Static secondary ion mass spectrometry SIMS

Other mechanical damage to deeper layers of the sample before they can be analyzed in depth profihng. 

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Environment. Detection of environmental degradation products of nerve agents directly from the surface of plant leaves using static secondary ion mass spectrometry (sims) has been demonstrated (97). Pinacolylmethylphosphonic acid (PMPA), isopropylmethylphosphonic acid (IMPA), and ethylmethylphosphonic acid (EMPA) were spiked from aqueous samples onto philodendron leaves prior to analysis by static sims. The minimum detection limits on philodendron leaves were estimated to be between 40 and 0.4 ng/mm for PMPA and IMPA and between 40 and 4 ng/mm for EMPA. Sims analyses of IMPA adsorbed on 10 different crop leaves were also performed in order to investigate general apphcabiflty of static sims for... 

Static Secondary Ion Mass Spectrometry (SIMS) involves the bombardment of a sample with an energetic (typically 1-10 keV) beam of particles, which may be either ions or neutrals. As a result of the interaction of these primary particles with the sample, species are ejected that have become ionized. These ejected species, known as secondary ions, are the analytical signal in SIMS. 

With today s technology, the definition of the surface as it effects a material s performance in many cases means the outer one or two monolayers. It is the specific chemistry of these immediate surface molecules that determines many of the chemical and physical properties. Therefore, it is important to have available a tool that is able to characterize the chemistry of these layers. One such method that has met with considerable success is Static Secondary Ion Mass Spectrometry (SIMS). 

Secondary Ion Mass Spectrometry Dynamic Secondary Ion Mass Spectrometry Static Secondary Ion Mass Spectrometry SIMS using a Quadruple Mass Spectrometer SIMS usii a Magnetic Sector Mass Spectrometer See Magnetic SIMS... 

Briggs, D., Brown, A. and Vickerman, J.C., Handbook of Static Secondary Ion Mass Spectrometry (SIMS). John Wiley and Sons, Chichester, 1989. 

Environment. Detection of environmental degradation products of nerve agents directly from the surface of plantleaves using static secondary ion mass spectrometry (sims) has been demonstrated. 

Figure 7 Static secondary ion mass spectrometry (SIMS) instrument of Benninghoven and Loebach. (From Ref. 34.)...

Static secondary ion mass spectrometry (SIMS) of polymers Static SIMS is a technique that obtains a mass spectrum of the upper 2nm of a surface. Knowledge about surfaces is very important in studies of adhesion, corrosion, catalytic activity, biological compatibility, etc. By limiting the total primary ion dose from a primary ion beam to less than 10 ions per cm, each primary ion interacts with a sample that has not been damaged by previous primary ion impacts. In this way less than 1% of the total surface will be damaged by primary ion impacts. 

Static secondary ion mass spectrometry (SIMS) [31] has been applied to structural characterisation [32-35] and surface analysis of polymers [36, 37]. Polymers can be identified from fingerprint spectra or from fragments characteristic of the backbone and pendant groups. Liquid matrix SIMS-FAB-MS has provided only approximate oligomer distribution. 

Ions are also used to initiate secondary ion mass spectrometry (SIMS) [ ], as described in section BI.25.3. In SIMS, the ions sputtered from the surface are measured with a mass spectrometer. SIMS provides an accurate measure of the surface composition with extremely good sensitivity. SIMS can be collected in the static mode in which the surface is only minimally disrupted, or in the dynamic mode in which material is removed so that the composition can be detemiined as a fiinction of depth below the surface. SIMS has also been used along with a shadow and blocking cone analysis as a probe of surface structure [70]. 

Static Secondary Ion Mass Spectrometry (Static SIMS)... 

In secondary ion mass spectrometry (SIMS) the sample surface is sputtered by an ion beam and the emitted secondary ions are analyzed by a mass spectrometer (review Ref. [360]). Due to the sputtering process, SIMS is a destructive method. Depending on the sputtering rate we discriminate static and dynamic SIMS. In static SIMS the primary ion dosis is kept below 1012 ions/cm2 to ensure that, on average, every ion hits a fresh surface that has not yet been damaged by the impact of another ion. In dynamic SIMS, multiple layers of molecules are removed at typical sputter rates 0.5 to 5 nm/s. This implies a fast removal of the topmost layers of material but allows quantitative analysis of the elemental composition. 

It is a remarkable feature of secondary ion mass spectrometry (SIMS) that considerable chemical information is accessible through the procedurally simple physical technique of sputtering. SIMS--espec ia 11 y under low primary ion flux conditions ("static SIMS," a 1 s o known as "molecular SIMS" when applied to compounds)—provides information on molecular weight and molecular structure and allows isotopic analysis. The surface sensitivity of SIMS permits its use in imaging, in monitoring of surface... 

