Mass spectrometry time-of-flight secondary ion

The use of separation techniques, such as gel permeation and high pressure Hquid chromatography interfaced with sensitive, silicon-specific aas or ICP detectors, has been particularly advantageous for the analysis of siUcones in environmental extracts (469,483—486). Supercritical fluid chromatography coupled with various detection devices is effective for the separation of siUcone oligomers that have molecular weights less than 3000 Da. Time-of-flight secondary ion mass spectrometry (TOF-sims) is appHcable up to 10,000 Da (487). 

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)... 

ToF-SIMS Time-of-flight secondary ion mass spectrometry... 

J. Batcheller, A. M. Hacke, R. Mitchell and C. M. Carr, Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF SIMS), Applied Surface Science, 252, 7113 7116(2006). 

A. M. Belu, D. J. Graham and D. G. Castner, Time of flight secondary ion mass spectrometry techniques and applications for the characterization of biomaterial surfaces, Biomaterials, 24, 3635 3653 (2003). 

A. Brunelle, D. Touboul and O. Laprevote, Biological tissue imaging with time of flight secondary ion mass spectrometry and cluster ion sources, Journal of Mass Spectrometry, 40,985 999 (2005). 

J. B. Lhoest, M. S. Wagner, C. D. Tidwell and D. G. Castner, Characterization of adsorbed protein films by time of flight secondary ion mass spectrometry, Journal of Biomedical Materials Research, 57, 432 440 (2001). 

K. Saito, T. Mitsutani, T. Imai, Y. Matsushita and K. Fukushima, Discriminating the indistinguishable sapwood from heartwood in discolored ancient wood by direct molecular mapping of specific extractives using time of flight secondary ion mass spectrometry, Analytical Chemistry, 80, 1552 1557 (2008). 

R. N. S. Sodhi. Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Versatility in Chemical and Imaging Surface Analysis. Analyst, 129(2004) 483-487. 

Dannetun P, Boman M, Stafstrom S, Salaneck WR, Lazzaroni R, Fredriksson C, Bredas JL, Zamboni R, Taliani C (1993) The chemical and electronic structure of the interface between aluminum and polythiophene semiconductors. J Chem Phys 99(l) 664-672 Ahn H, Whitten JE (2003) Vapor-deposition of aluminum on thiophene-terminated self-assembled monolayers on gold. J Phys Chem B 107(27) 6565-6572 Fisher GL, Flooper A, Opila RL, Jung DR, Allara DL, Winograd N (1999) The interaction between vapor-deposited A1 atoms and methylester-terminated self-assembled monolayers studied by time-of-flight secondary ion mass spectrometry, X-ray photoelectron spectroscopy and infrared reflectance spectroscopy. J Electron Spectrosc Relat Phenom 98-99 139-148... 

M. S. Wagner, S. Pasche, D. G. Castner and M. Textor, Characterisation of poly(L-lysine)-graft-poly(ethylene glycol) assembled monolayers on niobium pentoxide substrates using time-of-flight secondary ion mass spectrometry and multivariate analysis, Anal. Chem., 16, 2004, 1483-1492. 

Meyer, K., Fobker, M., Christians, U., Erren, M., Sewing, K. F., Assmann, G., and Benninghoven, A. (1996). Characterization of glucuronidated phase II metabolites of the immunosuppressant cyclosporine in urine of transplant patients using time-of-flight secondary-ion mass spectrometry. Drug Metab. Dispos. 24 1151-1154. 

Sjovall, P., Lausmaa, J., Nygren, H., Carlsson, L., and Malmberg, P. (2003). Imaging of membrane lipids in single cells by imprint-imaging time-of-flight secondary ion mass spectrometry. Anal. Chem. 75 3429-3434. 

Seyer A, Riu A, Debrauwer L, Bourges-Abella N, Brunelle A, Laprevote O, Zalko D (2010) Time-of-flight secondary ion mass spectrometry imaging demonstrates the specific localization of deca-bromo-diphenyl-ether residues in the ovaries and adrenal glands of exposed rats. J Am Soc Mass Spectrom 21 1836-1845. doi 10.1016/j.jasms.2010.06.019... 

D. E. Fowler, R. D. Johnson, D. van Leyen, and A. Benninghoven, Determination of molecular weight and composition of a perfluorinated polymer from fragment intensities in time-of-flight secondary ion mass spectrometry, Anal. Chem. 62, 2088-2092 (1990). 

A sample of a composition, nominally containing 22 ppm silver in water, was analyzed by time-of-flight secondary ion mass spectrometry (TOF-SIMS) in order to determine the form of silver in the composition. The conclusion is that the bulk of the silver exists as silver (0) [that is, metallic silver] and that there is a surface coating which as on average a composition of silver (II) oxide [AgO]. As mentioned above silver (II) oxide is usually a stoichiometric combination of silver (I) and silver (III). 

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