Electron probe micro analysis

ELECTRON PROBE MICRO ANALYSIS OF THE METALLIC WARE OF THE BRONZE AGE... 

A ,Ga)As buffer layer is grown before epitaxy of (Ga,Mn)As. To control strain in the film, strain-relaxed thick (In,Ga)As ( 1 /zm) with the lattice constant a0 greater than the subsequent (Ga,Mn)As layer can be employed. The Mn composition x in the Gai - Mn As films can be determined from measurements of a0 by x-ray diffraction (XRD), once the dependence a0(x)is calibrated by other means, such as electron probe micro-analysis (EPMA) or secondary ion mass spectroscopy (SIMS). 

Two analytical techniques were used for the analysis of the coins. First and foremost, a non-destructive handheld X-ray fluorescence (XRF) unit was used. Electron probe micro-analysis (EPMA) was also performed on four coins to compare and confirm the accuracy of the XRF measurements. 

Photons/X-rays Electron-Probe Micro-Analysis, Electron-Spin Resonance, Laser Micro-Probe, Photo-Desorption, Photoelectron Spectroscopy, y-Ray Absorption Spectroscopy, X-Ray Fluorescence, and Other (IR, NMR, UV, Visible, y-Ray, and X-Ray Absorption Spectroscopy). 

Some of the techniques described in this chapter used most widely today are Auger electron spectroscopy, X-ray photoelectron spectroscopy, electron-probe micro-analysis, low energy electron diffraction, scanning electron microscope, ion scattering spectroscopy, and secondary ion mass spectroscopy. The solid surface, after liberation of electrons, can be analyzed directly by AES, XPS, ISS, and EPMA (nondestructive techniques), or by liberation of ions from surfaces using SIMS (involving the destruction of the surface). Apart from the surface techniques, reflectance-absorbance infrared (RAIR) spectroscopy has also been employed for film characterization (Lindsay et al., 1993 Yin et al., 1993). Some... 

Table 5.10. The concentration of oxygen in FeO and sulfur in FeS on the rubbing metal surface estimated by the electron probe micro-analysis (EPMA) technique (Murakami and Sakamoto, 1999)...

Additions of Ti to Cu and Ag-Cu allowed very low contact angles to be achieved on BN at 1150°C (Figure 7.22) and 950°C (Nicholas et al. 1990). Electron probe micro-analysis revealed the formation of a Ti-rich layer several microns thick at the interface but the nature of Ti compounds (TiN or TiB2 or both) was not identified. 

D18. Duncomb, P., Jlecent advances in electron probe micro analysis. J. Sci. Instrum. 2, 553-560 (1969). 

Jones, W.C. and James, D.W.F., 1969. An investigation of some calcareous sponge spicules by means of electron probe micro-analysis. Micron, 1 34—39. 

Scott, V.D. (1995) Quantitative Electron Probe Micro analysis. Princeton, NJ Prentice Hall. 

Raeymaekers B., Van Espen P., Adams F. and Broekaert J. A. C. (1988) A characterization of spark-produced aerosols by automated electron probe micro-analysis, Appl Spectrosc 42 142—150. 

It is apparent from the above results that an asymmetric cation exchange membrane, of which one surface of the membrane has a polypyrrole layer, can be prepared by contacting one surface of the ferric ion form cation exchange membrane with an aqueous pyrrole solution. Figure 5.9 shows a cross-section of a cation exchange membrane having a polypyrrole layer (polymerization period 4 h).57 The dark part of the photograph is where polypyrrole exists. Furthermore, EPMA (electron probe micro analysis) of the cross-section of a similar membrane (polymerization period 1 h) also reveals a thin layer of polypyrrole on the membrane surface.57... 

The formation of anionic polyelectrolyte layers on the surfaces of anion exchange membranes provides ionic cross-linkage and excess anionic charge on the membrane surfaces. Figure 5.25 shows the distribution of sulfur, based on sulfonate groups, for a cross-section of a membrane, measured by EPMA (Electron Probe Micro Analysis), when a strongly basic anion exchange membrane was immersed in an aqueous 200 ppm solution of the polycondensation product of sodium naphthalene sulfonate and formaldehyde for 17 h (sharp... 

Field emission scanning electron microscopy (FESEM), glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy (TEM), micro Raman scattering, Fourier transform inftaied (FTIR) spectrometry, Rutherford back scattering (RBS) studies and electron probe micro analysis (EPMA) have been carried out to obtain micro-structural and compositional properties of the diamond/p-SiC nanocomposite films. Atomic force microscopy (AFM) and indentation studies have been carried out to obtain film properties on the tribological and mechanical front. 

Raudsepp, M. (1995) Recent advances in the electron-probe micro-analysis of minerals for the hght elements. Can. Mineral, 33, 203-218. 

The model fits experimental results excellently for < 0.93 (cf for instance fig. 7). The values obtained for Dgxp (0.5-1 10 7 mVs) and kg (1-2 cm/s) are realistic Core diameters have been predicted and showed satisfactory agreement with sulphur profiles of partly sulphated sorbent particles as determined with Electron Probe Micro Analysis (EPMA). The latter also showed that the original assumption of a shrinking core is correct (figure 8). 

---