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Secondary ion mass spectrometry TOF

The suitability of this technique for acid-labile (142) and photocleavable linkers (143) has been demonstrated. Other cleavage conditions that do not produce residues (e.g., cleavage with gaseous ammonia) could also be used in theory. TOF-secondary ion mass spectrometry (TOF-SIMS) (144) has also been validated to monitor SP peptide synthesis (145) and could in future increase the versatility of MS monitoring of SP reactions. [Pg.29]

L.A. Klerk, P.Y. Dankers, E.R. Pt ta, A.W. Bosman, M.E. Sanders, K.A. Reedquist, R.M. Heeren, TOF-secondary ion mass spectrometry imaging of polymer scaffolds with surrounding tissue after in vivo implantation. Anal. Chem. 82 (2010) 4337-4343. [Pg.42]

ToF-secondary ion mass spectrometry (ToF-SIMS) is a versatile surface analytical technique that provides detailed information about molecular composition and imaging of surface monolayers with high sensitivity and resolution. In a typical SIMS sample, surfaces are exposed to a beam of energetic primary ions or atoms (5—25 keV), which results in the emission of secondary ions including quasimolecular ions, atoms, and molecules (Benninghoven, 1994). The secondary ions formed as a result of this... [Pg.94]

Key words Time-of-flight (ToF), secondary ion mass spectrometry (SIMS), freeze-fracture, freeze-... [Pg.85]

The use of separation techniques, such as gel permeation and high pressure Hquid chromatography interfaced with sensitive, silicon-specific aas or ICP detectors, has been particularly advantageous for the analysis of siUcones in environmental extracts (469,483—486). Supercritical fluid chromatography coupled with various detection devices is effective for the separation of siUcone oligomers that have molecular weights less than 3000 Da. Time-of-flight secondary ion mass spectrometry (TOF-sims) is appHcable up to 10,000 Da (487). [Pg.60]

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)... [Pg.32]

Fast atom bombardment (FAB) Plasma desorption (PD) Liquid secondary-ion mass spectrometry (LSIMS) Thermospray (TSP)/plasmaspray (PSP) Electrohydrodynamic ionisation (EHI) Multiphoton ionisation (MPI) Atmospheric pressure chemical ionisation (APCI) Electrospray ionisation (ESI) Ion spray (ISP) Matrix-assisted laser desorption/ionisation (MALDI) Atmospheric pressure photoionisation (APPI) Triple quadrupole (QQQ) Four sector (EBEB) Hybrid (EBQQ) Hybrid (EB-ToF, Q-ToF) Tandem ToF-ToF Photomultiplier... [Pg.352]

ToF-SIMS Time-of-flight secondary ion mass spectrometry... [Pg.761]

J. Batcheller, A. M. Hacke, R. Mitchell and C. M. Carr, Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF SIMS), Applied Surface Science, 252, 7113 7116(2006). [Pg.455]

R. N. S. Sodhi. Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Versatility in Chemical and Imaging Surface Analysis. Analyst, 129(2004) 483-487. [Pg.77]

A sample of a composition, nominally containing 22 ppm silver in water, was analyzed by time-of-flight secondary ion mass spectrometry (TOF-SIMS) in order to determine the form of silver in the composition. The conclusion is that the bulk of the silver exists as silver (0) [that is, metallic silver] and that there is a surface coating which as on average a composition of silver (II) oxide [AgO]. As mentioned above silver (II) oxide is usually a stoichiometric combination of silver (I) and silver (III). [Pg.4]

See other pages where Secondary ion mass spectrometry TOF is mentioned: [Pg.1709]    [Pg.1709]    [Pg.549]    [Pg.415]    [Pg.427]    [Pg.32]    [Pg.178]    [Pg.101]    [Pg.528]    [Pg.370]    [Pg.13]    [Pg.277]    [Pg.303]    [Pg.131]    [Pg.251]    [Pg.334]    [Pg.1]    [Pg.305]    [Pg.345]    [Pg.145]    [Pg.4]    [Pg.122]    [Pg.169]    [Pg.51]    [Pg.334]    [Pg.259]    [Pg.254]   


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Time-of-Flight Secondary Ion Mass Spectrometry TOF-SIMS)

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