Secondary ion mass spectrometry. See

In secondary ion mass spectrometry (see Fig. 4), a sample is bombarded with a primaty beam of ions. Positively and negatively charged secondary ions are emitted from the sample surface and these are mass analysed to produce mass spectra and images. The technique, as a mass spectrometry, provides detailed surface chemical information elements, chemical groups, molecules, polymer groups. 

Other sources are field desorption, spark source, thermal ionization, fast atom bombardment, and secondary ion mass spectrometry (see SIMS, Section G.4, Surface Analysis). 

Confusingly, FAB is sometimes called secondary ion mass spectrometry (SIMS), the secondary referring to the nature of the process (primary bombardment, secondary emission), but see next item. 

Secondary Ion Mass Spectrometry Dynamic Secondary Ion Mass Spectrometry Static Secondary Ion Mass Spectrometry SIMS using a Quadruple Mass Spectrometer SIMS usii a Magnetic Sector Mass Spectrometer See Magnetic SIMS... 

SIMS, see Secondary ion mass spectrometry Si—N bond, hydrolysis, organosilanols synthesis, 42 171-172... 

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