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Electron analysis

The alternative approach to detection and analysis incorporates a solid state detector and a multichannel pulse height analysis system. The crystals used are of silicon (of the highly pure intrinsic type), or the lithium drift principle (p. 463 etseq.) is utilized. All emitted radiations are presented to the detector simultaneously and a spectrum is generated from an electronic analysis of the mixture of voltage pulses produced. Chapter 10 contains a more detailed account of pulse height analysis and solid state detectors. Production of an X-ray spectrum in this way is sometimes known as energy dispersive analysis ofX-rays (EDAX) and where an electron microscope is employed as SEM-EDAX. [Pg.347]

As was noted before, several techniques based on the electronic analysis of signals have been developed to increase the signal-to-noise ratio without requiring large measurement times. In this section, we will focus our attention on the lock-in amplifier and in the next section on photon counter systems. [Pg.101]

Figure 7.4. Electronic analysis using a combination of Oj, and ct O for the reductive elimination of aryl arylamines. Figure 7.4. Electronic analysis using a combination of Oj, and ct O for the reductive elimination of aryl arylamines.
The fourth technique for electron analysis measures a preselected set of zero or nearly-zero kinetic energy. While first known as TPE spectroscopy, when monochromatic synchrotron light was used, the addition of pulsed, tunable lasers has led to a totally new, extremely promising branch of PES, termed zero electron-kinetic-energy (ZEKE) PES or ZEKE spectroscopy18. We will describe it in detail later. [Pg.136]

The Compton effect is the inelastic scattering of a photon by an electron. When radiation is Compton scattered, the emerging beam is Doppler broadened because of the motion of the target electrons. Analysis of this broadened line shape, the Compton profile, provides detailed information about the electron momentum distribution in the scatterer... [Pg.441]

Molecular and Nano Electronics Analysis, Design and Simulation... [Pg.326]

The starting point for our free electron analysis is the assertion that to a first approximation, simple metallic systems may be thought of as consisting of a uniform electron gas with a density determined by how many electrons each atom has donated to the electron sea . The underlying conceptual model is that... [Pg.158]

M.W. Schmidt, J. Ivanic, K. Ruedenberg, Electronic analysis of the ground-state potential energy curve of Be2, J. Phys. Chem. A 114 (2010) 8687. [Pg.102]

The structures of gold cluster compounds bear many similarities to those described above and are amenable to a similar structural/electronic analysis. Kanters and Steggerda have discussed how moments of inertia may be used to distinguish spherical and toroidal clusters [24,25]. [Pg.22]

Auger electron analysis (Figure 12) showed strong peaks for atomic concentrations of S and In. Weak C and O signals have also been detected. In addition, SIMS depth... [Pg.245]

One of the useful consequences of the CESE approach, in conjunction with the related many-electron analysis, is the fact that it solves in a simple way the problem of computing partial decay widths, without or with interchannel coupling. In order to see this, I draw from the theory published in Refs. [37b, 101, 118-121]. [Pg.215]

X-ray photoelectron spectroscopy (XPS), or given its other name Electron Spectroscopy for Chemical Analysis (ESCA), uses X-rays to excite photoelectrons. The emitted electron signal is plotted as a spectrum of binding energies. The photon is absorbed by an atom, molecule or solid leading to ionization and the emission of a core electron. Analysis will reveal the composition from a depth of 2 20 atomic layers and the electronic state of the surface region of the sample. XPS has the ability to identify different chemical states resulting from compound formation, which are revealed by the photoelectron peak positions and shapes. [Pg.475]

The effects of rr-donation from the filled alkyne orbital orthogonal to the n-donating orbital are illustrated by the three structurally characterized Mo(II) diphenylacetylene complexes shown in Figure 2.28. Hoffmann has analyzed the bonding in these complexes. The alkyne ligand in the first complex is adequately described as a two-electron donor, whereas a detailed electronic analysis shows that the alkyne in the porphyrin complex must participate in additional ir-donation to the metal. As a result of this difference in bonding, the acetylenic C-C distance increases across the series of compounds, and the distance from the midpoint of the acetylene to the Mo decreases. [Pg.52]

