Applications of Secondary Ion Mass Spectrometry

The applications of SIMS to organometallic and coordination compounds have been pioneered by Cooks and Walton and their co-workers (83-90). They have used solid matrices, such as ammonium or sodium chlorides, to decrease the abundance of ions resulting from intermolec- 

Another area of SIMS that has received a great deal of attention is the study of simple inorganic salts. Marien and De Pauw (92) have looked at the ion-beam-induced effects in SIMS spectra. It is clear that under high ion fluxes significant damage to the surface occurs, with the resulting complication of the spectrum. FAB, or liquid-matrix SIMS, is free of this effect but has the equivalent complication of reactions with the matrix, as discussed previously. 

Campana s group has pioneered the development of high-performance SIMS instrumentation (93), in particular for studies at very high masses. They have investigated metal salt clusters in a manner analogous to the FAB results described in the previous section (94-100). For cubic-like structures, the Csl spectrum shows stable structures for species of the type [Cs(CsI) ]+ where n = 13, 22, 31, 37, 52, end 62 (94) with results now surpassing n = 100 (95). 

Other examples of SIMS for surface analyses are studies of CU2S-CdS solar-cell samples (101) and the study of chemisorbed species on inorganic substrates such as methanol on Cu (100) and titania (102). De Pauw s studies of such adsorbed systems may prove to be valuable in determining the mechanism of catalytic reactions on surfaces (103). Winograd and co-workers (104-6) have studied chemisorption on metal surfaces, using SIMS. In a related study (107), Unger et al. have used molecular SIMS to study the reactions of thiophene on a silver surface. They observed the self-hydrogenation of thiophene on the sur- 

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D. McPhail. Applications of Secondary Ion Mass Spectrometry (SIMS) in Materials Science. J. Material Sci., 41(2006) 873-903. 

Burns MS (1982) Applications of secondary ion mass spectrometry (SIMS) in biological research A review. J Microsc 127 (Pt 3) 237-258. 

Bice, K. L., Layne, G. D. Dahl, K. 2005. Application of secondary ion mass spectrometry to the determination of Mg/Ca in rare, delicate, or altered planktonic foraminifera Examples from the Holocene, Paleogene, and Cretaceous. Geochemistry, Geophysics, Geosystems, 6, Q12P07, doi 10.1029/2005GC000974. 

Yamaji K, Sakai N, Kishimoto H, Horita T, Brito ME, Yokokawa H (2009) Application of secondary ion mass spectrometry (SIMS) technique on the durability of solid oxide fuel cell (SOFC). In Vielstich W, Yokokawa H, Gasteiger HA (eds) Handbook of Fuel Cells... 

In this chapter, the application of secondary ion mass spectrometry (SIMS) techniques, and in particular of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and nanoscale secondary ion mass spectrometry (NanoSIMS), to polymer surface characterization is presented, with attention focused especially on polymer blends and interfaces. 

Morimoto, K., N. Shimada, H. Naganawa, T. Takita, H. Umezawa, and H. Kambara Minor Congeners of Antrimycin Application of Secondary Ion Mass Spectrometry (SIMS) to Structure Determination. J. Antibiot. 35, 378 (1982). 

H. J. Borg and J. W, Niemantsverdriet, Applications of secondary ion mass spectrometry in catalysis and surface chemi.stry, in Catalysi.s A Spe-ciali. t Periodica Report, Vol. 11 (J. J. Spivey and A. K. Agarwal. eds.). The Royal Society of Chemistry, Cambridge, 1994, pp. 1-50. 

Surface analysis has made enormous contributions to the field of adhesion science. It enabled investigators to probe fundamental aspects of adhesion such as the composition of anodic oxides on metals, the surface composition of polymers that have been pretreated by etching, the nature of reactions occurring at the interface between a primer and a substrate or between a primer and an adhesive, and the orientation of molecules adsorbed onto substrates. Surface analysis has also enabled adhesion scientists to determine the mechanisms responsible for failure of adhesive bonds, especially after exposure to aggressive environments. The objective of this chapter is to review the principals of surface analysis techniques including attenuated total reflection (ATR) and reflection-absorption (RAIR) infrared spectroscopy. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) and to present examples of the application of each technique to important problems in adhesion science. 

