Auger electron spectroscopy electronic transitions

AES Auger electron spectroscopy After the ejection of an electron by absorption of a photon, an atom stays behind as an unstable Ion, which relaxes by filling the hole with an electron from a higher shell. The energy released by this transition Is taken up by another electron, the Auger electron, which leaves the sample with an element-specific kinetic energy. Surface composition, depth profiles... 

We have undertaken a series of experiments Involving thin film models of such powdered transition metal catalysts (13,14). In this paper we present a brief review of the results we have obtained to date Involving platinum and rhodium deposited on thin films of tltanla, the latter prepared by oxidation of a tltanliua single crystal. These systems are prepared and characterized under well-controlled conditions. We have used thermal desorption spectroscopy (TDS), Auger electron spectroscopy (AES) and static secondary Ion mass spectrometry (SSIMS). Our results Illustrate the power of SSIMS In understanding the processes that take place during thermal treatment of these thin films. Thermal desorption spectroscopy Is used to characterize the adsorption and desorption of small molecules, In particular, carbon monoxide. AES confirms the SSIMS results and was used to verify the surface cleanliness of the films as they were prepared. 

Hooker, M. P., and Grant, J. T. 1977. The use of Auger electron spectroscopy to characterize the adsorption of carbon monoxide transition metals. Surf. Sci. 62 21-30. 

Auger electron spectroscopy (AES), 76 495 24 84-87, 94-97. See also AES instrumentation archaeological materials, 5 744 quantitative, 24 98 Auger sensitivity factors, 24 96 Auger spectra, 24 95-97, 98 Auger transitions, 24 95 Augite, in coal, 6 718 Au(III) halides, 72 706. See also Gold(III) entries... 

Auger electron spectroscopy (29) is a type of electron spectroscopy that is used for determining solid surface elemental and electronic composition. An experiment is conducted by bombarding a solid surface with an electron beam of energy ranging from 1 keV to 10 keV. Alternatively, an x-ray source can be used. The Auger electrons, emitted from an atom by means of a radiationless transition, are... 

Spectroscopy produces spectra which arise as a result of interaction of electromagnetic radiation with matter. The type of interaction (electronic or nuclear transition, molecular vibration or electron loss) depends upon the wavelength of the radiation (Tab. 7.1). The most widely applied techniques are infrared (IR), Mossbauer, ultraviolet-visible (UV-Vis), and in recent years, various forms ofX-ray absorption fine structure (XAFS) spectroscopy which probe the local structure of the elements. Less widely used techniques are Raman spectroscopy. X-ray photoelectron spectroscopy (XPS), secondary ion imaging mass spectroscopy (SIMS), Auger electron spectroscopy (AES), electron spin resonance (ESR) and nuclear magnetic resonance (NMR) spectroscopy. 

A new method of interpreting Auger electron spectroscopy (AES) sputter profiles of transition metal carbides and nitrides is proposed. It is shown that the chemical information hidden in the shape of the peaks, and usually neglected in depth profiles, can be successfully extracted by factor analysis (FA). The various carbide and nitride phases of model samples were separated by application of FA to the spectra recorded during AES depth profiles. The different chemical states of carbon, nitrogen and metal were clearly identified. 

Appearance potential spectroscopy involves detection of electronic transitions not of the backscattered electrons as in ELS, but of secondary processes. The latter include increase in soft X-ray (SXAPS) or Auger electron (AEAPS) emission or decrease in elastically scattered primary electrons (DAPS) (382). SXAPS is not as sensitive as AES for surface chemical analysis. However, SXAPS and IS spectra are easier to analyze than AES, since only one core transition is involved. This makes SXAPS and IS quite convenient for detecting heavy elements on catalyst surfaces. 

The studies of Ertl and associates employed a surface consisting of the (0001) face of a ruthenium single crystal. Copper was deposited on the ruthenium surface by exposing the surface to a flux of copper atoms obtained by evaporation of a copper source. From low energy electron diffraction, Auger electron spectroscopy, thermal desorption, and work function measurements (18) Ertl and associates concluded that copper deposits on the ruthenium surface at 540 K in the form of a two-dimensional overlayer to coverages of 50 to 60%, beyond which there is a transition to a three-dimensional growth phase. 

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