Scanning electron microscopy surface analysis

Inductively Coupled Plasma. Mass Spectrometry Archaeological Applications. Microscopy Techniques Scanning Electron Microscopy. Surface Analysis X-Ray Photoelectron Spectroscopy Particle-Induced X-Ray Emission Auger Electron Spectroscopy. X-Ray Absorption and Diffraction X-Ray Diffraction - Powder. X-Ray Fluorescence and Emission X-Ray Fluorescence Theory. 

See also Air Analysis Sampling. Microscopy Applications Environmental. Microscopy Techniques Light Microscopy Specimen Preparation for Electron Microscopy Scanning Electron Microscopy. Surface Analysis Low... 

Dan] X-ray powder diffraction, scanning electron microscopy Surface analysis (0-60 pm in depth) after laser treatment... 

Triplicate aliquots were taken for particle size analysis and two of those aliquots were mixed for BET surface area analysis results are in Table III. The nine samples were individually sieved for size distribution. A chi-squared test was performed on each triplicate set in order to check the apparent efficiency of composite mixing. For all three composite samples, there was a 90 percent probability that each of the three replicates from each composite sample came from the same population. The A and C samples were combined and evaluated for surface area by nitrogen adsorption (BET). The B samples were then subjected to scanning electron microscopy (SEM) analysis. 

Scanning electron microscopy (SEM) analysis of polymer surfaces treated for 60 s, which is significantly greater than the 15 s treatment times used in this study, could detect no observable morphological differences between untreated and plasma-treated polymer surfaces for magnifications up to x20,000 (5). 

Low-temperature sublimation has been used to prepare samples for cryo-scanning electron microscopy (SEM) analysis in order to examine herbicide particles in a water suspension. The sublimation of herbicide-containing frozen water droplets provides a suitable etching of the surface for the SEM technique. 

ABSTRACT. The paper details the use of scanning electron microscopy, surface reflectance infrared spectroscopy, Auger electron spectroscopy, ion scattering spectroscopy, secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy in the analysis of polymeric adhesives and composites. A brief review of the principle of each surface analytical technique will be followed by application of the technique to interfacial adhesion with an emphasis on polymer/metal, fiber/matrix, and composite/composite adhesion. 

Field emission scanning electron microscopy (FESEM) analysis was performed with a HITACHI S-4800 instrument in a cryo-mode with secondary electron image resolution of 1.0-1.4 nm at voltages of 1-15 kV. For all measurements, aqueous solutions of nanogels with a concentration of 5 mg/mL were rapidly vitrified in liquid propane and transferred to the high vacuum Balzers BF freeze-etching chamber. Fracture surfaces were prepared by means of a lever and etched by sublimation of the vitrified water for 5-15 min. 

Electron Microprobe Analysis of Minerals Microscopy Scanning Electron Microscopy Surface Chemistry Positron Microscopy Transmission Electron Microscopy X-Ray Analysis X-Ray Photoelectron Spectroscopy... 

Physical testing appHcations and methods for fibrous materials are reviewed in the Hterature (101—103) and are generally appHcable to polyester fibers. Microscopic analyses by optical or scanning electron microscopy are useful for evaluating fiber parameters including size, shape, uniformity, and surface characteristics. Computerized image analysis is often used to quantify and evaluate these parameters for quaUty control. 

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

Further structural information is available from physical methods of surface analysis such as scanning electron microscopy (SEM), X-ray photoelectron or Auger electron spectroscopy (XPS), or secondary-ion mass spectrometry (SIMS), and transmission or reflectance IR and UV/VIS spectroscopy. The application of both electroanalytical and surface spectroscopic methods has been thoroughly reviewed and appropriate methods are given in most of the references of this chapter. 

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