Electron spectroscopy chemical analysis

A series of solid solutions (50 mole % each) was prepared from seven class I and two class II spinels. Each solid solution did stabilize catalytic activity and surface area (cf. Tables IV, I, and II). Furthermore, x-ray diffraction patterns revealed that class I spinels which did not easily form pure spinel phases readily formed a single spinel phase solid solution, e.g. the CuO Fe203 NiO A1203 system. Electron spectroscopy chemical analysis (ESCA) did not indicate any significant... 

Another theory claims that a protective complex between the metal and the CP is formed in the metal-polymer interface. Kinlen et al. [73] found by electron spectroscopy chemical analysis (ESCA) that an iron-PANl complex in the intermediate layer between the steel surface and the polymer coating is formed. By isolating the complex, it was found that the complex has an oxidation potential 250 mV more positive than PANI. According to Kinlen et al. [73], this complex more readily reduces oxygen and produces a more efficient electrocatalyst. 

Addi.ional studies using a scanning electron microscope with X-ray function (SEM/X-ray) and electron spectroscopy chemical analysis (ESCA) on the powders will be carried out. An open literature report is being prepared to summarize the results. 

Thompson M, Baker MD, Christie A, Tyson JF (1985) Auger electron spectroscopy (chemical analysis). Wiley, New York... 

Thompson, M. Baker, MD Christie, A and Tyson JF (1985) Auger Electron Spectroscopy (Chemical Analysis, Vol. 74) New York Wiley Interscience. 

KSCA (electron spectroscopy for chemical analysis) See photo-electron spectroscopy. 

Madey and co-workers followed the reduction of titanium with XPS during the deposition of metal overlayers on TiOi [87]. This shows the reduction of surface TiOj molecules on adsorption of reactive metals. Film growth is readily monitored by the disappearance of the XPS signal from the underlying surface [88, 89]. This approach can be applied to polymer surfaces [90] and to determine the thickness of polymer layers on metals [91]. Because it is often used for chemical analysis, the method is sometimes referred to as electron spectroscopy for chemical analysis (ESCA). Since x-rays are very penetrating, a grazing incidence angle is often used to emphasize the contribution from the surface atoms. 

ESCA Electron spectroscopy for chemical analysis [106, 138-142] Same as XPS Same as XPS... 

X-ray photoelectron spectroscopy (XPS), also called electron spectroscopy for chemical analysis (ESCA), is described in section Bl.25,2.1. The most connnonly employed x-rays are the Mg Ka (1253.6 eV) and the A1 Ka (1486.6 eV) lines, which are produced from a standard x-ray tube. Peaks are seen in XPS spectra that correspond to the bound core-level electrons in the material. The intensity of each peak is proportional to the abundance of the emitting atoms in the near-surface region, while the precise binding energy of each peak depends on the chemical oxidation state and local enviromnent of the emitting atoms. The Perkin-Elmer XPS handbook contains sample spectra of each element and bindmg energies for certain compounds [58]. 

Acronyms abound in phofoelecfron and relafed specfroscopies buf we shall use only XPS, UPS and, in Sections 8.2 and 8.3, AES (Auger elecfron specfroscopy), XRF (X-ray fluorescence) and EXAFS (exfended X-ray absorption fine sfmcfure). In addition, ESCA is worth mentioning, briefly. If sfands for elecfron specfroscopy for chemical analysis in which elecfron specfroscopy refers fo fhe various branches of specfroscopy which involve fhe ejection of an elecfron from an atom or molecule. Flowever, because ESCA was an acronym infroduced by workers in fhe field of XPS if is mosf often used to refer to XPS rather than to electron spectroscopy in general. 

Siegbahn, K., Nordling, C., Fahlman, A., Nordberg, R., Hamerin, K., Hedman, J., Johansson, G., Bergmark, T., Karlsson, S.-E., Lindgren, I. and Lindberg, B. (1967) Electron Spectroscopy for Chemical Analysis Atomic, Molecular, and Solid State Structure Studies by Means of Electron Spectroscopy, Almqvist and Wiksells, Uppsala. 

Other techniques in which incident photons excite the surface to produce detected electrons are also Hsted in Table 1. X-ray photoelectron Spectroscopy (xps), which is also known as electron spectroscopy for chemical analysis (esca), is based on the use of x-rays which stimulate atomic core level electron ejection for elemental composition information. Ultraviolet photoelectron spectroscopy (ups) is similar but uses ultraviolet photons instead of x-rays to probe atomic valence level electrons. Photons are used to stimulate desorption of ions in photon stimulated ion angular distribution (psd). Inverse photoemission (ip) occurs when electrons incident on a surface result in photon emission which is then detected. 

One other very important attribute of photoemitted electrons is the dependence of their kinetic energy on chemical environment of the atom from which they originate. This feature of the photoemission process is called the chemical shift of and is the basis for chemical information about the sample. In fact, this feature of the xps experiment, first observed by Siegbahn in 1958 for a copper oxide ovedayer on a copper surface, led to his original nomenclature for this technique of electron spectroscopy for chemical analysis or esca. 

Elemental chemical analysis provides information regarding the formulation and coloring oxides of glazes and glasses. Energy-dispersive x-ray fluorescence spectrometry is very convenient. However, using this technique the analysis for elements of low atomic numbers is quite difficult, even when vacuum or helium paths are used. The electron-beam microprobe has proven to be an extremely useful tool for this purpose (106). Emission spectroscopy and activation analysis have also been appHed successfully in these studies (101). 

X-rays provide an important suite of methods for nondestmctive quantitative spectrochemical analysis for elements of atomic number Z > 12. Spectroscopy iavolving x-ray absorption and emission (269—273) is discussed hereia. X-ray diffraction and electron spectroscopies such as Auger and electron spectroscopy for chemical analysis (esca) or x-ray photoelectron spectroscopy are discussed elsewhere (see X-raytechnology). 

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