit. Rev. Soiid State Mater. Sc/. 16 213... [Pg.319]

Fadley C S 1993 Diffraction and holography with photoelectrons and Auger electrons some new directions Surf. Sc/. Rep. 19 231... [Pg.319]

As the table shows, a host of other teclmiques have contributed a dozen or fewer results each. It is seen that diffraction teclmiques have been very prominent in the field the major diffraction methods have been LEED, PD, SEXAFS, XSW, XRD, while others have contributed less, such as NEXAFS, RHEED, low-energy position diffraction (LEPD), high-resolution electron energy loss spectroscopy (HREELS), medium-energy electron diffraction (MEED), Auger electron diffraction (AED), SEELFS, TED and atom diffraction (AD). [Pg.1757]

Heiland W and Taglauer E 1975 Low energy ion scattering and Auger electron spectroscopy studies of clean nickel surfaces and adsorbed layers Surf. Sc/. 47 234-43... [Pg.1824]

AES Auger electron spectroscopy After the ejection of an electron by absorption of a photon, an atom stays behind as an unstable Ion, which relaxes by filling the hole with an electron from a higher shell. The energy released by this transition Is taken up by another electron, the Auger electron, which leaves the sample with an element-specific kinetic energy. Surface composition, depth profiles... [Pg.1852]

Figure Bl.25.6. Energy spectrum of electrons coming off a surface irradiated with a primary electron beam. Electrons have lost energy to vibrations and electronic transitions (loss electrons), to collective excitations of the electron sea (plasmons) and to all kinds of inelastic process (secondary electrons). The element-specific Auger electrons appear as small peaks on an intense background and are more visible in a derivative spectrum. Figure Bl.25.6. Energy spectrum of electrons coming off a surface irradiated with a primary electron beam. Electrons have lost energy to vibrations and electronic transitions (loss electrons), to collective excitations of the electron sea (plasmons) and to all kinds of inelastic process (secondary electrons). The element-specific Auger electrons appear as small peaks on an intense background and are more visible in a derivative spectrum.
The strong point of AES is that it provides a quick measurement of elements in the surface region of conducting samples. For elements having Auger electrons with energies hr the range of 100-300 eV where the mean free path of the electrons is close to its minimum, AES is considerably more surface sensitive than XPS. [Pg.1859]


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AEAPS (Auger electron appearance potential

AES—See Auger electron spectroscopy

ARAES (angle-resolved Auger electron

Alloy films Auger electron spectroscopy

Analytical techniques Auger electron spectroscopy

Analyzers Auger electron spectroscopy

Angle - Resolved Auger Electron

Angle-resolved Auger Electron Emission (ARAES)

