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Electrons Auger spectroscopy

C. L. Wilson, Comprehensive Analytical Chemisty Ultraviolet Photoelectron and Photoion Spectroscopy Auger Electron Spectroscopy Plasma Excitation in SpectrochemicalAnalysis, Vol. 9, Elsevier Science, Inc., New York, 1979. [Pg.119]

Recent developments in the mechanisms of corrosion inhibition have been discussed in reviews dealing with acid solutions " and neutral solu-tions - . Novel and improved experimental techniques, e.g. surface enhanced Raman spectroscopy , infrared spectroscopy. Auger electron spectroscopyX-ray photoelectron spectroscopyand a.c. impedance analysis have been used to study the adsorption, interaction and reaction of inhibitors at metal surfaces. [Pg.824]

All analytical methods that use some part of the electromagnetic spectrum have evolved into many highly specialized ways of extracting information. The interaction of X-rays with matter represents an excellent example of this diversity. In addition to straightforward X-ray absorption, diffraction, and fluorescence, there is a whole host of other techniques that are either directly X-ray-related or come about as a secondary result of X-ray interaction with matter, such as X-ray photoemission spectroscopy (XPS), surface-extended X-ray absorption fine structure (SEXAFS) spectroscopy, Auger electron spectroscopy (AES), and time-resolved X-ray diffraction techniques, to name only a few [1,2]. [Pg.292]

Surface wave spectroscopy is still in its infancy, and most of the examples we have mentioned have been demonstrations of what can be done. It has clearly been demonstrated that vibrational and electronic spectroscopy can be done on molecules sorbed on metal substrates at less than monolayer coverages. In contrast to many techniques for surface spectroscopy (e.g. ultraviolet photoelectron spectroscopy, Auger electron spectroscopy), SEW spectroscopy does not require ultrahigh vacuum and can be done in the presence of reactant gases. This should make it a valuable tool for the study of catalytic reactions. Certainly... [Pg.114]

The analysis of corrosion scale or product may be done by wet chemical methods such as spectrophotometry or atomic absorption spectrophotometry in cases where the removal of corrosion scale is permitted, or by surface analytical techniques such as X-ray photoelectron spectroscopy, Auger electron spectroscopy, electron microprobe analysis, by energy dispersive X-ray analysis in the case of samples which need to be preserved. [Pg.164]

X-ray diffraction analysis Scanning electron microscopy Transmission electron microscopy X-ray photoelectron spectroscopy Auger electron spectroscopy... [Pg.171]

AES atomic emission spectroscopy Auger electron spectroscopy-... [Pg.59]

Auger spectroscopy Auger electron spectroscopy is a powerful surface analysis technique, as the analytical signals come from the top few monolayer of the specimen. In this technique, a primary beam of electrons is used to produce inner shell vacancies in atoms of the specimen. This method has been used for the determination of sulfur, e.g., on GaAs surfaces and to study sulfur surface segregation in Ni-Al solid solutions and the adsorption on a GaAs (001) surface by hydrogen sulfide exposure and heat treatment. [Pg.4564]

See also Surface Analysis Overview X-Ray Photoelectron Spectroscopy Auger Electron Spectroscopy Desorption Techniques Ion Scattering Secondary Ion Mass Spectrometry of Polymers Laser Ionization. [Pg.4681]

ABSTRACT. The paper details the use of scanning electron microscopy, surface reflectance infrared spectroscopy, Auger electron spectroscopy, ion scattering spectroscopy, secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy in the analysis of polymeric adhesives and composites. A brief review of the principle of each surface analytical technique will be followed by application of the technique to interfacial adhesion with an emphasis on polymer/metal, fiber/matrix, and composite/composite adhesion. [Pg.125]

Auger electron appearance potential spectroscopy Auger electron spectroscopy Atomic force microscopy Azimuthal photoelectron diffraction Appearance potential spectroscopy Angle-resolved Auger electron spectroscopy Angle-resolved photoemission extended fine structure... [Pg.284]

Electrode kinetics, electrode and catalysts surface area -Microstructure Spectroscopy-Auger Electron (AES), x-ray photoelectron (XPS), secondary ion mass spectroscopy (SIMS) -Chemical identification ... [Pg.316]

