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Emission, optical

Other Detectors Two additional detectors are similar in design to a flame ionization detector. In the flame photometric detector optical emission from phosphorus and sulfur provides a detector selective for compounds containing these elements. The thermionic detector responds to compounds containing nitrogen or phosphorus. [Pg.570]

Analyses of alloys or ores for hafnium by plasma emission atomic absorption spectroscopy, optical emission spectroscopy (qv), mass spectrometry (qv), x-ray spectroscopy (see X-ray technology), and neutron activation are possible without prior separation of hafnium (19). Alternatively, the combined hafnium and zirconium content can be separated from the sample by fusing the sample with sodium hydroxide, separating silica if present, and precipitating with mandelic acid from a dilute hydrochloric acid solution (20). The precipitate is ignited to oxide which is analy2ed by x-ray or emission spectroscopy to determine the relative proportion of each oxide. [Pg.443]

Spectroscopic methods for the deterrnination of impurities in niobium include the older arc and spark emission procedures (53) along with newer inductively coupled plasma source optical emission methods (54). Some work has been done using inductively coupled mass spectroscopy to determine impurities in niobium (55,56). X-ray fluorescence analysis, a widely used method for niobium analysis, is used for routine work by niobium concentrates producers (57,58). Paying careful attention to matrix effects, precision and accuracy of x-ray fluorescence analyses are at least equal to those of the gravimetric and ion-exchange methods. [Pg.25]

Aluminum is best detected quaUtatively by optical emission spectroscopy. SoHds can be vaporized direcdy in a d-c arc and solutions can be dried on a carbon electrode. Alternatively, aluminum can be detected by plasma emission spectroscopy using an inductively coupled argon plasma or a d-c plasma. Atomic absorption using an aluminum hoUow cathode lamp is also an unambiguous and sensitive quaUtative method for determining alurninum. [Pg.105]

Sihcon has strong optical emission lines at 251.6113 and 288.1579 nm that can easily be detected by emission spectrography and that give sensitivities in the 1—100-ppm range. For nondestmctive analysis, either x-ray diffraction or x-ray fluorescence may be used (see Spectroscopy X-ray technology). [Pg.526]

Highly sensitive iastmmental techniques, such as x-ray fluorescence, atomic absorption spectrometry, and iaductively coupled plasma optical emission spectrometry, have wide appHcation for the analysis of silver ia a multitude of materials. In order to minimize the effects of various matrices ia which silver may exist, samples are treated with perchloric or nitric acid. Direct-aspiration atomic absorption (25) and iaductively coupled plasma (26) have silver detection limits of 10 and 7 l-lg/L, respectively. The use of a graphic furnace ia an atomic absorption spectrograph lowers the silver detection limit to 0.2 l-ig/L. [Pg.91]

Numerous methods have been pubUshed for the determination of trace amounts of tellurium (33—42). Instmmental analytical methods (qv) used to determine trace amounts of tellurium include atomic absorption spectrometry, flame, graphite furnace, and hydride generation inductively coupled argon plasma optical emission spectrometry inductively coupled plasma mass spectrometry neutron activation analysis and spectrophotometry (see Mass spectrometry Spectroscopy, optical). Other instmmental methods include polarography, potentiometry, emission spectroscopy, x-ray diffraction, and x-ray fluorescence. [Pg.388]

Tungsten is usually identified by atomic spectroscopy. Using optical emission spectroscopy, tungsten in ores can be detected at concentrations of 0.05—0.1%, whereas x-ray spectroscopy detects 0.5—1.0%. ScheeHte in rock formations can be identified by its luminescence under ultraviolet excitation. In a wet-chemical identification method, the ore is fired with sodium carbonate and then treated with hydrochloric acid addition of 2inc, aluminum, or tin produces a beautiful blue color if tungsten is present. [Pg.284]

BeryUium aUoys ate usuaUy analyzed by optical emission or atomic absorption spectrophotometry. Low voltage spark emission spectrometry is used for the analysis of most copper-beryUium aUoys. Spectral interferences, other inter-element effects, metaUurgical effects, and sample inhomogeneity can degrade accuracy and precision and must be considered when constmcting a method (17). [Pg.68]

