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Time of flight static secondary ion mass spectrometry

A time-of-flight static secondary ion mass spectrometry and X-ray photoelectron spectroscopy study of 3-aminopropyltrihydroxysilane on water plasma treated chromium and silicon surfaces... [Pg.305]

Enjalbal, C., Subra, G., Combarieu, R., Martinez, J., and Aubagnac, J.-L. (2000) Use of time of flight static-secondary ion mass spectrometry in peptide synthesis on solid support. Rec. Res. Dev. Organic Chem. 4,29-52. [Pg.23]

Techniques that have been applied include time of flight static secondary ion mass spectrometry (SSIMS)/ " low energy ion scattering spectromehy, x-ray photoelectron microscopy scanning electrochemical microscopy (SECM), laser ionization mass spectrometry, surface enhanced infrared reflection spectroscopy, Fourier Transform infrared spechoscopy and nuclear magnetic resonance spectroscopy. ... [Pg.158]

See other pages where Time of flight static secondary ion mass spectrometry is mentioned: [Pg.481]   
See also in sourсe #XX -- [ Pg.5 , Pg.8 ]



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Time of flight secondary ion mass

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Time-of-Flight Mass Spectrometry

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