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Scanning electron microscope with elemental analysis capability

The electron-optical performance of the EPMA system is indistinguishable from that of a conventional scanning electron microscope (SEM) thus, EPMA combines all of the imaging capabilities of a SEM with quantitative elemental analysis using both energy- and wavelength-dispersive X-ray spectrometry. ... [Pg.176]

Energy-dispersive analysis of X-rays was the chosen analytical method because of its sensitivity to elements heavier than sodium, its capability of mapping elemental distribution, and its capacity for combination with a scanning electron microscope. EDS microanalysis has been reported to be suitable for the determination of mordant treatments on historical fibers (8-10) and has been used to characterize metal wrappings of combination yarns (11-13). EDS microanalysis has also been used to determine the composition of pseudomorphs and fibers in the process of mineral replacement (13, 14, 15). [Pg.448]


See other pages where Scanning electron microscope with elemental analysis capability is mentioned: [Pg.111]    [Pg.398]    [Pg.8]    [Pg.438]    [Pg.3084]    [Pg.3810]    [Pg.3811]    [Pg.3002]    [Pg.50]    [Pg.132]    [Pg.624]    [Pg.402]    [Pg.112]   


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Electron analysis

Electron elements

Electron microscop

Electron microscope

Electron microscope analysis

Electron microscopic

Electronics elements

Elements with

Microscopes electron microscope

Microscopic analysis

Scanning capabilities

Scanning electron microscope

Scanning electron microscope with

Scanning electron microscopes analysis

Scanning electron microscopic

Scanning electronic microscope

Scanning elemental analyses

Scanning microscope

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