Electron Backscattered Diffraction Analysis

Also electron diffraction methods like electron backscatter diffraction (EBSD) can deliver phase information (see Fig. 4). EBSD, applied in scanning electron microscopes, assigns to each surface grain its phase affiliation and its orientation as a result of detected Kikuchi diagrams during specimen scanning (Schwartz et al. 2009). Figure 4 shows an EBSD analysis result for a two-phase titanium specimen. 

Koblischka-Veneva A, Koblischka MR (2008) Analysis of twin boundaries using the electron backscatter diffraction (EBSD) technique. Mater Sci Eng B Solid State Mater Adv Technol 151(l) 60-64... 

In the same manner, hardness measurements and Electron Backscatter Diffraction (EBSD) analysis allow following the microstmcmral evolutions during the course of the manufacturing. 14Cr-ODS mother mbes exhibit a hardness level that is much higher than that of 9Cr-ODS mbes. After hot extmsion, hardness measurements... 

Surface analytical methods — Important ex situ methods for surface analysis are X-Ray Photoelectron Spectroscopy (XPS) UV-Photoelectron Spectroscopy (UPS), Auger Electron Spectroscopy (AES), Ion Scattering Spectroscopy (ISS), Rutherford Backscattering (RBS), Secondary Ion Mass Spectroscopy (SIMS), Scanning Electron Microscopy (SEM), Electron Microprobe Analysis (EMA), Low Energy Electron Diffraction (LEED), and High Energy Electron Diffraction (RHEED). 

Several experimental techniques can be used to study surfaces. X-ray Photoelectron Spectroscopy (XPS), Auger Spectroscopy, X-ray Absorption Spectroscopy, Low Energy Electron Diffraction (LEED), Infra-Red spectroscopy (IR), Raman spectroscopy. Time of Flight Secondary Ionization Mass Spectroscopy (ToF-SIMS), different microscopy techniques, cyclic voltammetry and many other methods have been used to understand the chemical composition and also the reactivity of many sulfide surfaces. However, any analysis using these methodologies are not limited to surface atoms and contributions from the bulk phase are also included. In LEED, for example, in which the incident electrons are elastically backscattered from a surface and subjected to diffraction, the electrons can travel around 5-20 A into the solid. This will make any spectra analysis very difficult and, sometimes, not conclusive. 

---