Electron Probe Microanalysis scanning analysis

Analytical services include optical microscopy, scanning electron microscopy, transmission electron microscopy, electron probe microanalysis, scanning auger microanalysis, electron spectroscopy for chemical analysis, x-ray fluorescence, x-ray diffraction, thermal analysis (DSC, DTA, TGA, TMA) and Micro-Fourier transform infrared spectroscopy. 

Electron probe microanalysis functions by direct examination of the primary X-rays produced when the specimen is used as a target for an electron beam. Focused electron beams allow a spot analysis of a 1 pm3 section of the specimen. One current development employs the electron beam within a scanning electron microscope to provide both a visual picture of the surface of the sample and an elemental analysis of the section being viewed. Spectra obtained from primary X-rays always have the characteristic emission peaks superimposed on a continuum of background radiation (Figure 8.32). This feature limits the precision, sensitivity and resolution of electron probe microanalysis. 

The evaluation of coal mineral matter by the ashing technique can be taken further insofar as attempts can then be made to determine the individual metal constituents of the ash. On the occasion when the mineral matter has been separated from the coal successfully, it is then possible to apply any one of several techniques (such as x-ray diffraction, x-ray fluorescence, scanning electron microscopy and electron probe microanalysis) not only to investigate the major metallic elements in coal but also to investigate directly the nature (and amount) of the trace elements in the coal (Jenkins and Walker, 1978 Prather et al., 1979 Raymond and Gooley, 1979 Russell and Rimmer, 1979 Jones et al., 1992). Generally, no single method yields a complete analysis of the mineral matter in coal and it is often necessary to employ a combination of methods. 

XRD, X-ray diffraction XRF, X-ray fluorescence AAS, atomic absorption spectrometry ICP-AES, inductively coupled plasma-atomic emission spectrometry ICP-MS, Inductively coupled plasma/mass spectroscopy IC, ion chromatography EPMA, electron probe microanalysis SEM, scanning electron microscope ESEM, environmental scanning electron microscope HRTEM, high-resolution transmission electron microscopy LAMMA, laser microprobe mass analysis XPS, X-ray photo-electron spectroscopy RLMP, Raman laser microprobe analysis SHRIMP, sensitive high resolution ion microprobe. PIXE, proton-induced X-ray emission FTIR, Fourier transform infrared. 

Acronyms SEM scanning electron microscopy, SEMPA scanning electron microscopy with polarisation analysis, EDX energy dispersive X-ray analysis, EPMA electron probe microanalysis, STkM scanning Auger microscopy. 

Standard laboratory techniques are used to characterize samples for a failure analysis. These techniques include metallography, scanning electron microscopy (SEM), electron probe microanalysis (EPMA), X-ray diffraction (XRD), Fourier transform-infrared analysis (FTIR), and analytical chemistry. 

The localization of structural features in the electron probe is aided by scanning techniques " that produce electron microprobe images of small sectors of the sample surface. It is also possible to obtain scanning images of element distribution. The most attractive feature of electron probe microanalysis is the fact that a quantitative analysis is possible, with errors of less than 3 % relative in most cases. Data evaluation requires the use of a computer, but the... 

Microscopes. There are two basic modes of operation for X-ray analysis in a modern-day AEMs with a static (or flood) beam and with a rastered beam. This instrument is essentially a conventional TEM with either (a) scanning coils to raster and focus the beam or (b) an extra NminiN (or objective pre-field) condenser lens to provide a small (nm-sized) cross-over of a static beam at the objective plane. Some AEM configurations contain both scanning coils and a third condenser lens whilst others may have only one of these. In either condition, a small-sized electron probe can be obtained as a static or a rastered beam. The basic electron-optical principles which provide nanometer-sized beams for microanalysis are similar to those for electron microdiffraction which are well described by Spence and Carpenter [19]. 

The particles were deposited on the slides by in5>actation, sedimentation and diffusion. Subsequently, the samples were analyzed by scanning electron microscopy (SEM). Information on morphology and size distribution was obtained from image analysis, while the elemental composition of particles was determined by electron probe X-ray microanalysis (EPXMA). 

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