In order to measure the 3D velocity distributions, ideally one would like to have a 3D spherical TOF detector. However, commonly, TOF devices for atomic and molecular ion (or electron) analysis are ID single-point detectors. This means that the charged particle is transported from the (point) location, where it was generated, through a drift tube to... [Pg.138]

Michaelides and co-workersi have shown theoretically that for monolayers and bilayers of water on Ru, the predominant overlap occurs between the 2pa type 3ai orbital of water with a d 2 state on Ru. In addition there is overlap between the lone-pair Ibi orbital on water and the Ru dz2 state. The overlap and mixing of the metal surface state with the Ibi orbital is significantly stronger. An electronic analysis shows that there is a charge depletion from the Ibi and Ru d 2 states with a charge accumulation on the lower lying dxz and d states. There is also a small charge increase between the O and the Rul l. [Pg.270]

Andres J, Gracia L, Gonzalez-Navarrete P, Longo VM, Avansi W Jr, Volanti DP, Ferrer MM, Lemos PS, La Porta FA, Htanandes AC, Longo E (2014) Structural and electronic analysis of the atomic scale nucleation of Ag on alpha-Ag2W04 induced by electron irradiation. Sci Rep 4 5391-5391... [Pg.293]


See other pages where Electron analysis is mentioned: [Pg.124]    [Pg.191]    [Pg.50]    [Pg.268]    [Pg.1186]    [Pg.675]    [Pg.274]    [Pg.4]    [Pg.188]    [Pg.399]    [Pg.17]    [Pg.143]    [Pg.273]    [Pg.273]    [Pg.291]    [Pg.199]    [Pg.116]    [Pg.712]    [Pg.1418]    [Pg.548]    [Pg.236]    [Pg.256]    [Pg.11]    [Pg.153]    [Pg.74]    [Pg.225]    [Pg.57]    [Pg.147]    [Pg.517]   
See also in sourсe #XX -- [ Pg.32 ]




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Activation analysis electronics materials

