Additive analysis scanning electron microscopy-energy

The ingress of electrolyte cations into the MOF framework was confirmed by scanning electron microscopy/energy-dispersive x-ray (EDX) analysis of electrochemically treated deposits of Cu-MOF. Results obtained after application of a reductive potential step to Cu-MOF crystals in contact with acetate buffers are shown in Figure 5.3. Here, EDX spectra for (a) pristine Cu-MOF and (b) Cu-MOF after application of a constant potential of-1.0 V for 10 min are shown. EDX spectra of original Cu-MOF crystals exhibits prominent Cu peaks at 1.0, 8.0, and 8.4 keV accompanied by a Si signal at 1.9 keV. After the electrolysis step, an additional Na peak at 1.1 keV appears. 

The post-modern era covers the 1990s and beyond. Some of the characteristic activities of this era are the application of rather sophisticated devices such as atomic force microscopy (AFM) in addition to scanning electron microscopy (SEM) and techniques such as energy dispersive X-ray analysis (EDXA) and X-ray diffraction (XRD) [28] and electron microprobe analysis in MIC investigations and studies. 

Although a number of secondary minerals have been predicted to form in weathered CCB materials, few have been positively identified by physical characterization methods. Secondary phases in CCB materials may be difficult or impossible to characterize due to their low abundance and small particle size. Conventional mineral identification methods such as X-ray diffraction (XRD) analysis fail to identify secondary phases that are less than 1-5% by weight of the CCB or are X-ray amorphous. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM), coupled with energy dispersive spectroscopy (EDS), can often identify phases not seen by XRD. Additional analytical methods used to characterize trace secondary phases include infrared (IR) spectroscopy, electron microprobe (EMP) analysis, differential thermal analysis (DTA), and various synchrotron radiation techniques (e.g., micro-XRD, X-ray absorption near-eidge spectroscopy [XANES], X-ray absorption fine-structure [XAFSJ). 

Technical examination of objects coated with a protective covering derived from the sap of a shrubby tree produces information that can be used to determine the materials and methods of manufacture. This information sometimes indicates when and where the piece was made. This chapter is intended to present a brief review of the raw material urushi, and the history and study of its use. Analytical techniques have included atomic absorption spectroscopy, thin layer chromatography, differential thermal analysis, emission spectroscopy, x-ray radiography, and optical and scanning electron microscopy these methods and results are reviewed. In addition, new methods are reported, including the use of energy dispensive x-ray fluorescence, scanning photoacoustical microscopy, laser microprobe and nondestructive IR spectrophotometry. 

In addition, scanning electron microscopy coupled with energy-dispersive energy analysis (SEM-EDX) has been implemented as a complementary analytical tool for various purposes (i) to estimate the mean particle size of the metallic particles and look at the eventual influence of the used precursors on these characteristics (ii) to investigate more deeply the composition and dispersion anomalies detected by XPS on certain catalysts (iii) to find experimental evidence for bismuth redeposition on the catalyst surface after use. 

Additional techniques such as FT-IR microspectroscopy, IR and Raman spectroscopy, NMR, and energy dispersive x-ray, in conjunction with scanning electron microscopy, inductively coupled plasma, etc., may also be utilized to provide additional pieces of information toward the comprehensive analysis of materials and the identification of unknowns. Although HSM may not be a technique that all laboratories require, it is clear that the technique can provide valuable information for the visual confirmation of thermal transitions. 

Another technique we used to observe these distributions is scanning electron microscopy with energy dispersive x-ray analysis (EDAX). Concentrations of Cyasorb UV 1084, [2-2 -thiobis(4-ter -octylphenolato)-n-butylamine nickel], a nickel-containing UV absorber, were point counted to obtain nickel concentrations along a spherulite diameter. Figure 3 shows results for 1 and 4 wt % additive. This shows a uniform melt concentration, a boundary peak, a lower concentration within the spherulite, and a central dip. The resolution and sensitivity with this technique are poorer than with the optical microscopy. With every method, thin film crystallized samples and microtomed sections of bulk samples gave similar results. 

The amount of K which may be extracted by H2O has been reported to increase [67, 68] or to decrease [66] by the addition of Si the amount of K which may be extracted by H2O is decreased [66] by the addition of Ca, and decreases [67, 68] or increases [66] by heating the unreduced catalyst. By scanning electron microscopy and energy dispersive X-ray analysis it was found that K segregates to the outer part of the catalyst particles with storage and prolonged use [69]. 

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