Spectroscopic Techniques X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and Ion Scattering Spectroscopy... [Pg.997]

Essentially all metals and alloys which form metallic hydrides require an activation process before the metal wiU readily cycle between the hydride and metal phase. All the ABs and AB2 alloys are quite brittle and during the activation procedure are pulverized to fine particles. This greatly enhances subsequent reaction rates. The activation process is considered to take place in two stages the formation of a reactive surface and pulverization of the bulk solid to form fine particles. The surface composition of LaNis after activation has been defined by X-ray photoemission spectroscopy. Auger electron spectroscopy, and magnetic susceptibility studies [19]. There is a surface enrichment of La to give a ratio of La/Ni 1 the La is associated... [Pg.245]


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AES—See Auger electron spectroscopy

Alloy films Auger electron spectroscopy

Analytical techniques Auger electron spectroscopy

Analyzers Auger electron spectroscopy

Angle-resolved Auger electron spectroscopy, ARAES

Atomic structures Auger electron spectroscopy

Auger

Auger Electron Spectroscopy (AES depth profiling

Auger electron

Auger electron and X-ray fluorescence spectroscopy

Auger electron appearance potential spectroscopy

Auger electron appearance potential spectroscopy, AEAPS

Auger electron spectroscopy , helium

Auger electron spectroscopy analysis

Auger electron spectroscopy analysis technique

Auger electron spectroscopy applications

Auger electron spectroscopy basic process

Auger electron spectroscopy bonding

Auger electron spectroscopy characteristics

Auger electron spectroscopy chemical bonding studies

Auger electron spectroscopy chemical shift

Auger electron spectroscopy compounds

Auger electron spectroscopy contacts

Auger electron spectroscopy curve

Auger electron spectroscopy depth profile

Auger electron spectroscopy depth profiling

Auger electron spectroscopy depth-composition profile

Auger electron spectroscopy devices

Auger electron spectroscopy electronic devices

Auger electron spectroscopy electronic materials

Auger electron spectroscopy electronic transitions

Auger electron spectroscopy environment

Auger electron spectroscopy experiments

Auger electron spectroscopy failure analysis

Auger electron spectroscopy fine structures

Auger electron spectroscopy glass surfaces

Auger electron spectroscopy grain boundary composition

Auger electron spectroscopy inelastic scattering

Auger electron spectroscopy information obtained

Auger electron spectroscopy instrumentation

Auger electron spectroscopy limitations

Auger electron spectroscopy line

Auger electron spectroscopy materials

Auger electron spectroscopy minerals

Auger electron spectroscopy oxidized

Auger electron spectroscopy powder surfaces

Auger electron spectroscopy principles

Auger electron spectroscopy process development

Auger electron spectroscopy quantitative elemental surface

Auger electron spectroscopy silicon wafers

Auger electron spectroscopy spectrum

Auger electron spectroscopy stainless steel

Auger electron spectroscopy stoichiometry, electronic

Auger electron spectroscopy surface characterization

Auger electron spectroscopy theory

Auger electron spectroscopy, AES

Auger electron spectroscopy, ethylene

Auger electron spectroscopy-SIMS

Auger electron spectroscopy-SIMS surface analysis

Auger electronic spectroscopy

Basic Auger electron spectroscopy

Conventional Auger electron spectroscopy

Depth Auger electron spectroscopy

Fluorescence Auger electron spectroscopy

Instruments Auger electron spectroscopy

Interfaces Auger electron spectroscopy

Metallic contacts, Auger electron spectroscopy

Photoelectron Auger electron spectroscopy

Positron Annihilation Auger Electron Spectroscopy

Quantitative Auger electron spectroscopy

Scanning Auger electron spectroscopy

Segregation. Auger electron spectroscopy

Semiconductors Auger electron spectroscopy

Sources Auger electron spectroscopy

Spectral Auger electron spectroscopy

Spectroscopic methods Auger-electron-spectroscopy

Spectroscopy Auger

Spectroscopy Auger electron emission

Spectroscopy angle-resolved Auger electron

Surface analysis Auger electron spectroscopy

Surface analytical techniques Auger electron spectroscopy

Surface compositional analysis. Auger electron spectroscopy (AES)

Thin films. Auger electron spectroscopy

X-ray excited auger electron spectroscopy

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