Additive analysis scanning electron microscopy-energy

Advanced Instrumental Analysis and Electronic Noses

Analysis Imaging, Electron Probe

Analysis electron capture detection

Analysis of electron density

Analysis of electron dynamics

Analysis of electronic structure

Analysis of the Electron Density Distribution

Analysis of the Electronic Structure

Attractors, electron density analysis

Auger electron spectroscopy analysis

Auger electron spectroscopy analysis technique

Auger electron spectroscopy failure analysis

Auger electron spectroscopy-SIMS surface analysis

Automated electron microprobe analysi

Automated image analysis-scanning electron microscopy

Bond critical points, electron density analysis

Cage critical point, electron density analysis

Coal electron microprobe analysis

Composition Analysis with the Analytical Electron Microscope

Consumer electronics, analysis

Data analysis electronic sensor output

Data analysis, electron spin echo envelope

Data analysis, electron spin echo envelope modulation

Data analysis, electron transfer rate

Distance Analysis of Molecular Electron Densities

ELECTRON DISPERSIVE X-RAY ANALYSIS

ESCA—See Electron spectroscopy for chemical analysis

Electron Backscattered Diffraction Analysis

Electron Calculations and the Analysis of Experimental Data

Electron Density Distribution Analysis

Electron Emission Spectrometric Analysis

Electron Microscopic Analysis of Multicomponent Polymers and Blends

Electron Probe Microanalysis point analysis

Electron Probe Microanalysis scanning analysis

Electron Spectroscopy Analysis

Electron Spectroscopy for Surface Analysis

Electron backscatter diffraction (EBSD) analyses of oxide scale structure

Electron beam, catalyst analysis

Electron capture detector, hydrocarbon analysis

Electron decomposition analysis

Electron density distribution Mulliken population analysis

Electron density distribution analysi

Electron density distributions multipole analysis

Electron density distributions topological analysis

Electron diffraction analysis

Electron diffraction pattern analysis

Electron dispersive spectroscopy analysis

Electron excitation, surface analysis

Electron grazing angle analysis

Electron localization function analysis

Electron localization function analysis substituent

Electron localization function bifurcation analysis

Electron localization function topological analysis

Electron micrographs, analysis

Electron micrographs, analysis solid samples

Electron microprobe analysis

Electron microprobe analysis methods

Electron microprobe analysis of apatite, monazite, and xenotime

Electron microprobe energy-dispersive analysis

Electron microscope analysis

Electron microscopy analysis

Electron microscopy chemical analysis

Electron microscopy energy-dispersive analysis

Electron microscopy image-analysis

Electron nuclear dynamics , molecular systems, final-state analysis

Electron organic trace analysis

Electron paramagnetic chemical analysis

Electron population analysis

Electron probe analysis

Electron probe micro analysis

Electron pulse-probe analysis

Electron scattering, resonances, analysis

Electron spectra, quantitative analysis

Electron spectroscopy for chemical analysi

Electron spectroscopy for chemical analysis

Electron spectroscopy for chemical analysis ESCA)

Electron spectroscopy for chemical analysis, (ESC

Electron spectroscopy of chemical analysis

Electron spectroscopy of chemical analysis ESCA)

Electron spectroscopy-chemical analysis

Electron spectroscopy-chemical analysis ESCA)

Electron spin resonance analysis

Electron surface analysis

Electron transport layer performance analysis

Electron-beam analysis

Electron-capture detectors, lead analysis

Electron-density analysis

Electronic Data Analysis Service

Electronic Data Analysis Service ELECTRAS)

Electronic circular dichroism analysis

Electronic materials surface analysis

Electronic nose instrumental odor analysis

Electronic nose system, analysis

Electronic pathway analysis

Electronic spectroscopy, surface analysis

Electronic spin resonance spectral analysis

Electronic states analysis

Electronic structural model analysis

Electronic structure maximum symmetry analysis

Electronic structure real-space analysis

Electronic wavefunctions analysis

Elements of Electron Density Shape Analysis

Experimental techniques electron probe analysis

Experimental transmission electron microscopy analyses

Field emission scanning electron microscope analysis

Final-state analysis, electron nuclear dynamics

Hydrated electron analysis

Hydrogen electron density distribution analysi

Incident electron beam, surface analysis

Lead, microprobe analysis (electron

Line width analysis, electron paramagnetic

Line width analysis, electron paramagnetic resonance

Molecular electron density analysis

Multicomponent polymers, electron microscopic analysis

Neutron activation analysis electronics materials

Nuclear reaction analysis, electronic

PART I. Quantitative Analysis of Electron Spectra

Polarised electrons analysis

Population analysis electron density

Principles of Electron Spectroscopy for Chemical Analysis (ESCA)

Process characterization, electronic analysis

Quantum reaction dynamics, electronic analysis

Ring critical point, electron density analysis

Rovibrational states, electron nuclear dynamics analysis

Scanning Electron Microscopy and Energy Dispersive Spectrometry Analyses

Scanning electron microscope with elemental analysis capability

Scanning electron microscopes analysis

Scanning electron microscopic analysis

Scanning electron microscopic based automated image analysis

Scanning electron microscopy SEM analysis

Scanning electron microscopy analysis

Scanning electron microscopy and energy dispersive analysis using X-rays

Scanning electron microscopy cross-sectional analysis

Scanning electron microscopy image analysis

Scanning electron microscopy mixture analysis

Scanning electron microscopy structural analysis

Scanning electron microscopy surface analysis

Scanning electron microscopy with polarisation analysis

Scanning electron microscopy with polarization analysis

Scanning electron microscopy/energy dispersive X-ray analysis (SEM

Scanning transmission electron microscope analyses

Scanning transmission electron microscope analyses small particles

Simulation of Electron Spectra for Surface Analysis (SRD

Software used in the analysis of electron micrographs

Spot profile analysis low energy electron diffraction

Surface analysis Auger electron spectroscopy

Surface analysis electron probe microanalysis

Surface analysis electron spectroscopy

Surface analysis instrumental, electronic materials

Surface analysis secondary electron microscopy-energy

Surface compositional analysis. Auger electron spectroscopy (AES)

Tafel Analysis One-Electron Processes

Tafel Analysis Two-Electron Processes

Tools Electronic Data Analysis Service (ELECTRAS)

Topological analysis electron density

Topological analysis of the electron density

Transmission electron microscopy TEM) analysis

Transmission electron microscopy particle size analysis

Wave function analysis electron density

X-ray and electron microscopic analyses

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