INS Ion Neutralization Spectroscopy

The technique of INS is probably the least used of those described here, because of experimental difficulties, but it is also one of the physically most interesting. Ions of He of a chosen low energy in the range 5-10 eV approach a metal surface and within an interaction distance of a fraction of a nanometer form ion-atom pairs with the nearest surface atoms. The excited quasi molecule so formed can de-excite by Auger neutralization. If unfilled levels in the ion fall outside the range of filled levels of the solid, as for He , an Auger process can occur in which an electron from the va- 

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Ultra-violet photoemission spectroscopy (UPS) probes the density of states, and ion neutralization spectroscopy (INS) and surface Penning ionization (SPI) provide similar information with probes of ions and metastable atoms, respectively. Angle-resolved UPS can determine the valence band structure. X-ray Photoelectron Spectroscopy (XPS) provides information on chemical shifts of the atomic core levels, and this can also help in understanding chemical bonding at the surface. 

In the FIM the ions are generated at the surface from incident neutrals. In other ion-probe methods the incident beam is already ionized and three major features may be distinguished when it interacts with a surface sputtering and desorption, ion neutralization, and ion scattering. Detection of secondary ions forms the basis of secondary-ion mass spectrometry (SIMS) which is well established as a technique for surface analysis (see ref 208 for a previous review in this series) while ion-neutralization spectroscopy (INS) yields both structural and bonding information on surface species (see ref 209). 

Ion neutralization spectroscopy INS Low-energy He atoms 9, 10 Electron emission... 

Ion neutralization spectroscopy (INS) - See Techniques for Materials Characterization, page 12-1. 

Ions Ion-induced X-ray spectroscopy (IIX) Proton-induced X-ray spectroscopy (PIX) Surface composition by analysis of neutral species and ion-impact radiation (SCANIIR) Glow-discharge optical spectroscopy (GDOS) Ion-neutralization spectroscopy (INS) Ion-induced Auger electron spectroscopy (lAES) Secondary-ion mass spectrometry (SIMS) Ion-scattering spectroscopy (ISS) Rutherford backscatter spectroscopy (RBS)... 

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