Photoelectron diffraction

X-Ray Photoelearon Spectroscopy X-Ray Photoemission Spectroscopy Electron Spectroscopy for Chemical Analysis X-Ray Photoelectron Diffraction Photoelectron Diffraction Kinetic Energy... 

X-Ray Diffraction, Photoelectron Spectroscopy, Vibrational Spectroscopy and EXAFS 929... 

The structure of the indium phospholyl [In( -P2C3-/-Bu3)] 39 was studied by X-ray diffraction, photoelectron spectroscopy, and using DFT <19990M793, 2000JCD1715>. 

Elaborate synthetic approaches have been developed that enable significant control over the size and shape of palladium nanostructures. In order to understand the properties of the materials formed based on the preparation method, several characterization techniques have been used. These include electron microscopy, scanning probe microscopy (SPM), nuclear magnetic resonance (NMR) spectroscopy, ultraviolet-visible (UV-Vis) spectroscopy, infrared (IR) spectroscopy, electrochemistry, X-ray diffraction (XRD), thermogravimetric analysis (TGA), electron diffraction, photoelectron spectroscopy, dynamic light scattering (DLS), extended X-ray absorption fine structure (EXAFS), BET surface area analysis andX-ray reflectivity (XRR). In the following section we will describe the information provided by each of these characterization techniques. 

PED Photoelectron diffraction [107-109] x-rays (40-1500 eV) eject photoelectrons intensity measured as a function of energy and angle Surface structure... 

Fadley C S 1993 Diffraction and holography with photoelectrons and Auger electrons some new directions Surf. Sc/. Rep. 19 231... 

Such ideal low mean free paths are the basis of FEED, the teclmique that has been used most for detennining surface structures on the atomic scale. This is also the case of photoelectron diffraction (PD) here, the mean free path of the emitted electrons restricts sensitivity to a similar depdi (actually double the depth of FEED, since the incident x-rays in PD are only weakly adenuated on this scale). 

Fadley C S et al 1997 Photoelectron diffraction space, time and spin dependence of surface structures Surf. Rev. Left 4 421-40... 

X-rays provide an important suite of methods for nondestmctive quantitative spectrochemical analysis for elements of atomic number Z > 12. Spectroscopy iavolving x-ray absorption and emission (269—273) is discussed hereia. X-ray diffraction and electron spectroscopies such as Auger and electron spectroscopy for chemical analysis (esca) or x-ray photoelectron spectroscopy are discussed elsewhere (see X-raytechnology). 

NIRMS = noble-gas-ion reflection mass spectrometry OSEE = optically stimulated exoelectron emission PES = photoelectron spectroscopy PhD = photoelectron diffraction SIMS = secondary ion mass spectroscopy UPS = ultraviolet photoelectron spectroscopy ... 

These cover the following topics (a) theoretical methods, with emphasis on the utility of such methods b) molecular dimensions, as determined by X-ray, electron diffraction and microwave spectra (c) molecular spectra, covering NMR, IR, UV, mass and photoelectron spectra [d) thermodynamic aspects, such as stability, ring strain, aromaticity, shape and conformation of saturated and partially saturated rings (c) tautomerism, including prototopic and ring-chain (/) betaine and other unusual structures. 

Extended X-Ray Absorption Fine Structure, EXAFS 214 Surface Extended X-Ray Absorption Fine Structure and Near Et e X-Ray Absorption Fine Structure, SEXAFS/NEXAFS 227 X-Ray Photoelectron and Auger Diffraction,... 

This chapter contains articles on six techniques that provide structural information on surfaces, interfeces, and thin films. They use X rays (X-ray diffraction, XRD, and Extended X-ray Absorption Fine-Structure, EXAFS), electrons (Low-Energy Electron Diffraction, LEED, and Reflection High-Energy Electron Diffraction, RHEED), or X rays in and electrons out (Surfece Extended X-ray Absorption Fine Structure, SEXAFS, and X-ray Photoelectron Diffraction, XPD). In their usual form, XRD and EXAFS are bulk methods, since X rays probe many microns deep, whereas the other techniques are surfece sensitive. There are, however, ways to make XRD and EXAFS much more surfece sensitive. For EXAFS this converts the technique into SEXAFS, which can have submonolayer sensitivity. 

Auger Electron Diffraction, AED, is an exact analogy to XPD, providing basically the same information. Instead of measuring the angular distribution of the ejected photoelectrons one uses the Auger electrons (Chapter 5). 

Figure 1 Simplistic schematic illustration of the scattering mechanism upon which X-ray photoelectron diffraction (XPD) is based. An intensity increase is expected in the forward scattering direction, where the scattered and primary waves constructively interfere.

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