Secondary ion mass spectrometry techniques

A. M. Belu, D. J. Graham and D. G. Castner, Time of flight secondary ion mass spectrometry techniques and applications for the characterization of biomaterial surfaces, Biomaterials, 24, 3635 3653 (2003). 

Gao, Y. (1988) A new secondary ion mass spectrometry technique for III-V semiconductor compounds using the molecular ions CsM. Journal of Applied Physics, 64, 3760-3762. 

SECONDARY ION MASS SPECTROMETRY TECHNIQUE AS A FUNDAMENTAL TOOL FOR IN SITU ELEMENTAL ANALYSIS... 

The diffusion of Co in alumina was carried out at 1403 to 1873K in air, with and without the presence of a spinel phase. The penetration profiles were measured by using the secondary-ion mass spectrometry technique or (at the highest temperature) by performing tracer measurements. The results obtained using both methods could be described by ... 

NanoSIMS is nanoscale secondary ion mass spectrometry technique that allows precise, spatially explicit, elemental and isotopic analysis down to 50 nm resolution [155]. When working in dynamic conditions, NanoSIMS analysis is a destructive process that involves the continuous bombardment of a sample with an energetic ( 16 keV) ion beam (either a Cs" " or O" " primary beam to enhance negative or positive ion formation, respectively), which results in sputtering of the upper sample surface and the consequent liberation of secondary ions. 

Mass spectral analysis of quaternary ammonium compounds can be achieved by fast-atom bombardment (fab) ms (189,190). This technique rehes on bombarding a solution of the molecule, usually in glycerol [56-81-5] or y -nitroben2yl alcohol [619-25-0], with argon and detecting the parent cation plus a proton (MH ). A more recent technique has been reported (191), in which information on the stmcture of the quaternary compounds is obtained indirectly through cluster-ion formation detected via Hquid secondary ion mass spectrometry (Isims) experiments. 

The use of separation techniques, such as gel permeation and high pressure Hquid chromatography interfaced with sensitive, silicon-specific aas or ICP detectors, has been particularly advantageous for the analysis of siUcones in environmental extracts (469,483—486). Supercritical fluid chromatography coupled with various detection devices is effective for the separation of siUcone oligomers that have molecular weights less than 3000 Da. Time-of-flight secondary ion mass spectrometry (TOF-sims) is appHcable up to 10,000 Da (487). 

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. 

Other technique—for example, dynamic secondary ion mass spectrometry or forward recoil spectrometry—that rely on mass differences can use the same type of substitution to provide contrast. However, for hydrocarbon materials these methods attain a depth resolution of approximately 13 nm and 80 nm, respectively. For many problems in complex fluids and in polymers this resolution is too poor to extract critical information. Consequently, neutron reflectivity substantially extends the depth resolution capabilities of these methods and has led, in recent years, to key information not accessible by the other techniques. 

Surface analysis has made enormous contributions to the field of adhesion science. It enabled investigators to probe fundamental aspects of adhesion such as the composition of anodic oxides on metals, the surface composition of polymers that have been pretreated by etching, the nature of reactions occurring at the interface between a primer and a substrate or between a primer and an adhesive, and the orientation of molecules adsorbed onto substrates. Surface analysis has also enabled adhesion scientists to determine the mechanisms responsible for failure of adhesive bonds, especially after exposure to aggressive environments. The objective of this chapter is to review the principals of surface analysis techniques including attenuated total reflection (ATR) and reflection-absorption (RAIR) infrared spectroscopy. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) and to present examples of the application of each technique to important problems in adhesion science. 

Secondary ion mass spectrometry (SIMS) is by far the most sensitive surface technique, but also the most difficult to quantify. When a surface is exposed to a beam of ions (Ar", 0.5-5 keV), energy is deposited in the surface region of the sample by a collisional cascade. Some of the energy will return to the surface and stimulate the ejection (desorption) of atoms, ions, and multi-atomic clusters. In SIMS, positive or negative secondary ions are detected directly with a quadrupole mass spectrometer. 

Elementary steps in which a bond is broken form a particularly important class of reactions in catalysis. The essence of catalytic action is often that the catalyst activates a strong bond that cannot be broken in a direct reaction, but which is effectively weakened in the interaction with the surface, as we explained in Chapter 6. To monitor a dissociation reaction we need special techniques. Temperature-programmed desorption is an excellent tool for monitoring reactions in which products desorb. However, when the reaction products remain on the surface, one needs to employ different methods such as infrared spectroscopy or secondary-ion mass spectrometry (SIMS). 

There are two principal sources of reliable partitioning data for any trace element glassy volcanic rocks and high temperature experiments. For the reasons outlined above, both sources rely on analytical techniques with high spatial resolution. Typically these are microbeam techniques, such as electron-microprobe (EMPA), laser ablation ICP-MS, ion-microprobe secondary ion mass spectrometry (SIMS) or proton-induced X-ray emission (PIXE). 

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