Fast Atom Bombardment and Liquid Secondary Ion Mass Spectrometry

4 Fast Atom Bombardment and Liquid Secondary Ion Mass Spectrometry 

Secondary ion mass spectrometry (SIMS) analyses the secondary ions emitted when a surface is irradiated with an energetic primary ion beam [9,10], Ion sources with very low-current primary ion beams are called static sources because they do not damage the 

These techniques use current beams that are in dynamic SIMS high enough to damage the surface. But they produce ions from the surface, as in static SIMS, because convection and diffusion inside the matrix continuously create a fresh layer from the surface for producing new ions. The energetic particles hit the sample solution, inducing a shock wave which ejects ions and molecules from the solution. Ions are accelerated by a potential difference towards the analyser. These techniques induce little or no ionization. They generally eject into the gas phase ions that were already present in the solution. 

---

The combination of fast atom bombardment and liquid secondary-ion mass spectrometry with TLC is the subject of Chapter 3 of this volume. It should be noted that less difficulties were encountered in developing combinations TLC/MS than with the corresponding coupling with HPLC, due to the off-line operation of TLC separation and MS detection. 

---