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Electron microscopy image-analysis

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY IMAGE ANALYSIS OF DISORDERED CARBONS USED FOR ELECTROCHEMICAL STORAGE OF ENERGY... [Pg.421]

Keywords tissue scaffolds, mercury porosimetry, capillary flow porometry, scanning electron microscopy, image analysis... [Pg.215]

Table III. Dimensions of CPI, PSI-100 and PSI-200 complexes estimated from electron-microscopy image analysis... Table III. Dimensions of CPI, PSI-100 and PSI-200 complexes estimated from electron-microscopy image analysis...
Transmission electron microscopy/image analysis (TEM/AI) has been used for a long time to determine aggregate size distribution of carbon black and silicas (Goritz et al, 1997). Such studies are very costly because they need at least a few thousand aggregate size measurements to determine precisely the size distribution. Nevertheless, using TEM/AI aggregates are measured as two-dimensional projections, which probably maximizes their sizes. [Pg.391]

Table 4.1 Screen Parameters from Scanning Electron Microscopy Image Analysis... Table 4.1 Screen Parameters from Scanning Electron Microscopy Image Analysis...
Table 4.2 Comparison of Three Methods for Determining the Effective Pore Diameter 1. Fit to Equation (3.20) Using Pure Fluid Contact Angles, 2. Historical Data, 3. Scanning Electron Microscopy Image Analysis... Table 4.2 Comparison of Three Methods for Determining the Effective Pore Diameter 1. Fit to Equation (3.20) Using Pure Fluid Contact Angles, 2. Historical Data, 3. Scanning Electron Microscopy Image Analysis...
The mean sizes of windows, dw, and contacting cross sections, Dpc can be measured during analysis of the electron microscopy images as the relation of the first statistical moment to the zero one the sizes of dw can also be measured by adsorption methods (see Section 9.3). The direct interrelation between dw and, for example, Z)pc, is determined in view of a used model (e.g., in the framework of a model of isotropic deforming lattice of particles). Besides, also possible are correlations type of dwi dCi that relate the possible size of a cavity dCj to corresponding sizes of windows dWi from the cavity to the neighboring cavities. [Pg.293]

Schreiner, V. et al., Barrier characteristics of different human skin types investigated with X-ray diffraction, lipid analysis, and electron microscopy imaging, J. Invest. Dermatol., 114, 654, 2000. [Pg.19]

Morphology/crystal habit Microscopy/image analysis Scanning electron microscope... [Pg.233]

Chems et al [18] performed a detailed quantitative analysis of CBED data for (1010) inversion domains in GaN grown on sapphire and concluded that of the various structural models tested, only the IDB model [14] was consistent with their data. High resolution electron microscopy images [16,20] also support the IDB model. Such images show a shift in intensity of lattice fringes across the (1010) plane that is consistent with the proposed model. [Pg.219]

Hence, finite size effects on the optical response of metal nanoparticles are very difficult to take into account in an accurate manner. Moreover, in most experiments carried out on thin nanocomposite films or colloidal solutions the particle size distribution is not mono-dispersed but more or less broad, that can be usually determined by analysis of transmission electronic microscopy images. It should be underlined that the relevant quantity for smdying size effects in the optical response of such media can definitely not be the mean cluster radius , although it is often used in the literature [28-33], since the contribution of one nanoparticle to the optical response of the whole medium is proportional to its volume, i.e. to (cf. Eq. 7). The relevant quantity, that we call the optical mean radius , would then rather be the third-order momentum of the size distribution, = / ... [Pg.468]

Fig. 8.6 Transmission electron microscopy images of refined grain structure, (b) Results of convergent beam electron diffraction analysis from the lower stir zone corresponding to region 4 in Fig. 8.3. Crain boundaries are delineated by various lines, depending on grain-to-grain disorientation angle thick for 6 > 40°, thin for 1 5° < 6 < 40°, and dotted for 0 < 1 5°, respectively. Fig. 8.6 Transmission electron microscopy images of refined grain structure, (b) Results of convergent beam electron diffraction analysis from the lower stir zone corresponding to region 4 in Fig. 8.3. Crain boundaries are delineated by various lines, depending on grain-to-grain disorientation angle thick for 6 > 40°, thin for 1 5° < 6 < 40°, and dotted for 0 < 1 5°, respectively.

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See also in sourсe #XX -- [ Pg.260 ]




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Analysis microscopy

Electron analysis

Electron image

Electron microscopy analysis

Electron microscopy imaging

Electronic imaging

Image analysis

Imaging electron

Microscopy image

Microscopy image analysis

Microscopy imaging

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