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Atomic optical emission spectroscopy

Because the temperatures of electrical discharges and plasmas are much higher than temperatures that can be achieved in flames, the emission spectra from nonflame excitation sources are very complex. Two types of line spectra are generated from these systems. First are the atomic emission spectra from neutral atoms. These lines are [Pg.462]

Ion lines are less sensitive than atomic lines but are not subject to reversal due to self-absorption, discussed below. They are used for quantitative analyses when a sufficient concentration of the analyte is available. Ion lines are seldom used for qualitative analysis because of their lack of sensitivity. [Pg.463]

Historically, several types of electrical excitation sources have been used since the early part of the 1900s, among them the DC arc, the AC arc, and the AC spark. Commercial instmments using electrical excitation sources became available about 1940 with PMT detectors prior to this, emission instruments used a photographic plate or film as the detector. Modern instruments are either DC arc emission instruments or high voltage spark [Pg.463]

The temperature of the arc depends upon the composition of the plasma and varies with the nature of the sample. If the sample is made of material with low ionization energy, the temperature of the plasma will be low if the ionization energy of the material is high, the temperature will be high. In addition, the temperature is not uniform in either the axial or radial directions. This results in matrix effects and self-absorption. Arc temperatures are on the order of 4500 K with a range of 3000-8000 K. Emission spectra from arc sources contain primarily atomic lines with few ion lines. The DC arc can excite more than 70 elements. [Pg.465]

Another problem with the DC arc is that volatile elements will selectively vaporize and enter the plasma before the less volatile elements in a sample. The electrode temperature increases slowly from the initiation of the arc. If the sample is the anode, which heats more rapidly and to a higher temperature than the cathode, volatile elements will rapidly enter the arc. For example, tungsten powder for light bulb wire contains added potassium [Pg.465]


Analyses of alloys or ores for hafnium by plasma emission atomic absorption spectroscopy, optical emission spectroscopy (qv), mass spectrometry (qv), x-ray spectroscopy (see X-ray technology), and neutron activation are possible without prior separation of hafnium (19). Alternatively, the combined hafnium and zirconium content can be separated from the sample by fusing the sample with sodium hydroxide, separating silica if present, and precipitating with mandelic acid from a dilute hydrochloric acid solution (20). The precipitate is ignited to oxide which is analy2ed by x-ray or emission spectroscopy to determine the relative proportion of each oxide. [Pg.443]

Aluminum is best detected quaUtatively by optical emission spectroscopy. SoHds can be vaporized direcdy in a d-c arc and solutions can be dried on a carbon electrode. Alternatively, aluminum can be detected by plasma emission spectroscopy using an inductively coupled argon plasma or a d-c plasma. Atomic absorption using an aluminum hoUow cathode lamp is also an unambiguous and sensitive quaUtative method for determining alurninum. [Pg.105]

Tungsten is usually identified by atomic spectroscopy. Using optical emission spectroscopy, tungsten in ores can be detected at concentrations of 0.05—0.1%, whereas x-ray spectroscopy detects 0.5—1.0%. ScheeHte in rock formations can be identified by its luminescence under ultraviolet excitation. In a wet-chemical identification method, the ore is fired with sodium carbonate and then treated with hydrochloric acid addition of 2inc, aluminum, or tin produces a beautiful blue color if tungsten is present. [Pg.284]

In Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES), a gaseous, solid (as fine particles), or liquid (as an aerosol) sample is directed into the center of a gaseous plasma. The sample is vaporized, atomized, and partially ionized in the plasma. Atoms and ions are excited and emit light at characteristic wavelengths in the ultraviolet or visible region of the spectrum. The emission line intensities are proportional to the concentration of each element in the sample. A grating spectrometer is used for either simultaneous or sequential multielement analysis. The concentration of each element is determined from measured intensities via calibration with standards. [Pg.48]

Knowledge on the plasma species can be obtained by the use of plasma diagnostics techniques, such as optical emission spectroscopy (OES) and mass spectroscopy (MS). Both techniques are able to probe atomic and molecular, neutral or ionized species present in plasmas. OES is based on measuring the light emission spectrum that arises from the relaxation of plasma species in excited energy states. MS, on the other hand, is generally based on the measurement of mass spectra of ground state species. [Pg.236]

Plasma sources were developed for emission spectrometric analysis in the late-1960s. Commercial inductively coupled and d.c. plasma spectrometers were introduced in the mid-1970s. By comparison with AAS, atomic plasma emission spectroscopy (APES) can achieve simultaneous multi-element measurement, while maintaining a wide dynamic measurement range and high sensitivities and selectivities over background elements. As a result of the wide variety of radiation sources, optical atomic emission spectrometry is very suitable for multi-element trace determinations. With several techniques, absolute detection limits are below the ng level. [Pg.614]

