Time-of-flight secondary ion mass spectrometry ToFSIMS

X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToFSIMS) are well established methods for the chenodcal characterisation of surfaces. The techniques combine well, where the quantitative elemental and chemical state information provided by XPS compliments the chemical and molecular structure information provided by ToFSIMS. The techniques probe only from the outermost few nanometres, which define and control the surface properties of many materials. 

Impurity inclusions and surface defects are a cause of many difficulties to the polymer producer and user. Equipment used for studying these phenomena discussed in Chapter 4 include electron microprobe x-ray emission/spectroscopy, NMR micro-imaging, various forms of surface infrared spectroscopy, e.g., diffusion reflection FTIR, ATR, also photoacoustic spectroscopy and x-ray diffraction - infrared microscopy of individual polymer fibres. Newer techniques such as scanning electron microscopy (SECM), transmission electron microscopy, time of flight secondary ion mass spectrometry (TOFSIMS), laser induced photoelectron ionisation with laser desorption, atomic force microscopy and microthermal analysis are discussed. 

ToFSIMS Time-of-flight secondary ion mass spectrometry... 

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