Surface analysis secondary ion mass spectrometry

See alsa Mass Spectrometry Overview Electrospray Peptides and Proteins. Surface Analysis Secondary Ion Mass Spectrometry of Poiymers. 

See also Atomic Mass Spectrometry Inductively Coupled Plasma Laser Microprobe. Gas Chromatography Mass Spectrometry. Liquid Chromatography Liquid Chromatography-Mass Spectrometry. Mass Spectrometry Ionization Methods Overview Atmospheric Pressure Ionization Techniques Electrospray Liquid Secondary Ion Mass Spectrometry Matrix-Assisted Laser Desorption/ionization. Surface Analysis Secondary Ion Mass Spectrometry of Polymers Laser Ionization. 

See MASS SPECTROMETRY Liquid Secondary Ion Mass Spectrometry. SURFACE ANALYSIS Secondary Ion Mass Spectrometry of Polymers... 

SURFACE ANALYSIS/Secondary Ion Mass Spectrometry of Polymers... 

The transmission electron microscopy was done with a 100-kV accelerating potential (Hitachi 600). Powder samples were dispersed onto a carbon film on a Cu grid for TEM examination. The surface analysis techniques used, XPS and SIMS, were described earlier (7). X-ray photoelectron spectroscopy was done with a Du Pont 650 instrument and Mg K radiation (10 kV and 30 mA). The samples were held in a cup for XPS analysis. Secondary ion mass spectrometry and depth profiling was done with a modified 3M instrument that was equipped with an Extranuclear quadrupole mass spectrometer and used 2-kV Ne ions at a current density of 0.5 /zA/cm2. A low-energy electron flood gun was employed for charge compensation on these insulating samples. The secondary ions were detected at 90° from the primary ion direction. The powder was pressed into In foil for the SIMS work. 

ISO Standard 17560 (2002) Surface chemical analysis— Secondary-ion mass spectrometry—Method for depth profihng of boron in silicon, http //www.iso.org/iso/home.html... 

Elemental and molecular surface chemistry plays an important role in the acceptance of an implant material [2-12]. In the study of the elemental and chemical composition of polymeric surfaces, XPS, secondary ion mass spectrometry (SIMS), and surface energy evaluations have emerged as the dominant methods for surface analysis. This is due to the ability of XPS to provide qualitative and quantitative elemental and chemical information (10-100 A), which is complemented by the molecular information obtained from SIMS over the outermost 5-25 A. Surface wettability measurements provide a rapid and quantitative measurement of the inherent surface wettability of a solid sample. When these measurements are accompanied by a Zisman plot, the polarity and critical surface tension (7. ) of the solid surface may be determined. The critical surface tension is a measure of the surface free energy (yj of solid materials. The surface morphology of the lenses studied here was investigated through the use of atomic force microscopy (AFM). The sensitivity of the technique allows submicrometer (to Angstroms) sized features to be examined. 

Ions are also used to initiate secondary ion mass spectrometry (SIMS) [ ], as described in section BI.25.3. In SIMS, the ions sputtered from the surface are measured with a mass spectrometer. SIMS provides an accurate measure of the surface composition with extremely good sensitivity. SIMS can be collected in the static mode in which the surface is only minimally disrupted, or in the dynamic mode in which material is removed so that the composition can be detemiined as a fiinction of depth below the surface. SIMS has also been used along with a shadow and blocking cone analysis as a probe of surface structure [70]. 

Environment. Detection of environmental degradation products of nerve agents directly from the surface of plant leaves using static secondary ion mass spectrometry (sims) has been demonstrated (97). Pinacolylmethylphosphonic acid (PMPA), isopropylmethylphosphonic acid (IMPA), and ethylmethylphosphonic acid (EMPA) were spiked from aqueous samples onto philodendron leaves prior to analysis by static sims. The minimum detection limits on philodendron leaves were estimated to be between 40 and 0.4 ng/mm for PMPA and IMPA and between 40 and 4 ng/mm for EMPA. Sims analyses of IMPA adsorbed on 10 different crop leaves were also performed in order to investigate general apphcabiflty of static sims for... 

