Auger electron spectroscopy surface characterization

Auger electron spectroscopy (AES) (characterization) A surface analytical spectroscopy technique that uses energetic electrons as the probing species and Auger electrons as the detected species. 

We have undertaken a series of experiments Involving thin film models of such powdered transition metal catalysts (13,14). In this paper we present a brief review of the results we have obtained to date Involving platinum and rhodium deposited on thin films of tltanla, the latter prepared by oxidation of a tltanliua single crystal. These systems are prepared and characterized under well-controlled conditions. We have used thermal desorption spectroscopy (TDS), Auger electron spectroscopy (AES) and static secondary Ion mass spectrometry (SSIMS). Our results Illustrate the power of SSIMS In understanding the processes that take place during thermal treatment of these thin films. Thermal desorption spectroscopy Is used to characterize the adsorption and desorption of small molecules, In particular, carbon monoxide. AES confirms the SSIMS results and was used to verify the surface cleanliness of the films as they were prepared. 

The characterization of evaporated alloy films can be carried out at widely different levels of sophistication. At the very least, it is necessary to determine the bulk composition, probably after the film has been used for an adsorption or catalytic experiment. Then various techniques can be applied, e.g., X-ray diffraction, electron diffraction, and electron microscopy, to investigate the homogeneity or morphology of the film. The measurement of surface area by chemisorption presents special problems compared with the pure metals. Finally, there is the question of the surface composition (as distinct from the bulk or overall composition), and a brief account is given of techniques such as Auger electron spectroscopy which might be applied to alloy films. 

There is now available a substantial amount of information on the principles and techniques involved in preparing evaporated alloy films suitable for adsorption or catalytic work, although some preparative methods, e.g., vapor quenching, used in other research fields have not yet been adopted. Alloy films have been characterized with respect to bulk properties, e.g., uniformity of composition, phase separation, crystallite orientation, and surface areas have been measured. Direct quantitative measurements of surface composition have not been made on alloy films prepared for catalytic studies, but techniques, e.g., Auger electron spectroscopy, are available. 

Polymer films were produced by surface catalysis on clean Ni(100) and Ni(lll) single crystals in a standard UHV vacuum system H2.131. The surfaces were atomically clean as determined from low energy electron diffraction (LEED) and Auger electron spectroscopy (AES). Monomer was adsorbed on the nickel surfaces circa 150 K and reaction was induced by raising the temperature. Surface species were characterized by temperature programmed reaction (TPR), reflection infrared spectroscopy, and AES. Molecular orientations were inferred from the surface dipole selection rule of reflection infrared spectroscopy. The selection rule indicates that only molecular vibrations with a dynamic dipole normal to the surface will be infrared active [14.], thus for aromatic molecules the absence of a C=C stretch or a ring vibration mode indicates the ring must be parallel the surface. 

The elemental composition, oxidation state, and coordination environment of species on surfaces can be determined by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) techniques. Both techniques have a penetration depth of 5-20 atomic layers. Especially XPS is commonly used in characterization of electrocatalysts. One common example is the identification and quantification of surface functional groups such as nitrogen species found on carbon-based catalysts.26-29 Secondary Ion Mass spectrometry (SIMS) and Ion Scattering Spectroscopy are alternatives which are more surface sensitive. They can provide information about the surface composition as well as the chemical bonding information from molecular clusters and have been used in characterization of cathode electrodes.30,31 They can also be used for depth profiling purposes. The quantification of the information, however, is rather difficult.32... 

For a better characterization of the catalytic surface, the sample has been transferred through a glove box into an ultra high vacuum device and Auger electron spectroscopy was carried out. 

Over the past 10 years a multitude of new techniques has been developed to permit characterization of catalyst surfaces on the atomic scale. Low-energy electron diffraction (LEED) can determine the atomic surface structure of the topmost layer of the clean catalyst or of the adsorbed intermediate (7). Auger electron spectroscopy (2) (AES) and other electron spectroscopy techniques (X-ray photoelectron, ultraviolet photoelectron, electron loss spectroscopies, etc.) can be used to determine the chemical composition of the surface with the sensitivity of 1% of a monolayer (approximately 1013 atoms/cm2). In addition to qualitative and quantitative chemical analysis of the surface layer, electron spectroscopy can also be utilized to determine the valency of surface atoms and the nature of the surface chemical bond. These are static techniques, but by using a suitable apparatus, which will be described later, one can monitor the atomic structure and composition during catalytic reactions at low pressures (< 10-4 Torr). As a result, we can determine reaction rates and product distributions in catalytic surface reactions as a function of surface structure and surface chemical composition. These relations permit the exploration of the mechanistic details of catalysis on the molecular level to optimize catalyst preparation and to build new catalyst systems by employing the knowledge gained. 

Some of the techniques described in this chapter used most widely today are Auger electron spectroscopy, X-ray photoelectron spectroscopy, electron-probe micro-analysis, low energy electron diffraction, scanning electron microscope, ion scattering spectroscopy, and secondary ion mass spectroscopy. The solid surface, after liberation of electrons, can be analyzed directly by AES, XPS, ISS, and EPMA (nondestructive techniques), or by liberation of ions from surfaces using SIMS (involving the destruction of the surface). Apart from the surface techniques, reflectance-absorbance infrared (RAIR) spectroscopy has also been employed for film characterization (Lindsay et al., 1993 Yin et al., 1993). Some... 

Microanalytical methods are used to move further down in the characterization scale. X-ray photoelectron spectroscopy (XPS or ESCA), (see Barr) Auger electron spectroscopy (AES), and secondary ion mass spectroscopy (SIMS) as presented by Leta for imaging FCC catalysts, are surface analysis techniques providing chemical analy-... 

The empirical approach adopted here integrates classical electrochemical methods with modem surface preparation and characterization techniques. As described in detail elsewhere, the actual experimental procedure involves surface analysis before and after a particular electrochemical process the latter may vary from simple inunersion of the electrode at a fixed potential to timed excursions between extreme oxidative and reductive potentials. Meticulous emphasis is placed on the synthesis of pre-selected surface alloys and the interrogation of such surfaces to monitor any electrochemistry-induced changes. The advantages in the use of electrons as surface probes such as in X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), high-resolution... 

Fig. 3.2 Characterization of Ptj Ni(hkr) surfaces with (a) Auger Electron Spectroscopy (AES) (b) LEIS (revealed complete segregation of Pt for aU three orientations and the formation of the Pt-skin structure (c) UPS (confirmed that the position of d-band center is structure sensitive (d-f) LEED the Pt3Ni(l 11) surface exhibits a (1 X 1) pattern, Pt3Ni(100) has a (1 x 5) reconstruct pattern, and Pt3Ni(110) exhibits (1 x 2) periodicity. Reprinted with permission from [23], copyright 2007 by American Association for the Advancement of Science...

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