Fabre, C., Boiron, M.-C., Dubessy, J., Moissette, a. 1999. Determination of ions in individual fluid inclusions by laser ablation optical emission spectroscopy development and applications to natural fluid inclusions. Journal of Analytical Atomic Spectrometry, 14(6), 913-922. [Pg.459]

The most frequently applied analytical methods used for characterizing bulk and layered systems (wafers and layers for microelectronics see the example in the schematic on the right-hand side) are summarized in Figure 9.4. Besides mass spectrometric techniques there are a multitude of alternative powerful analytical techniques for characterizing such multi-layered systems. The analytical methods used for determining trace and ultratrace elements in, for example, high purity materials for microelectronic applications include AAS (atomic absorption spectrometry), XRF (X-ray fluorescence analysis), ICP-OES (optical emission spectroscopy with inductively coupled plasma), NAA (neutron activation analysis) and others. For the characterization of layered systems or for the determination of surface contamination, XPS (X-ray photon electron spectroscopy), SEM-EDX (secondary electron microscopy combined with energy disperse X-ray analysis) and... [Pg.259]

Inductively Coupled and Microwave Induced Plasma Sources for Mass Spectrometry 4 Industrial Analysis with Vibrational Spectroscopy 5 Ionization Methods in Organic Mass Spectrometry 6 Quantitative Millimetre Wavelength Spectrometry 7 Glow Discharge Optical Emission Spectroscopy A Practical Guide 8 Chemometrics in Analytical Spectroscopy, 2nd Edition 9 Raman Spectroscopy in Archaeology and Art History 10 Basic Chemometric Techniques in Atomic Spectroscopy... [Pg.321]

Analysis by atomic (or optical) emission spectroscopy is based on the study of radiation emitted by atoms in their excited state, ionised by the effect of high temperature. All elements can be measured by this technique, in contrast to conventional flames that only allow the analysis of a limited number of elements. Emission spectra, which are obtained in an electron rich environment, are more complex than in flame emission. Therefore, the optical part of the spectrometer has to be of very high quality to resolve interferences and matrix effects.-... [Pg.273]

Since the mid-1960s, a variety of analytical chemistry techniques have been used to characterize obsidian sources and artifacts for provenance research (4, 32-36). The most common of these methods include optical emission spectroscopy (OES), atomic absorption spectroscopy (AAS), particle-induced X-ray emission spectroscopy (PIXE), inductively coupled plasma-mass spectrometry (ICP-MS), laser ablation-inductively coupled plasma mass spectrometry (LA-ICP-MS), X-ray fluorescence spectroscopy (XRF), and neutron activation analysis (NAA). When selecting a method of analysis for obsidian, one must consider accuracy, precision, cost, promptness of results, existence of comparative data, and availability. Most of the above-mentioned techniques are capable of determining a number of elements, but some of the methods are more labor-intensive, more destructive, and less precise than others. The two methods with the longest and most successful histoty of success for obsidian provenance research are XRF and NAA. [Pg.527]

Several other methods have been used to determine the trace elements in the mineral matter of coal, as well as in whole coal and coal-derived materials. These methods include spark-source mass spectrometry, neutron activation analysis, optical emission spectroscopy, and atomic absorption spectroscopy. [Pg.106]

Multielement analysis will become more important in industrial hygiene analysis as the number of elements per sample and the numbers of samples increases. Additional requirements that will push development of atomic absorption techniques and may encourage the use of new techniques are lower detction and sample speciation. Sample speciation will probably require the use of a chromatographic technique coupled to the spectroscopic instrumentation as an elemental detector. This type of instrumental marriage will not be seen in routine analysis. The use of Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES) (17), Zeeman-effect atomic absorption spectroscopy (ZAA) (18), and X-ray fluorescence (XRF) (19) will increase in industrial hygiene laboratories because they each offer advantages or detection that AAS does not. [Pg.263]

In both total and sequential dissolutions, the result is a solution containing the components of rocks and soils. This solution is then analyzed by different methods. Mostly, spectroscopic methods are used atomic absorption and emission spectroscopic methods, ultraviolet, atom fluorescence, and x-ray fluorescence spectrometry. Multielement methods (e.g., inductively coupled plasma optical emission spectroscopy) obviously have some advantages. Moreover, elec-troanalytical methods, ion-selective electrodes, and neutron activation analysis can also be applied. Spectroscopic methods can also be combined with mass spectrometry. [Pg.208]

This system forms highly ionized so-called Penning mixtures [12,13]. The higher excited states of Hj are partly stable and partly unstable, depending on the quantum numbers of the electron present. The stable excited states have, however, only very shallow minima of the potential curves [14]. That is the reason why no spectrum of Hj is observed for the helium plasma jet. The argon excited neutrals, on the other hand, cannot ionize hydrogen atoms or molecules, but could produce excited H2 molecules, which can be detected by optical emission spectroscopy. [Pg.349]