Angle-resolved Auger electron spectroscopy, ARAES

Atomic structures Auger electron spectroscopy

Auger

Auger Electron Energy Spectrum

Auger Electron Radiotherapy Anti-tumor Effects at the Single Cell Level

Auger Electron Spectroscopy (AES depth profiling

Auger decay/electrons

Auger decay/electrons diagram lines

Auger decay/electrons energy

Auger decay/electrons intensity

Auger decay/electrons involved transitions

Auger decay/electrons operator

Auger decay/electrons satellites

Auger decay/electrons yield

Auger electron and X-ray fluorescence spectroscopy

Auger electron appearance potential

Auger electron appearance potential spectroscopy

Auger electron appearance potential spectroscopy, AEAPS

Auger electron charge transfer

Auger electron diffraction

Auger electron emission

Auger electron emission process

Auger electron energy

Auger electron escape depth

Auger electron kinetic energy

Auger electron microscopy

Auger electron nomenclature

Auger electron process

Auger electron spectrometer

Auger electron spectrometry

Auger electron spectrometry, described

Auger electron spectroscope surface sensitivities

Auger electron spectroscopy , helium

Auger electron spectroscopy analysis

Auger electron spectroscopy analysis technique

Auger electron spectroscopy applications

Auger electron spectroscopy basic process

Auger electron spectroscopy bonding

Auger electron spectroscopy characteristics

Auger electron spectroscopy chemical bonding studies

Auger electron spectroscopy chemical shift

Auger electron spectroscopy compounds

Auger electron spectroscopy contacts

Auger electron spectroscopy curve

Auger electron spectroscopy depth profile

Auger electron spectroscopy depth profiling

Auger electron spectroscopy depth-composition profile

Auger electron spectroscopy devices

Auger electron spectroscopy electronic devices

Auger electron spectroscopy electronic materials

Auger electron spectroscopy electronic transitions

Auger electron spectroscopy environment

Auger electron spectroscopy experiments

Auger electron spectroscopy failure analysis

Auger electron spectroscopy fine structures

Auger electron spectroscopy glass surfaces

Auger electron spectroscopy grain boundary composition

Auger electron spectroscopy inelastic scattering

Auger electron spectroscopy information obtained

Auger electron spectroscopy instrumentation

Auger electron spectroscopy limitations

Auger electron spectroscopy line

Auger electron spectroscopy materials

Auger electron spectroscopy minerals

Auger electron spectroscopy oxidized

Auger electron spectroscopy powder surfaces

Auger electron spectroscopy principles

Auger electron spectroscopy process development

Auger electron spectroscopy quantitative elemental surface

Auger electron spectroscopy silicon wafers

Auger electron spectroscopy spectrum

Auger electron spectroscopy stainless steel

Auger electron spectroscopy stoichiometry, electronic

Auger electron spectroscopy surface characterization

Auger electron spectroscopy theory

Auger electron spectroscopy, AES

Auger electron spectroscopy, ethylene

Auger electron spectroscopy-SIMS

Auger electron spectroscopy-SIMS surface analysis

Auger electron spectrum

Auger electron transition

Auger electron yield

Auger electron yield mode

Auger electron, wavefunction

Auger electron-emission yields from

Auger electronic spectroscopy

Auger electronic transitions

Auger electrons measured in coincidence with the photoelectron

Auger electrons, definition

Auger measurements electron-stimulated

Basic Auger electron spectroscopy

Chemical shifts Auger electrons

Coincidence experiments Auger electron

Coincident observation of the photoelectron and its subsequent Auger electron

Conventional Auger electron spectroscopy

Depth Auger electron spectroscopy

Electron excited Auger spectra

Electron microscopy auger electrons

Fluorescence Auger electron spectroscopy

Gold, Auger electron maps

Instruments Auger electron spectroscopy

Interfaces Auger electron spectroscopy

Low-energy electron diffraction-Auger

Metallic contacts, Auger electron spectroscopy

PAES (positron annihilation auger electron

Phosphorus photoelectron and auger electron

Photoelectron Auger electron spectroscopy

Positron Annihilation Auger Electron Spectroscopy

Quantitative Auger electron spectroscopy

Radioactive decay Auger electron

Scanning Auger electron microscopy

Scanning Auger electron spectroscopy

Scanning electron microscope auger electrons

Schematic diagram Auger electron spectrometer

Segregation. Auger electron spectroscopy

Semiconductors Auger electron spectroscopy

Sources Auger electron spectroscopy

Spectral Auger electron spectroscopy

Spectroscopic methods Auger-electron-spectroscopy

Spectroscopy Auger electron

Spectroscopy Auger electron emission

Spectroscopy angle-resolved Auger electron

Substrate/surface characterization Auger Electron

Surface analysis Auger electron spectroscopy

Surface analytical techniques Auger electron spectroscopy

Surface compositional analysis. Auger electron spectroscopy (AES)

The Emission of Auger Electrons from Ionized Atoms

Thin films. Auger electron spectroscopy

Titanium oxidized, Auger electron

X-Ray Fluorescence and Auger-Electron Emission

X-ray excited auger electron

X-ray excited auger electron spectroscopy

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