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Surface analysis Auger electron spectroscopy

Figorc 7.22a Electron spectroscopies for surface analysis. Auger electron spectroscopy. X-ray photon spectroscopy, and ultraviolet photon spectroscopy. [Pg.162]

Spectrometry Overview. Mercury. Microscopy Techniques Scanning Electron Microscopy X-Ray Microscopy. Particle Size Analysis. Polychlorinated Biphenyls. Polycyclic Aromatic Hydrocarbons Environmental Aj li-cations. Radiochemical Methods Overview. Sample Handling Sample Preservation. Sampling Theory. Surface Analysis Auger Electron Spectroscopy. Tin. X-Ray Absorption and Diffraction Overview. X-Ray Fluorescence and Emission Energy Dispersive X-Ray Ruores-cence Particle-Induced X-Ray Emission. [Pg.1999]

See also Surface Analysis Auger Electron Spectroscopy Ion Scattering Overview X-Ray Photoelectron Spectroscopy. [Pg.4633]

Figure 7.3 AES spectra of an oxidized aluminum surface (a) direct spectrum of intensity versus kinetic energy of Auger electrons and (b) differential spectrum of intensity versus kinetic energy of Auger electrons. (Reproduced with permission from J.F. Watts, An Introduction to Surface Analysis by Electron Spectroscopy, Oxford University Press, Oxford. 1990 Royal Microscopy Society.)... Figure 7.3 AES spectra of an oxidized aluminum surface (a) direct spectrum of intensity versus kinetic energy of Auger electrons and (b) differential spectrum of intensity versus kinetic energy of Auger electrons. (Reproduced with permission from J.F. Watts, An Introduction to Surface Analysis by Electron Spectroscopy, Oxford University Press, Oxford. 1990 Royal Microscopy Society.)...
SURFACE COMPOSITIONAL ANALYSIS. AUGER ELECTRON SPECTROSCOPY (AES)... [Pg.189]

One type of method is an energy analysis of electrons emitted from the surface with Auger-electron-spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and ultraviolet photoelectron spectroscopy (UPS). A second way is to sputter the surface and analyze the emitted particles by mass spectroscopy. This method is called secondary ion mass spectroscopy (SIMS). A third method is based on the scattering of He ions from the surface and the analysis of the scattering parameters (Rutherford backscattering). [Pg.280]

By suitable analysis of the experimental data, as well as by the use of suitable reference surfaces, the Auger electron spectroscopy study can provide quantitative chemi-... [Pg.338]

ISO 15471 2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instmmental performance parameters... [Pg.245]

See other pages where Surface analysis Auger electron spectroscopy is mentioned: [Pg.268]    [Pg.4616]    [Pg.4617]    [Pg.4618]    [Pg.4619]    [Pg.4620]    [Pg.4621]    [Pg.4622]    [Pg.4623]    [Pg.4624]    [Pg.145]    [Pg.35]    [Pg.195]    [Pg.268]    [Pg.4616]    [Pg.4617]    [Pg.4618]    [Pg.4619]    [Pg.4620]    [Pg.4621]    [Pg.4622]    [Pg.4623]    [Pg.4624]    [Pg.145]    [Pg.35]    [Pg.195]    [Pg.10]    [Pg.426]    [Pg.502]    [Pg.180]    [Pg.1807]    [Pg.1828]    [Pg.2725]    [Pg.2938]    [Pg.277]    [Pg.50]    [Pg.86]   
See also in sourсe #XX -- [ Pg.880 , Pg.897 , Pg.898 , Pg.899 , Pg.900 , Pg.901 , Pg.902 , Pg.903 , Pg.904 , Pg.905 ]

See also in sourсe #XX -- [ Pg.77 , Pg.78 ]



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Analysis spectroscopy

Auger

Auger analysis

Auger electron

Auger electron spectroscopy-SIMS surface analysis

Electron analysis

Electron surface analysis

Electronic spectroscopy, surface

Electronic spectroscopy, surface analysis

Spectroscopy Auger

Spectroscopy Auger electron

Surface analysis

Surface analysis electron spectroscopy

Surface analysis spectroscopy

Surface compositional analysis. Auger electron spectroscopy (AES)

Surface electronic

Surface electrons

Surface spectroscopy

Surfaces Auger analysis

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