Scanning electron microscopy cross-sectional analysis

Surface topography of Kapton polyimide as-received, seeded with copper, after the 450°C heat treatment, and after removal of copper oxide by acid etching was examined by scanning electron microscopy. Cross-sectional analysis of Kapton seeded with copper and after 450°C heat treatment was carried out by transmission electron microscopy. 

In an article published in Analytical Chemistry in 2004, Keune and Boon [2004a] present the application of ToF-SIMS analysis to a paint cross-section. The sample used was from the panel painting The Descent from the Cross (Museo del Prado, Madrid) by the early Flemish painter Rogier van der Weyden (1399/1400 1464). Scanning electron microscopy with energy dispersive X-ray analysis (SEM-EDX) and infrared microscopy were also used to complete and confirm the results. 

Figure 13.11—Scanning electron microscopy (SEM) accompanied by X-ray fluorescence analysis. Secondary electron image of a cross-section of a supraconducting polycrystalline ceramic with oriented grains of oxide BiPbiSriCaiCurO, (Philips instrument, model XL30FEG). Energy emission spectra corresponding to the matrix and to a 5 pm-long inclusion (bottom). It should be noted that it is possible with this technique to obtain the composition at a precise point on the sample (Link-Oxford analyser) (study by V. Rouessac, reproduced by permission of CRISMAT. University of Caen).

Thick or bulky specimens are commonly used in scanning electron microscopy. However, as shown in Fig. 4.4.2, there are two disadvantages in using such thick specimens (1) a low spatial resolution, and (2) interferences from the effects of backscattering, absorption and fluorescence (Russ 1974). The poor spatial resolution can be remedied by using thin specimens (Fig. 4.4.2). The use of cross-sections of 0.5thickness, for example, would permit analysis of the compound middle lamella in cell walls as a separate entity (Saka and Thomas 1982). The second problem can also be minimized or eliminated by using thin specimens (Russ 1974, Saka and Thomas 1982). 

FIGURE 10.9 Scanning electron microscopy (SEM) analysis of silicalite membranes over nonporous alumina substrates after 20 h of secondary growth synthesis conditions. Left top view. Right cross section. 

Because of the expected small dimensions of the oxidation products and of the oxide scale after short oxidation times it was necessary to use electron microscopic methods to characterize the samples after oxidation. Besides scanning electron microscopy (SEM) transmission electron microscopy (TEM) was mainly used to describe the morphology of the oxide scale and to identify the oxidation products by energy dispersive X-ray analysis (EDX) as well as electron diffraction. A detailed description of the preparation of TEM cross-sections and of the experimental procedure is given in [12]. 

Lab-on-a-Chip Devices for Chemical Analysis, Fig. 3 (a) Layout of the resonance cavity for an array of 16 FP optical filters (b) scanning electron microscopy image showing the cross section of one of the FP optical filters... 

Investigations of the cross-sectional surface of a CBS electrode were carried out using scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDAX) techniques. A disc of a CBS membrane was conditioned in CaCl2 solution then immersed in liquid nitrogen and broken across a diameter. The broken edge of the membrane was examined by SEM and EDAX (for calcium and chlorine). 

Beach, E., Keefe, M., Heeschen, W, and Rothe, D. (2005). Cross-sectional analysis of hollow latex particles by focused ion beam-scanning electron microscopy. Polymer 46(25), 11195-11197. 

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