Surface Chemical Analysis of Polymeric Drug Delivery Systems by Static Secondary Ion Mass Spectrometry (SSIMS) and SIMS Imaging... 

Secondary ion mass spectrometry (SIMS) analyses the secondary ions emitted when a surface is irradiated with an energetic primary ion beam [9,10], Ion sources with very low-current primary ion beams are called static sources because they do not damage the... 

Lee, P. I. and Good, W. R., Eds. Surface chemical analysis of polymeric drug delivery systems by static secondary ion mass spectrometry (SSIMS) and SIMS imaging. In American Chemical Society Symposium Series Controlled-Release Technology, Pharmaceutical Applications. American Chemical Society, Washington, DC, 1987. 

Static or low-damage secondary ion mass spectrometry (SIMS) can be used to characterize polymers and also detect very small amounts of metals transferred to polymers or in polymer wear debris. While SIMS uses an ion beam to sputter remove surface species and is therefore inherently destructive, damage can be minimized by using low ion beam fluxes (3x10 A/cm ). This allows for monolayer analysis. 

In the present paper. Static Secondary Ion Mass Spectrometry (SSIMS) is used to investigate the interfacial chemistry between vacuum-deposited Al and Cu on PET by following the initial stages of metallization in the submonolayer and monolayer regimes. From the SIMS intensity variations with the deposited metal flux, information on the initial growth mechanisms of the metal layer Is expected. Two metals, copper and aluminum, have been chosen In order to investigate the influence of the metal reactivity on the metal-polymer interface formation. Aluminum with its electropositive sp band is known to react strongly with the carbonyl functionalities of the whereas copper is an inert metal and its Interaction is believed to be much weaker. ... 

Secondary ion mass spectrometry (SIMS) is to measure the secondary ions, ionized clusters, atoms and atomic clusters, which are emitted from the surface of particles, when it is bombarded with a primary beam of ions, such as He", Ne", or Ar", with energies in the range of hundreds of eV to keV scale. The emitted ions and ionized clusters are analyzed directly by using a mass spectrometer. Therefore, chemical composition of the surface can be analyzed with the obtained accordingly. SIMS has two modes of analysis (i) static and (ii) dynamic. Static SIMS uses an ion beam with low current density, so as to confine the analysis to the outermost layers. Dynamic SIMS uses beams of high current density, so that successive atomic layers can be eroded at a relatively high rate. Comparatively, the analytical conditions of dynamic SIMS are less suitable for surface analysis. 

Field desorption (FD) and fast atom bombardment (FAB) mass spectrometry provides mass spectral information about compotmds that are not very volatile but these two techniques are not used often in polymer science since they have several disadvantages. Electrospray ionization (ESI) mass spectrometry can also be used to obtain the above information about polymers, but ESI spectra are generally complicated due to differences in charge state distributions. Static secondary ion mass spectrometry (static SIMS) is a surface-sensitive MS technique, which is suitable for studying the interfaces of polymers with respect to chemical structure and molecular weight as well as end groups and surface contaminants. Laser desorption... 

Secondary-ion mass spectrometry (SIMS) is used largely as a surface characterization technique [18]. It is practiced in two formats, dynamic SIMS and static SIMS. In both formats, a beam of keV-energy ions, usually of Ar ions, bombards the surface of the sample directly. The momentum transfer from the beam to the... 

The ultrahigh vacuum technique of secondary ion mass spectrometry (SIMS) is the most sensitive of all the commonly employed sruface analytical techniques. There are a number of variants of the technique for example, static SIMS is used to examine submonolayer elemental analysis, dynamic SIMS is used to obtain compositional information as a function of depth below the sruface, and imagining SIMS is used for spatially resolved elemental analysis. Specimens commonly examined by SIMS are 2.5 cm in diameter and 1 cm thick. When ceramic materials are examined, sample charging is prevented by flooding the surface of the sample with an electron beam. Dynamic SIMS is of great interest and has been used to study changes in elemental composition from weathered or corroded surfaces of samples into the bulk matrix. 

Secondary ion mass spectrometry (SIMS), when carried out in the static (i.e., zero damage) mode, is a uniquely powerful tool for the molecular characterization of polymer surfaces. Its molecular specificity also allows the detection and characterization of additives and contaminants, whose presence at the surface can cause major changes in surface behavior, at the submonolayer level. Modern instruments based on time-of-flight (ToF) mass analyzers and liquid-metal ion sources are capable of chemical imaging with a spatial resolution of well below 1 pm. 

Three different experiments for surface and interface analysis are possible by SIMS (secondary ion mass spectrometry) SIMS static, dynamic and imaging SIMS. 

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