Auger electron yield mode

N K-edge X-ray absorption near edge stracture (XANES) spectra of the samples were measured at the BL-8B1 station of UVSOR-n at the Institute for Molecular Science, Okazaki, Japan. Data were recorded at room temperature in total electron yield mode, and the X-ray energy dependence of the N Auger election yield was monitored. Considering the escape depth of the Auger electrons, the spectra probe the sample fiom the surface up to a few nanometers in depth. 

Surface characterization by spectroscopic techniques yields information on the functional groups and elemental composition on the surface of polymeric biomaterials. The most common spectroscopic tools used for biomedical polymers are X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), and Fourier transform infrared spectroscopy (FTIR) (diffuse reflectance and attenuated total internal reflectance modes). Each of these techniques is discussed in the succeeding text. 

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