This assumes that the gas-solid exchange kinetics at the interface is rapid. When this process affects the exchange kinetics significantly dieii analysis of concentrations layer by layer in die diffused sample is necessaty. This can be done by the use of SIMS (secondary ion mass spectrometry) and the equation used by Kihier, Steele and co-workers for this diffusion study employs a surface exchange component. 

Sputtered Neutral Mass Spectrometry (SNMS) is the mass spectrometric analysis of sputtered atoms ejected from a solid surface by energetic ion bombardment. The sputtered atoms are ionized for mass spectrometric analysis by a mechanism separate from the sputtering atomization. As such, SNMS is complementary to Secondary Ion Mass Spectrometry (SIMS), which is the mass spectrometric analysis of sputtered ions, as distinct from sputtered atoms. The forte of SNMS analysis, compared to SIMS, is the accurate measurement of concentration depth profiles through chemically complex thin-film structures, including interfaces, with excellent depth resolution and to trace concentration levels. Genetically both SALI and GDMS are specific examples of SNMS. In this article we concentrate on post ionization only by electron impact. 

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. 

Surface Analysis by Laser Ionization Post-Ionization Secondary Ion Mass Spectrometry Multi-Photon Nonresonant Post Ionization Multiphoton Resonant Post Ionization Resonant Post Ionization Multi-Photon Ionization Single-Photon Ionization... 

Surface analysis has made enormous contributions to the field of adhesion science. It enabled investigators to probe fundamental aspects of adhesion such as the composition of anodic oxides on metals, the surface composition of polymers that have been pretreated by etching, the nature of reactions occurring at the interface between a primer and a substrate or between a primer and an adhesive, and the orientation of molecules adsorbed onto substrates. Surface analysis has also enabled adhesion scientists to determine the mechanisms responsible for failure of adhesive bonds, especially after exposure to aggressive environments. The objective of this chapter is to review the principals of surface analysis techniques including attenuated total reflection (ATR) and reflection-absorption (RAIR) infrared spectroscopy. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) and to present examples of the application of each technique to important problems in adhesion science. 

Sykes DE (1989) Dynamic secondary ion mass spectrometry. In Wells JM (ed) Methods of surface analysis, Cambridge University Press, Cambridge... 

Further structural information is available from physical methods of surface analysis such as scanning electron microscopy (SEM), X-ray photoelectron or Auger electron spectroscopy (XPS), or secondary-ion mass spectrometry (SIMS), and transmission or reflectance IR and UV/VIS spectroscopy. The application of both electroanalytical and surface spectroscopic methods has been thoroughly reviewed and appropriate methods are given in most of the references of this chapter. 

The impact of an ion beam on the electrode surface can result in the transfer of the kinetic energy of the ions to the surface atoms and their release into the vacuum as a wide range of species—atoms, molecules, ions, atomic aggregates (clusters), and molecular fragments. This is the effect of ion sputtering. The SIMS secondary ion mass spectrometry) method deals with the mass spectrometry of sputtered ions. The SIMS method has high analytical sensitivity and, in contrast to other methods of surface analysis, permits a study of isotopes. In materials science, the SIMS method is the third most often used method of surface analysis (after AES and XPS) it has so far been used only rarely in electrochemistry. 

R. N. S. Sodhi, Time of flight secondary ion mass spectrometry (ToF SIMS) versatility in chemical and imaging surface analysis, Analyst, 129, 483 487 (2004). 

M. S. Wagner and D. G. Castner, Analysis of adsorbed proteins by static time of flight secondary ion mass spectrometry, Applied Surface Science, 231 232, 366 376 (2004). 

Secondary ion (mass spectrometry) SIMS Particle induced desorption/ ionization Nonvolatile molecular ions Semiconductors Surface analysis Imaging... 

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