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Ion spectroscopy scattering

Baun, W. L., et al., Chemistry of Metal and Alloy Adherends by Secondary Ion Mass Spectroscopy, Ion Scattering Spectroscopy, and Auger Electron Spectroscopy, ASTM STP 596, American Society of Testing and Materials, Conshohocken, PA, March 1975. [Pg.460]

See also Activation Anaiysis Neutron Activation Charged-Particle Activation Photon Activation. Atomic Emission Spectrometry Inductively Coupled Plasma. Atomic Mass Spectrometry Inductively Coupled Plasma. Mass Spectrometry Overview. Surface Analysis Particle-Induced X-Ray Emission Auger Electron Spectroscopy Ion Scattering Nuclear Reaction Analysis and Elastic Recoil Detection. X-Ray Fluorescence and Emission Wavelength Dispersive X-Ray Fluorescence Energy Dispersive X-Ray Fluorescence. [Pg.4568]

See also Surface Analysis Auger Electron Spectroscopy Ion Scattering Overview X-Ray Photoelectron Spectroscopy. [Pg.4633]

See also Microscopy Techniques Atomic Force and Scanning Tunneiing Microscopy. Surface Ana-iysis X-Ray Photoeiectron Spectroscopy Auger Eiec-tron Spectroscopy ion Scattering. X-Ray Absorption and Diffraction X-Ray Absorption. X-Ray Fiuorescence and Emission X-Ray Diffraction - Singie Crystai. [Pg.4701]

ABSTRACT. The paper details the use of scanning electron microscopy, surface reflectance infrared spectroscopy, Auger electron spectroscopy, ion scattering spectroscopy, secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy in the analysis of polymeric adhesives and composites. A brief review of the principle of each surface analytical technique will be followed by application of the technique to interfacial adhesion with an emphasis on polymer/metal, fiber/matrix, and composite/composite adhesion. [Pg.125]

W. L. Baun, N. T. McDevitt, and J. S. Solomon, Chemistry of metal and alloy adherends by secondary ion mass spectroscopy, ion scattering spectroscopy, and Auger electron spectroscopy, in Surface Analysis Techniques for Metallurgical Applications, ASTM STP 569 (March 1975). [Pg.286]

ISS Ion scattering spectroscopy [153, 154] Inelastic backscattering of ions (-1 keV ion beam) Surface composition... [Pg.315]

Heiland W and Taglauer E 1975 Low energy ion scattering and Auger electron spectroscopy studies of clean nickel surfaces and adsorbed layers Surf. Sc/. 47 234-43... [Pg.1824]

Brongersma H H and Theeten J B 1976 The structure of oxygen adsorbed on Ni(OOOI) as determined by ion scattering spectroscopy Surf. Sc/. 54 519-24... [Pg.1824]

Aono M, Hou Y, Souda R, Oshima C, Otani S, Ishizawa Y, Matsuda K and Shimizu R 1982 Interaction potential between He" and Ti in a keV range as revealed by a specialized technique in ion scattering spectroscopy Japan. J. Appl. Phys. Lett. 21 L670-2... [Pg.1825]

Aono M, Katayama M and Nomura E 1992 Exploring surface structures by coaxial impact collision ion scattering spectroscopy (CAICISS) Nucl. Instrum. Methods B 64 29-37... [Pg.1825]

Taglauer E, Beckschulte M, Margraf R and Mehl D 1988 Recent developments in the applications of ion scattering spectroscopy Nucl. Instrum. Methods B 35 404-9... [Pg.1825]

Barish E L, Vitkavage D J and Mayer T M 1985 Sputtering of chlorinated silicon surfaces studied by secondary ion mass spectrometry and ion scattering spectroscopy J. AppL Phys. 57 1336-42... [Pg.2941]

HEED = high energy electron diffraction IILE = ion-induced light emission INS = ion-neutralization spectroscopy IRS = infrared spectroscopy ISS = ion-scattering spectroscopy LEED = low energy electron diffraction LEIS = low energy ion scattering ... [Pg.398]

Ion Scattering Spectroscopy (ISS) is one of the most powerful and practical methods of surface analysis available. However, it is undemtilized due to a lack of understanding about its application and capabilities. This stems from its history, the limited number of high-performance instmments manufactured, and the small number of experienced surface scientists who have actually used ISS in extensive applications. Ironically, it is one of the easiest and most convenient sur ce analytical instruments to use and it provides usehil information for almost any type of solid material. [Pg.514]

Metastable quenching spectroscopy Nuclear Reaction Analysis Rutherford back-scattering spectroscopy (or HEIS high-energy ion scattering)... [Pg.4]

See other pages where Ion spectroscopy scattering is mentioned: [Pg.109]    [Pg.129]    [Pg.4731]    [Pg.2]    [Pg.4730]    [Pg.312]    [Pg.282]    [Pg.109]    [Pg.129]    [Pg.4731]    [Pg.2]    [Pg.4730]    [Pg.312]    [Pg.282]    [Pg.692]    [Pg.309]    [Pg.318]    [Pg.1807]    [Pg.2749]    [Pg.269]    [Pg.269]    [Pg.2]    [Pg.3]    [Pg.38]    [Pg.39]    [Pg.39]    [Pg.473]    [Pg.473]    [Pg.514]    [Pg.515]    [Pg.743]    [Pg.774]    [Pg.4]    [Pg.144]    [Pg.155]   
See also in sourсe #XX -- [ Pg.315 ]

See also in sourсe #XX -- [ Pg.70 ]

See also in sourсe #XX -- [ Pg.126 , Pg.133 , Pg.210 ]

See also in sourсe #XX -- [ Pg.338 ]



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Alkali ion scattering spectroscopy

High-energy ion scattering spectroscopy

ISS = ion scattering spectroscopy

Impact collision ion scattering spectroscopy

Impact collision ion scattering spectroscopy ICISS)

Ion scattering

Ion spectroscopy

Low energy ion scattering spectroscopy

Low energy ion scattering spectroscopy LEISS)

Spectroscopy scattering

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