Graphite furnace AAS Atomic fluorescence spectroscopy Inductively-coupled-plasma optical-emission spectroscopy Glow-discharge optical-emission spectroscopy Laser-excited resonance ionization spectroscopy Laser-excited atomic-fluorescence spectroscopy Laser-induced-breakdown spectroscopy Laser-induced photocoustic spectroscopy Resonance-ionization spectroscopy... [Pg.208]

Tt may be safe to say that the interest of environmental scientists in airborne metals closely parallels our ability to measure these components. Before the advent of atomic absorption spectroscopy, the metal content of environmental samples was analyzed predominantly by wet or classical chemical methods and by optical emission spectroscopy in the larger analytical laboratories. Since the introduction of atomic absorption techniques in the late 1950s and the increased application of x-ray fluorescence analysis, airborne metals have been more easily and more accurately characterized at trace levels than previously possible by the older techniques. These analytical methods along with other modem techniques such as spark source mass spectrometry and activation analysis... [Pg.146]

Atomic absorption spectroscopy, neutron activation analysis, I CP-optical emission spectroscopy Inorganic bulk and surface impurities of packings Chemical stability of packing, retention of solutes, peak tailing... [Pg.92]

The most utilized methods include X-ray fluorescence (XRF), atomic absorption spectroscopy (AAS), activation analysis (AA), optical emission spectroscopy (OES) and inductively coupled plasma (ICP), mass spectroscopy (MS). Less frequently used techniques include ion-selective electrode (ISE), proton induced X-ray emission (PIXE), and ion chromatography (IC). In different laboratories each of these methods may be practiced by using one of several optional approaches or techniques. For instance, activation analysis may involve conventional thermal neutron activation analyses, fast neutron activation analysis, photon activation analysis, prompt gamma activation analysis, or activation analysis with radio chemical separations. X-ray fluorescence options include both wave-length and/or energy dispersive techniques. Atomic absorption spectroscopy options include both conventional flame and flameless graphite tube techniques. [Pg.21]

The most common type of emission spectrometer in use today (inductively coupled plasma-optical emission spectroscopy, or ICP-OES) atomizes a sample by passing an electric current into a gas plasma that contains the sample. In these optical emission methods, the sample is heated to high temperature. At this temperature the individual elements glow with their representative colors, e.g., red for potassium, yellow for sodium. The light from the sample is focused on a monochrometer to select a wavelength appropriate for the element of interest. That light at the correct wavelength is focused on a detector that measures its intensity (Fig. 4.8). [Pg.84]

Heavy metals, boron (B(V)), arsenic and total phosphorus were determined in the fraction < 20 pm to improve the comparability of the results. This fraction was separated from the freeze-dried and non-milled samples by ultrasonic sieving (Ackermann 1980). Metals were analysed after microwave-assisted digestion with aqua regia at 180 °C in closed vessels by inductively coupled plasma optical emission spectroscopy, atomic fluorescence spectroscopy (mercury) and hydride atomic absorption spectroscopy (arsenic). [Pg.149]

Each experiment was accortqjanied the determination of Pd in solution after hot filtration of the solid catalyst at the end of the reaction. Because simple Atomic Absorption Spectroscopy (AAS) was found to not be precise enough for the palladium analysis in this concentration range (detection limit too high.) ICP-OES and/or ICP-MS (Inductively Coupled Plasma - Optical Emission Spectroscopy or Inductively Coupled Plasma - Mass Spectrometry) were applied. To first approximation, the Pd leaching could not be correlated with the properties of the twelve different Pd/C catalysts described above ((1) Correlation of catalyst structure and activity.) There is, however, a strong correlation with the reaction parameters as described below. [Pg.391]


See other pages where Atomic optical emission spectroscopy is mentioned: [Pg.462]    [Pg.462]    [Pg.625]    [Pg.26]    [Pg.19]    [Pg.11]    [Pg.285]    [Pg.44]    [Pg.74]    [Pg.308]    [Pg.263]    [Pg.2]    [Pg.224]    [Pg.101]    [Pg.285]    [Pg.143]    [Pg.30]    [Pg.341]    [Pg.86]    [Pg.309]    [Pg.10]   


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Atom optics

Atomic emission

Atomic emission spectroscopy

Atomic optical emission spectroscopy applications

Atomic optical emission spectroscopy calibration

Atomic optical emission spectroscopy detectors

Atomic optical emission spectroscopy excitation sources

Atomic optical emission spectroscopy instrumentation

Atomic optical emission spectroscopy interferences

Atomic spectroscopy

Emission spectroscopy)

Optical atomic spectroscopy

Optical emission

Optical emission spectroscopy atomic fluorescence spectrometry

Optical spectroscopy

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