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Appearance potential spectroscopy, APS

There are three main detection modes for EAPFS within the appearance potential spectroscopy (APS) technique./31/ First, one may monitor soft-x-ray emission due to the decay of the core hole left by the primary process. This is called SXAPS-EAPFS (Figure le). Second, it is also possible to monitor Auger electrons due to the same core-hole decay, as in AEAPS-EAPFS and AMEFS-EAPFS, cf. Figure If. Third, one may measure the remaining total intensity of... [Pg.52]

Energy spectrum of secondary electrons Appearance potential spectroscopy APS... [Pg.178]

Appearance potential spectroscopy APS Monoenergetic 14 and 15 Derivative X-ray yield... [Pg.306]

Appearance potential spectroscopy (APS) - See Techniques for Materials Characterization, page 12-1. [Pg.97]

The last chapter (chapter 109) is by D.R. Chopra on appearance potential spectroscopy (APS), which measures the probability for electronic excitation of a core level as a function of the incident electron energy. APS is based on a two-electron excita-tion/relaxation process and gives information on the density of unoccupied states. APS is a complementary technique to the more common Auger electron spectroscopy and X-ray photoelectron spectroscopy, and it also yields information on chemical bonding, near-neighbor configuration in the surface layer, and the chemical constituents. The author believes that when the different aspects of APS are fully exploited this technique will be accepted as a popular analytical tool for the material characterization of surfaces. [Pg.594]

APS Appearance potential spectroscopy (see AES) Intensity of emitted x-ray or Auger electrons is measured as a function of incident electron energy Surface composition... [Pg.316]

AES = auger electron spectroscopy APS = appearance potential spectroscopy CEELS = characteristic electron energy-loss spectroscopy ... [Pg.398]

APS Appearance Potential Spectroscopy Surface (-20 atomic layers) Electrons (energy scan) 60-2000 eV X-rays to pinpoint electron energy threshold Idenlilicalion ol surlace species 21, see also C... [Pg.1968]

Smith et al. (1975) attempted to observe transitions involving the empty 4f level in La by the appearance potential spectroscopy method (APS). The theory... [Pg.307]

SXAPS Soft X-ray appearance potential spectroscopy (or APS appearance potential spectroscopy)... [Pg.854]

APS appearance potential spectroscopy c amount concentration, specific heat, velocity... [Pg.68]

See other pages where Appearance potential spectroscopy, APS is mentioned: [Pg.194]    [Pg.383]    [Pg.4625]    [Pg.4626]    [Pg.408]    [Pg.194]    [Pg.383]    [Pg.4625]    [Pg.4626]    [Pg.408]    [Pg.269]    [Pg.4]    [Pg.127]    [Pg.269]    [Pg.59]    [Pg.486]    [Pg.77]    [Pg.312]    [Pg.508]    [Pg.594]    [Pg.195]    [Pg.225]    [Pg.88]    [Pg.1087]    [Pg.519]    [Pg.521]    [Pg.1026]    [Pg.1140]   
See also in sourсe #XX -- [ Pg.316 ]



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