Further structural information is available from physical methods of surface analysis such as scanning electron microscopy (SEM), X-ray photoelectron or Auger electron spectroscopy (XPS), or secondary-ion mass spectrometry (SIMS), and transmission or reflectance IR and UV/VIS spectroscopy. The application of both electroanalytical and surface spectroscopic methods has been thoroughly reviewed and appropriate methods are given in most of the references of this chapter. 

It is worth noting, prior to citing actual metal atom studies, the recent secondary ion mass spectrometry (SIMS) on an argon matrix-isolated propene sample, demonstrating the applicability of SIMS analysis to the characterization of matrix-isolated species. The same group h s reported the first C NMR spectra of organic molecules trapped in an argon matrix. ... 

Applications Early MS work on the analysis of polymer additives has focused on the use of El, Cl, and GC-MS. The major drawback to these methods is that they are limited to thermally stable and relatively volatile compounds and therefore are not suitable for many high-MW polymer additives. This problem has largely been overcome by the development of soft ionisation techniques, such as FAB, FD, LD, etc. and secondary-ion mass spectrometry. These techniques all have shown their potential in the analysis of additives from solvent extract and/or from bulk polymeric material. Although FAB has a reputation of being the most often used soft ionisation method, Johlman el al. [83] have shown that LD is superior to FAB in the analysis of polymer additives, mainly because polymer additives fragment extensively under FAB conditions. 

Secondary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends. By A. Benninghoven, F. G. Ruenauer, and H.W.Werner Analytical Applications of Lasers. Edited by Edward H. Piepmeier Applied Geochemical Analysis. By C. O. Ingamells and F. F. Pitard Detectors for Liquid Chromatography. Edited by Edward S.Yeung Inductively Coupled Plasma Emission Spectroscopy Part 1 Methodology, Instrumentation, and Performance Part II Applications and Fundamentals. Edited by J. M. Boumans... 

There is a branch of MS specially designed for dealing with the analysis of inorganic materials.[21,22] Different specific ionization techniques, such as inductively coupled plasma mass spectrometry (ICP-MS),[23] glow discharge mass spectrometry (GD-MS)[24] and secondary ion mass spectrometry (SIMS),[25] are available and they are widely used in cultural heritage applications. Their description is beyond the scope of this chapter. 

M. Anderle, M. Bersani, L. Vanzetti and S. Pederzoli, State of art in the SIMS (secondary ion mass spectrometry) application to archaeometry studies, Macromolecular Symposia, 238, 11 15 (2006). 

A. M. Belu, D. J. Graham and D. G. Castner, Time of flight secondary ion mass spectrometry techniques and applications for the characterization of biomaterial surfaces, Biomaterials, 24, 3635 3653 (2003). 

E. Darque Ceretti and M. Aucouturier, Secondary ion mass spectrometry. Application to archaeology and art objects, in Non destructive Analysis of Cultural Heritage Materials, K. Janssens and R. Van Grieken (eds), Comprehensive Analytical Chemistry XLII, Elsevier BV, Amsterdam, 2004, pp. 397 461. 

Several years later, the next step in the application of MS-MS for mixture analysis was developed by Hunt et al. [3-5] who described a master scheme for the direct analysis of organic compounds in environmental samples using soft chemical ionisation (Cl) to perform product, parent and neutral loss MS-MS experiments for identification [6,7]. The breakthrough in LC-MS was the development of soft ionisation techniques, e.g. desorption ionisation (continuous flow-fast atom bombardment (CF-FAB), secondary ion mass spectrometry (SIMS) or laser desorption (LD)), and nebulisation ionisation techniques such as thermospray ionisation (TSI), and atmospheric pressure ionisation (API) techniques such as atmospheric pressure chemical ionisation (APCI), and electrospray ionisation (ESI). 

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