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Diffraction analysis

X-Ray Methods. In x-ray fluorescence the sample containing mercury is exposed to a high iatensity x-ray beam which causes the mercury and other elements ia the sample to emit characteristic x-rays. The iatensity of the emitted beam is directly proportional to the elemental concentration ia the sample (22). Mercury content below 1 ppm can be detected by this method. X-ray diffraction analysis is ordinarily used for the quaUtative but not the quantitative determination of mercury. [Pg.108]

Crystallinity. Generally, spider dragline and silkworm cocoon silks are considered semicrystalline materials having amorphous flexible chains reinforced by strong stiff crystals (3). The orb web fibers are composite materials (qv) in the sense that they are composed of crystalline regions immersed in less crystalline regions, which have estimates of 30—50% crystallinity (3,16). Eadier studies by x-ray diffraction analysis indicated 62—65% crystallinity in cocoon silk fibroin from the silkworm, 50—63% in wild-type silkworm cocoons, and lesser amounts in spider silk (17). [Pg.77]

Chain Structure. The chemical composition of poly (vinyhdene chloride) has been confirmed by various techniques, including elemental analysis, x-ray diffraction analysis, degradation studies, and in, Raman, and nmr spectroscopy. The polymer chain is made up of vinyhdene chloride units added head-to-tail ... [Pg.430]

A progressive etching technique (39,40), combined with x-ray diffraction analysis, revealed the presence of a number of a polytypes within a single crystal of sihcon carbide. Work using lattice imaging techniques via transmission electron microscopy has shown that a-siUcon carbide formed by transformation from the P-phase (cubic) can consist of a number of the a polytypes in a syntactic array (41). [Pg.464]

A. Segmuller and M. Murakami. X-Ray Diffraction Analysis of Strains and Stresses in Thin Films. In Analytical Techniques for Thin Films. (K.N. Tu and R. Rosenberg, eds.) Academic, San Diego, 1988, p.l43. [Pg.213]

Another major difference between the use of X rays and neutrons used as solid state probes is the difference in their penetration depths. This is illustrated by the thickness of materials required to reduce the intensity of a beam by 50%. For an aluminum absorber and wavelengths of about 1.5 A (a common laboratory X-ray wavelength), the figures are 0.02 mm for X rays and 55 mm for neutrons. An obvious consequence of the difference in absorbance is the depth of analysis of bulk materials. X-ray diffraction analysis of materials thicker than 20—50 pm will yield results that are severely surface weighted unless special conditions are employed, whereas internal characteristics of physically large pieces are routinely probed with neutrons. The greater penetration of neutrons also allows one to use thick ancillary devices, such as furnaces or pressure cells, without seriously affecting the quality of diffraction data. Thick-walled devices will absorb most of the X-ray flux, while neutron fluxes hardly will be affected. For this reason, neutron diffraction is better suited than X-ray diffraction for in-situ studies. [Pg.651]

Within nuclear reactors, neutrons are a primary product of nuclear fission. By controlling the rate of the nuclear reactions, one controls the flux of neutrons and provides a steady supply of neutrons. For a diffraction analysis, a narrow band if neutron wavelengths is selected (fixing X) and the angle 20 is varied to scan the range of values. [Pg.652]

Garavito, R. M., et al., 1983. X-ray diffraction analysis of matrix porin, an integral membrane protein from Escherichia coli outer membrane. Journal of Nlolecular Biology 164 313—327. [Pg.325]

Except for Ceo, lack of sufficient quantities of pure material has prevented more detailed structural characterization of the fullerenes by X-ray diffraction analysis, and even for Ceo problems of orientational disorder of the quasi-spherical molecules in the lattice have exacerbated the situation. At room temperature Cgo crystallizes in a face-centred cubic lattice (Fm3) but below 249 K the molecules become orientationally ordered and a simple cubic lattice (Po3) results. A neutron diffraction analysis of the ordered phase at 5K led to the structure shown in Fig. 8.7a this reveals that the ordering results from the fact that... [Pg.281]

Figure 8.11 (a) Stmeture of C6oOs04(NCsH4Bu )2 as determined by X-ray diffraction analysis, (b) A sehematie representation of the stmeture. [Pg.286]

The product is a black-brown solid that is very sensitive to oxygen. The same cation can be obtained by oxidation of S4N4 with AsFs and is unusual in being the only sulfur-nitrogen (paramagnetic) radical that has been obtained as a stable crystalline salt. X-ray diffraction analysis shows the structure to be a planar 5-membered ring with approximate... [Pg.730]


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See also in sourсe #XX -- [ Pg.267 ]

See also in sourсe #XX -- [ Pg.490 , Pg.491 , Pg.492 , Pg.493 , Pg.494 ]




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A Analysis of diffraction patterns

Analysis by X-ray powder diffraction

Analysis of Diffraction Data with Maximum Entropy Method

Analysis of Diffraction Patterns

Conformational refinement, diffraction analysis

Crystal structure analysis multiple diffraction

Cyclopentanones X-ray diffraction analysis

Diffraction General Structure Analysis

Diffraction analysis, neutron

Diffraction data analysis

Diffraction high-resolution analyses

Diffraction methods data analysis

Diffraction methods, surface analysis

Diffraction patterns analysis

Diffraction powder, analysis

Diffraction structure analysis

Electron Backscattered Diffraction Analysis

Electron backscatter diffraction (EBSD) analyses of oxide scale structure

Electron diffraction analysis

Electron diffraction pattern analysis

Fiber diffraction analysis

Fraunhofer diffraction pattern analysis

General Structure Analysis diffraction software

Image analysis method laser diffraction methods

Laser diffraction particle-size analysis

Neutron diffraction analysis, hydrogen

Neutron powder diffraction quantitative analysis

Particle size analysis light diffraction

Phase analysis, diffraction

Pinacolone X-ray diffraction analysis

Quantitative analysis absorption-diffraction method

Ray Diffraction Analysis

Ray Diffraction Analysis of Postshock Samples

Single-crystal X-ray diffraction analysis

Spectroscopic and X-Ray Diffraction Analysis

Spirocyclic zwitterionic A3Si-silicates X-ray diffraction analysis

Spot profile analysis low energy electron diffraction

Strain/stress diffraction analysis

Structural Analyses X-ray Diffraction

Structure Analysis and X-Ray Diffraction

Structure Analysis by Diffraction

Surfaces neutron diffraction analysis

Wide angle X-ray diffraction analysis

X-Ray Diffraction and EXAFS Analysis

X-ray diffraction analyses

X-ray powder diffraction analysis

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