In photoluminescence one measures physical and chemical properties of materials by using photons to induce excited electronic states in the material system and analyzing the optical emission as these states relax. Typically, light is directed onto the sample for excitation, and the emitted luminescence is collected by a lens and passed through an optical spectrometer onto a photodetector. The spectral distribution and time dependence of the emission are related to electronic transition probabilities within the sample, and can be used to provide qualitative and, sometimes, quantitative information about chemical composition, structure (bonding, disorder, interfaces, quantum wells), impurities, kinetic processes, and energy transfer. [Pg.29]

Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES)... [Pg.48]

In Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES), a gaseous, solid (as fine particles), or liquid (as an aerosol) sample is directed into the center of a gaseous plasma. The sample is vaporized, atomized, and partially ionized in the plasma. Atoms and ions are excited and emit light at characteristic wavelengths in the ultraviolet or visible region of the spectrum. The emission line intensities are proportional to the concentration of each element in the sample. A grating spectrometer is used for either simultaneous or sequential multielement analysis. The concentration of each element is determined from measured intensities via calibration with standards. [Pg.48]

The analytical techniques covered in this chapter are typically used to measure trace-level elemental or molecular contaminants or dopants on surfaces, in thin films or bulk materials, or at interfaces. Several are also capable of providing quantitative measurements of major and minor components, though other analytical techniques, such as XRF, RBS, and EPMA, are more commonly used because of their better accuracy and reproducibility. Eight of the analytical techniques covered in this chapter use mass spectrometry to detect the trace-level components, while the ninth uses optical emission. All the techniques are destructive, involving the removal of some material from the sample, but many different methods are employed to remove material and introduce it into the analyzer. [Pg.527]

The Inductively Coupled Plasma (ICP) has become the most popular source for multielement analysis via optical spectroscopy since the introduction of the first commercial instruments in 1974. About 6000 ICP-Optical Emission Spectrometry (ICP-OES) instruments are in operation throughout the world. [Pg.633]

Instrumentation for inductively coupled plasma-optical emission spectrometry. [Pg.635]

Elastic Recoil Detection Analysis Glow discharge mass spectrometry Glow discharge optical emission spectroscopy Ion (excited) Auger electron spectroscopy Ion beam spectrochemical analysis... [Pg.4]

Edited by H. Bubert and H. Jenett Copyright 2002 Wiley-VCH Verlag GmbH ISBNs 3-527-30458-4 (Hardback) 3-527-60016-7 (Electronic) 4.4 Clow Discharge Optical Emission Spectroscopy (CD-OESj... [Pg.221]

Clow Discharge Optical Emission Spectroscopy (CD-OESj 223... [Pg.223]

Chw Discharge Optical Emission Spectroscopy (CD-OES) 229 Tab. 4.2. Some typical applications of GD-OES depth-profile analysis. [Pg.229]

R. Payling, D. Jones, A. Bengtson (eds.J Glow Discharge Optical Emission Spectrometry, John Wiley and Sons, Chichester 1997. [Pg.321]

For intermediate temperatures from 400-1000°C (Fig. 11), the volatilization of carbon atoms by energetic plasma ions becomes important. As seen in the upper curve of Fig. 11, helium does not have a chemical erosion component of its sputter yield. In currently operating machines the two major contributors to chemical erosion are the ions of hydrogen and oxygen. The typical chemical species which evolve from the surface, as measured by residual gas analysis [37] and optical emission [38], are hydrocarbons, carbon monoxide, and carbon dioxide. [Pg.414]

Until the last War, variants of optical emission spectroscopy ( spectrometry when the technique became quantitative) were the principal supplement to wet chemical analysis. In fact, university metallurgy departments routinely employed resident analytical chemists who were primarily experts in wet methods, qualitative and quantitative, and undergraduates received an elementary grounding in these techniques. This has completely vanished now. [Pg.234]


