Organic secondary ion mass spectrometry

Delcorte, A., Medard, N., Bertrand, R. (2002) Organic secondary ion mass spectrometry sensitivity enhancement by gold deposition. A flZ. Chem., 74,4955 968. 

Nygren, H., Malmberg, P. (2007) High-resolution imaging by organic secondary ion mass spectrometry. Trends BiotechnoL, 11,499-504. 

Delcorte, A., Bertrand, P. (2005) Metal salts for molecular ion yield enhancement in organic secondary ion mass spectrometry a critical assessment. Anal. Chem., 77, 2107-2115. 

P. (2002) Organic secondary ion mass spectrometry sensitivity enhancement... 

Benninghoven, A. Organic Secondary Ion Mass Spectrometry (SIMS) and Its Relation to Fast Atom Bombardment (FAB). Int. J. Mass Spectrom. Ion Phys. 1983,46,459-462. 

Spectrometric Analysis. Remarkable developments ia mass spectrometry (ms) and nuclear magnetic resonance methods (nmr), eg, secondary ion mass spectrometry (sims), plasma desorption (pd), thermospray (tsp), two or three dimensional nmr, high resolution nmr of soHds, give useful stmcture analysis information (131). Because nmr analysis of or N-labeled amino acids enables determiaation of amino acids without isolation from organic samples, and without destroyiag the sample, amino acid metaboHsm can be dynamically analy2ed (132). Proteia metaboHsm and biosynthesis of many important metaboUtes have been studied by this method. Preparative methods for labeled compounds have been reviewed (133). 

It is worth noting, prior to citing actual metal atom studies, the recent secondary ion mass spectrometry (SIMS) on an argon matrix-isolated propene sample, demonstrating the applicability of SIMS analysis to the characterization of matrix-isolated species. The same group h s reported the first C NMR spectra of organic molecules trapped in an argon matrix. ... 

Several years later, the next step in the application of MS-MS for mixture analysis was developed by Hunt et al. [3-5] who described a master scheme for the direct analysis of organic compounds in environmental samples using soft chemical ionisation (Cl) to perform product, parent and neutral loss MS-MS experiments for identification [6,7]. The breakthrough in LC-MS was the development of soft ionisation techniques, e.g. desorption ionisation (continuous flow-fast atom bombardment (CF-FAB), secondary ion mass spectrometry (SIMS) or laser desorption (LD)), and nebulisation ionisation techniques such as thermospray ionisation (TSI), and atmospheric pressure ionisation (API) techniques such as atmospheric pressure chemical ionisation (APCI), and electrospray ionisation (ESI). 

Franzen, G. et al.. The anionic structure of room-temperature organic chloroaluminate melts from secondary ion mass-spectrometry. Org. Mass Spec., 21,443,1986. 

Todd, P. J., Schaaff, T. G., Chaurand, P., and Caprioli, R. M. (2001). Organic ion imaging of biological tissue with secondary ion mass spectrometry and matrix-assisted laser desorption/ionization. J. Mass Spectrom. 36 355-369. 

Most analytical studies using FT-ICR mass spectrometry, where ions have been produced inside (or just outside) the analyzer cell, have used lasers as ionization sources. Other than some very limited Cs secondary ion mass spectrometry (SIMS) studies [77], most research utilized direct laser desorption to form various organic [78] and inorganic [79] ions, including metal [80] and semiconductor [81] (including carbon) clusters. More recently matrix assisted laser desorption ionization (MALDI) has been used to form ions of high molecular weight from polymers [82] and many classes of biomolecules [83]. 

In this review results from two surface science methods are presented. Electron Spectroscopy for Chemical Analysis (ESCA or XPS) is a widely used method for the study of organic and polymeric surfaces, metal corrosion and passivation studies and metallization of polymers (la). However, one major accent of our work has been the development of complementary ion beam methods for polymer surface analysis. Of the techniques deriving from ion beam interactions, Secondary Ion Mass Spectrometry (SIMS), used as a surface analytical method, has many advantages over electron spectroscopies. Such benefits include superior elemental sensitivity with a ppm to ppb detection limit, the ability to detect molecular secondary ions which are directly related to the molecular structure, surface compositional sensitivity due in part to the matrix sensitivity of secondary emission, and mass spectrometric isotopic sensitivity. The major difficulties which limit routine analysis with SIMS include sample damage due to sputtering, a poor understanding of the relationship between matrix dependent secondary emission and molecular surface composition, and difficulty in obtaining reproducible, accurate quantitative molecular information. Thus, we have worked to overcome the limitations for quantitation, and the present work will report the results of these studies. 

Future Areas of Research. There are certain future experi-ments that are very important for further understanding of the work reported here. The most important ones concern lifetime measurements of the quenching of isopropanol. Secondly, the mechanism of quenching must be understood. Electron paramagnetic resonance experiments will be helpful here. More bulk photolyses and other organic quenchers need to be studied, especially variable size quenchers, in order to help understand diffusional processes in these zeolites. We are presently studying the surfaces of these zeolites with ion scattering spectrometry and secondary ion mass spectrometry. The preliminary results indicate that we... 

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