Scanning electron microscopy with polarization analysis

When secondary electrons are emitted from a magnetic material they become polarised and so by using a polarisation sensitive detector such as a Mott detector to collect the secondary electrons an image can be obtained that has magnetic contrast, allowing magnetic domain structures to be studied. This technique is known as scanning electron microscopy with polarization analysis (SEMPA). 

S EM PA Scanning electron microscopy with polarization analysis... 

Secondary Electron Microscopy with Polarization Analysis Scanning Force Microscopy Scanning Force Microscope... 

In Reference 107, the effect of grafting of a polar group (MAH) onto LDPE chains and the chemical modification of clay particles with 2,6-diaminocaproic acid (L-lysine monohydrochloride) to produce nanocomposites with a matrix composed of a ternary blend of PEs (LDPE, LLDPE, and HDPE) was studied in detail. X-ray diffraction was used to determine the exfoliation degree of the clay. Morphological features were revealed by scanning electron microscopy and thermal analysis disclosed the thermal stability of the samples. Comparative analyses of the mechanical (under tension) and rheological properties of the nanocomposites were carried out as well. 

The anodic polarization curves were recorded with potential scan rate of 10 mV /sec. The potentiodynamic polarization curve is plotted using AutoLab PGSTAT12 + GPES software. The surface morphology before and after corrosion tests and the chemical composition of selected p>arts of the as-p>rep>ared layers were examined by scanning electron microscopy (SEM) and energy dispiersive X-ray analysis (EDAX), respiectively. 

---