Scanning electron microscopy with polarisation analysis

In this section, two recently developed magnetic imaging methods are described scanning electron microscopy with polarisation analysis, or SEMPA, and magnetic force microscopy, or MFM. [Pg.282]

Acronyms SEM scanning electron microscopy, SEMPA scanning electron microscopy with polarisation analysis, EDX energy dispersive X-ray analysis, EPMA electron probe microanalysis, STkM scanning Auger microscopy. [Pg.567]

SEMPA Scanning Electron Microscopy with Polarisation Analysis, 37 SERS Surface Enhanced Raman Scattering, 32 SEW Surface Electromagnetic Waves Spectroscopy, 40 SEXAFS Surface EXAFS, 49... [Pg.596]

When secondary electrons are emitted from a magnetic material they become polarised and so by using a polarisation sensitive detector such as a Mott detector to collect the secondary electrons an image can be obtained that has magnetic contrast, allowing magnetic domain structures to be studied. This technique is known as scanning electron microscopy with polarization analysis (SEMPA). [Pg.568]