Secondary ions, mass spectrometry

Hi) Methods based on mass spectrometry Spark-source mass spectrometry Glow-discharge mass spectrometry Inductively coupled-plasma mass spectrometry Electro-thermal vaporization-lCP-MS Thermal-ionization mass spectrometry Accelerator mass spectrometry Secondary-ion mass spectrometry Secondary neutral mass spectrometry Laser mass spectrometry Resonance-ionization mass spectrometry Sputter-initiated resonance-ionization spectroscopy Laser-ablation resonance-ionization spectroscopy... 

Feld, H., Leute, A., Zurmuhlen R., and Benninghoven, A., Comparative and complementary plasma desorption mass spectrometry/secondary ion mass spectrometry investigations of polymer materials. Anal. Chem., 63, 903, 1991. 

Key words Imaging mass spectrometry, secondary ion mass spectrometry, matrix-assisted laser desorption ionization, desorption electrospray ionization, brain. 

Supercritical fiuid extraction and chromatography and comparative complimentary phasing desorption mass spectrometry secondary ion mass spectrometry have been used to determine oligomers in polyethylene terephthalate. ... 

Perfluoroethylenes have been characterized by desorption chemical ionization and tandem mass spectrometry Fourier transform ion cyclotron resonance mass spectroscopy has also been applied to the identification of polymers, eg. polyethylene glycols. Comparative complimentary plasma desorption mass spectrometry/secondary ion mass spectrometry has been applied to the identification of oligomers of various polymers including polyethylene glycol, polytetrafluoroethylene, polycarbonate, polyacrylates, polyethylene terephthalate and siloxanes. ... 

Barish E L, Vitkavage D J and Mayer T M 1985 Sputtering of chlorinated silicon surfaces studied by secondary ion mass spectrometry and ion scattering spectroscopy J. AppL Phys. 57 1336-42... 

The ion source is an essential component of all mass spectrometers where the ionization of a gaseous, liquid or solid sample takes place. In inorganic mass spectrometry, several ion sources, based on different evaporation and ionization processes, such as spark ion source, glow discharge ion source, laser ion source (non-resonant and resonant), secondary ion source, sputtered neutral ion source and inductively coupled plasma ion source, have been employed for a multitude of quite different application fields (see Chapter 9). 

Secondary ion mass spectrometry (SIMS) Secondary neutral mass spectrometry (SNMS) Ion-scattering spectroscopy (ISS)... 

Secondary Ion Mass Spectrometry Proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis. Heinrich, K. F. J. and Newbury, D. E., eds.. National Bureau of Standards Special Publication, Washington, DC, 427 (1975). 

Most analytical studies using FT-ICR mass spectrometry, where ions have been produced inside (or just outside) the analyzer cell, have used lasers as ionization sources. Other than some very limited Cs secondary ion mass spectrometry (SIMS) studies [77], most research utilized direct laser desorption to form various organic [78] and inorganic [79] ions, including metal [80] and semiconductor [81] (including carbon) clusters. More recently matrix assisted laser desorption ionization (MALDI) has been used to form ions of high molecular weight from polymers [82] and many classes of biomolecules [83]. 

Clearly, what is needed is a technique that is readily calibrated and can analyze with spatial resolution of a few microns. Two possibilities, aside from micro-FTIR, appear to exist. Secondary ion mass spectrometry (SIMS) (ion microprobe) is one possibility (Kurosawa et al., 1992, 1993, 1997 Hauri, 2002 Koga et al., 2003), although, like FTIR, it has significant issues with the matrix dependence of the correction factors required. Another possibility that merits further... 

Instead of fast-moving atoms, fast-moving ions such as Cs or Ar+ can be used. This is the base of a technique called SIMS (for secondary ion mass spectrometry). These ions, which can be accelerated, enhance the number of energetic fragmentations. 

Calculations for unreconstructed AgBr (100) surfaces indicate that surface rumpling occurs as halide ions relax outwards and silver ions move in toward the bulk [35]. The results of fluorescence SEXAFS measurements are consistent with the presence of such surface rumpling [47]. The calculations also indicate that rumpling is enhanced by the presence of iodide at the surface and that surface iodide ions have a marked propensity to cluster. These predictions are consistent with the observation of enhanced iodide concentrations at surfaces in AgBr, yIy thin films and emulsion grains, as measured by secondary ion mass spectrometry and ion scattering spectrometry [48,49]. 

Surface Analysis Attenuated Total Internal Reflectance (ATIR), EDX, Rutherford Backscattering (RBS), Electron Spectroscopy for Chemical Analysis (ESCA) also known as X-ray Photoelectron Spectroscopy (XPS), Secondary Ion Mass Spectrometry (SIMS), Ion Scattering Spectroscopy (ISS)... 

Fig. 1. Experimental techniques available for surface studies. SEM = Scanning electron microscopy (all modes) AES = Auger electron spectroscopy LEED = low energy electron diffraction RHEED = reflection high energy electron diffraction ESD = electron stimulated desorption X(U)PS = X-ray (UV) photoelectron spectroscopy ELS = electron loss spectroscopy RBS = Rutherford back scattering LEIS = low energy ion scattering SIMS = secondary ion mass spectrometry INS = ion neutralization spectroscopy.

Mass spectroscopy Secondary ion mass spectrometry (SIMS)... 

In secondary ion mass spectrometry (SIMS) ions with energies in the kilo-electron-volt range consitute the probe. The penetrating power of these ions is rather small and the majority of the ion-matter interaction takes place in the... 

INS Ion neutralization spectroscopy MQS Metastable quenching spectroscopy SSIMS Static secondary-ion mass spectrometry ISS Ion scattering spectroscopy... 

BruneUe, A., Laprevote, O. (2007) Recent advances in biological tissue imaging with time-of-flight secondary ion mass spectrometry polyatomic ion sources, sample preparation, and appUcations. Curr Pharm Des, 13, 3335-3343. 

Solid samples can be analyzed by mass spectrometry with techniques providing ionization by desorption (13) such as MALDI (matrix assisted laser desorption ionization) (14) and S-SIMS (static-secondary ion mass spectrometry) (15). Ions are produced by energy deposition on the sample surface. The analysis can be performed at the bead level. Most of all, chemical images can be produced to localize specific compounds on the studied surfaces. 

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