Atomic optical emission spectroscopy calibration

In Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES), a gaseous, solid (as fine particles), or liquid (as an aerosol) sample is directed into the center of a gaseous plasma. The sample is vaporized, atomized, and partially ionized in the plasma. Atoms and ions are excited and emit light at characteristic wavelengths in the ultraviolet or visible region of the spectrum. The emission line intensities are proportional to the concentration of each element in the sample. A grating spectrometer is used for either simultaneous or sequential multielement analysis. The concentration of each element is determined from measured intensities via calibration with standards. 

Compared with the sensors for atoms and radicals, the calibration of EEP sensors is also somewhat specific. To calibrate detectors of atomic particles, it will be generally enough to determine (on the basis of sensor measurements) one of the literature-known constants, say, tiie energy of parent gas dissociation on a hot Hlament. For the detection of EEPs when nonselective excitation of gas is taking place, in order to calibrate a sensor use should be made of some other selective methods detecting EEPs. The calibration method may be optical spectroscopy, chemical and optic titration, emission measurements, etc. 

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