See other pages where Emission, optical is mentioned: [Pg.256]    [Pg.335]    [Pg.345]    [Pg.530]    [Pg.248]    [Pg.612]    [Pg.625]    [Pg.767]    [Pg.221]    [Pg.221]    [Pg.224]    [Pg.225]    [Pg.235]    [Pg.236]    [Pg.246]    [Pg.89]    [Pg.415]    [Pg.244]   
See also in sourсe #XX -- [ Pg.123 ]




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Atomic optical emission spectroscopy

Atomic optical emission spectroscopy applications

Atomic optical emission spectroscopy calibration

Atomic optical emission spectroscopy detectors

Atomic optical emission spectroscopy excitation sources

Atomic optical emission spectroscopy instrumentation

Atomic optical emission spectroscopy interferences

Atomic spectrometry inductively coupled plasma-optical emission

Axial-View ICP Optical Emission

Chemical optical atomic emission

Coupled plasma optical emission spectroscopy

Coupled plasma optical emission spectroscopy ICP-OES)

Direct Couple Optical Emission Spectroscopy

Direct Current Plasma Optical Emission Spectrometry (DCP-OES)

Direct current inductively coupled plasma optical emission

Direct current plasma optical emission

Direct current plasma optical emission spectrometry

Directly coupled plasma-optical emission

GDOES optical emission

Glow discharge optical emission spectroscopy

Glow discharge optical emission spectroscopy GD-OES)

Glow discharge optical emission spectroscopy GDOES)

Glow-discharge optical emission

Glow-discharge optical emission spectrometry

Glow-discharge optical emission spectrometry (GD-OES

Hydride generation-inductively coupled plasma optical emission

ICP optical emission spectrometry

ICP-optical emission spectrometer

ICP-optical emission spectroscopy

Inductively coupled plasma optical emission advantages

Inductively coupled plasma optical emission detection limits

Inductively coupled plasma optical emission determination

Inductively coupled plasma optical emission efficiency

Inductively coupled plasma optical emission first developed

Inductively coupled plasma optical emission metal analysis using

Inductively coupled plasma optical emission optics

Inductively coupled plasma optical emission sample preparation methods

Inductively coupled plasma optical emission spectrometry

Inductively coupled plasma optical emission spectrometry (ICP

Inductively coupled plasma optical emission spectrometry (ICP-OES

Inductively coupled plasma optical emission spectrometry-mass

Inductively coupled plasma optical emission spectrophotometry

Inductively coupled plasma optical emission spectroscopy ICP-OES)

Inductively coupled plasma optical emission spectroscopy instrumentation

Inductively coupled plasma optical emission with laser ablation

Inductively coupled plasma-optical emission

Inductively coupled plasma-optical emission spectrometer

Inductively coupled plasma-optical emission spectroscopy

Light emission from semiconducting optical properties

Mass spectrometry optical emission spectroscopy

Microwave-induced plasma optical emission spectrometry

Monitoring optical emission

Optical Absorption and Emission in Semiconductors

Optical absorption and emission spectra

Optical absorption/emission

Optical emission from plasma

Optical emission intensity

Optical emission plasma diagnostics

Optical emission spectra

Optical emission spectrochemical analysis

Optical emission spectrographic

Optical emission spectrographic techniques

Optical emission spectrometer

Optical emission spectrometry

Optical emission spectrometry (ICP-OES

Optical emission spectrometry experimental

Optical emission spectrometry instrumentation

Optical emission spectrometry quantitative analysis, principles

Optical emission spectrometry sources

Optical emission spectroscop

Optical emission spectroscopy

Optical emission spectroscopy (OES

Optical emission spectroscopy applications

Optical emission spectroscopy atomic fluorescence spectrometry

Optical emission spectroscopy excitation process

Optical emission, plasma

Optical emissions, flowing

Optical filter emission filters

Optical properties tunable emission color

Optical properties, spectroscopy emission

Optically pumped lasing stimulated emission threshold

Quantitative analysis atomic emission spectrometry/optical

Quantitative analysis optical emission spectrometry

Solids spark source optical emission

Source inductively-coupled plasma-optical emission

Spark-source optical emission

Spark-source optical emission spectrometry

Spectra optical line emission

Spectrometric techniques optical emission spectrometry

Trace elements inductively coupled plasma-optical emission

Trace elements optical emission spectroscopy

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