Auger electron spectroscopy analysis

The steel surface of the flat was immersed in the solution of oxymolybdyl dithiophosphate (DDP)2Mo02 at a concentration of 2 wt% in a PAO synthetic lubricant base. The immersion time was 5 hr and the temperature was 100°C (Martin et al., 1996). The X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy analysis of the reaction film indicates that before friction, a relatively thick chemisorbed film composed of phosphorus (P) and sulfur (S) is present on the steel surface. The friction test was carried out in ultra high (UHV) analytical tribometer just after the analysis and in the same conditions as the untreated surface. 

Q.J. Peng, H. Yamauchi, T. Shoji, Investigation of dendrite-boundary microchemistry in AUoy 182 using auger electron spectroscopy analysis, Metall. Mater. Trans. A 34A (2003) 1891—1899. 

Ast] Auger electron spectroscopy Analysis of a (Fe,Cr)203 oxide scale on an oxidized stainless steel... 

The incoming electron beam interacts with the sample to produce a number of signals that are subsequently detectable and useful for analysis. They are X-ray emission, which can be detected either by Energy Dispersive Spectroscopy, EDS, or by Wavelength Dispersive Spectroscopy, WDS visible or UV emission, which is known as Cathodoluminescence, CL and Auger Electron Emission, which is the basis of Auger Electron Spectroscopy discussed in Chapter 5. Finally, the incoming... 

Auger electron spectroscopy (AES) is a technique used to identify the elemental composition, and in many cases, the chemical bonding of the atoms in the surface region of solid samples. It can be combined with ion-beam sputtering to remove material from the surface and to continue to monitor the composition and chemistry of the remaining surface as this surface moves into the sample. It uses an electron beam as a probe of the sample surface and its output is the energy distribution of the secondary electrons released by the probe beam from the sample, although only the Ai er electron component of the secondaries is used in the analysis. 

Auger electron spectroscopy is the most frequently used surface, thin-film, or interface compositional analysis technique. This is because of its very versatile combination of attributes. It has surface specificity—a sampling depth that varies... 

PIXE detection limits for surface layers on bulk specimens are sufficiendy low to permit calibradon of true surfe.ce analysis techniques (e.g., Auger electron spectroscopy). 

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. 

Laser ionization mass spectrometry or laser microprobing (LIMS) is a microanalyt-ical technique used to rapidly characterize the elemental and, sometimes, molecular composition of materials. It is based on the ability of short high-power laser pulses (-10 ns) to produce ions from solids. The ions formed in these brief pulses are analyzed using a time-of-flight mass spectrometer. The quasi-simultaneous collection of all ion masses allows the survey analysis of unknown materials. The main applications of LIMS are in failure analysis, where chemical differences between a contaminated sample and a control need to be rapidly assessed. The ability to focus the laser beam to a diameter of approximately 1 mm permits the application of this technique to the characterization of small features, for example, in integrated circuits. The LIMS detection limits for many elements are close to 10 at/cm, which makes this technique considerably more sensitive than other survey microan-alytical techniques, such as Auger Electron Spectroscopy (AES) or Electron Probe Microanalysis (EPMA). Additionally, LIMS can be used to analyze insulating sam-... 

Elastic Recoil Detection Analysis Glow discharge mass spectrometry Glow discharge optical emission spectroscopy Ion (excited) Auger electron spectroscopy Ion beam spectrochemical analysis... 

This kind of estimation of the relative concentration is the most widely used method for quantitative EELS analysis. It is advantageous because the dependence on the primary electron current, Iq, is cancelled out this is not easily determined in a transmission electron microscope under suitable analytical conditions. Eurthermore, in comparison with other methods, e. g. Auger electron spectroscopy and energy-disper-... 

Surface analysis has made enormous contributions to the field of adhesion science. It enabled investigators to probe fundamental aspects of adhesion such as the composition of anodic oxides on metals, the surface composition of polymers that have been pretreated by etching, the nature of reactions occurring at the interface between a primer and a substrate or between a primer and an adhesive, and the orientation of molecules adsorbed onto substrates. Surface analysis has also enabled adhesion scientists to determine the mechanisms responsible for failure of adhesive bonds, especially after exposure to aggressive environments. The objective of this chapter is to review the principals of surface analysis techniques including attenuated total reflection (ATR) and reflection-absorption (RAIR) infrared spectroscopy. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) and to present examples of the application of each technique to important problems in adhesion science. 

ASTM El078, Standard guide for procedures for specimen preparation, mounting, and analysis in auger electron spectroscopy. X-ray photoelectron spectroscopy, and secondary ion mass spectrometry. ASTM, West Conshohocken, PA. 

The most widely used techniques for surface analysis are Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS), Raman and infrared spectroscopy, and contact angle measurement. Some of these techniques have the ability to determine the composition of the outermost atomic layers, although each technique possesses its own special advantages and disadvantages. 

Further structural information is available from physical methods of surface analysis such as scanning electron microscopy (SEM), X-ray photoelectron or Auger electron spectroscopy (XPS), or secondary-ion mass spectrometry (SIMS), and transmission or reflectance IR and UV/VIS spectroscopy. The application of both electroanalytical and surface spectroscopic methods has been thoroughly reviewed and appropriate methods are given in most of the references of this chapter. 

The apparatuses used for the studies of both ammonia synthesis emd hydrodesulfurization were almost identical, consisting of a UHV chamber pumped by both ion and oil diffusion pumps to base pressures of 1 x10 " Torr. Each chamber was equipped with Low Energy Electron Diffraction optics used to determine the orientation of the surfaces and to ascertain that the surfaces were indeed well-ordered. The LEED optics doubled as retarding field analyzers used for Auger Electron Spectroscopy. In addition, each chamber was equipped with a UTI 100C quadrupole mass spectrometer used for analysis of background gases and for Thermal Desorption Spectroscopy studies. 

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