Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Microscopy analysis

Keywords. Image analysis, Microscopy, Visualization, Morphology, Physiology, Motility, Visual... [Pg.133]

Chemical analysis, microscopy, XRD and other methods of examination should be carried out on the same, representative sample of material. A procedure for obtaining such a sample is described in the next section. [Pg.101]

Chamberlain, E. K. 1996. Characterization of heated and thermally processed cross-linked waxy maize starch utilizing particle size analysis, microscopy and rheology. M. S. Thesis, Cornell University, Ithaca, NY. [Pg.21]

Physical studies of molecular mechanisms, physical and chemical phenomena and elucidation of changes in foam properties under the effect of external factors Studies on the chemical structure and morphology using methods of ectroscopy. X-ray analysis, microscopy, thermography, etc. [Pg.12]

Dependent on physical properties Fluorescence, Thermal analysis. Microscopy Sedimentation,... [Pg.351]

Of course, the above-mentioned methods all have advantages and disadvantages. Therefore, it is best to use a combination of methods, e.g., surface analysis, microscopy, and chemisorption measurements. [Pg.220]

See also-. Chiroptical Analysis. Microscopy Overview. Microscopy Techniques Specimen Preparation for Light. Optical Spectroscopy Refractometry and Reflectometry. Particle Size Analysis. [Pg.3131]

Thermal analysis Microscopy Hot-stage microscopy, VMI-TG-MS LTA, SthM, CASM... [Pg.210]

Differential thermal analysis, microscopy, or in situ X-ray diffraction... [Pg.438]

Cationic nanoclays were treated with various novel modifiers based on ionic liquids of different structure and/or molecular weight. Initial experiments with short chain dialkyl imidazolium and monoalkyl pyridinium based modifiers were followed by treatments with phosphonium based ionic liquids having longer chain cations. The modified clays, characterized by spectroscopy, thermal analysis, microscopy and X-ray diffraction, were melt compounded with polypropylene. The effects of the ionic hquid structure and chain length on extent of clay dispersion, intercalation and thermal stabihty were investigated. [Pg.680]

Two nucleation processes important to many people (including some surface scientists ) occur in the formation of gallstones in human bile and kidney stones in urine. Cholesterol crystallization in bile causes the formation of gallstones. Cryotransmission microscopy (Chapter VIII) studies of human bile reveal vesicles, micelles, and potential early crystallites indicating that the cholesterol crystallization in bile is not cooperative and the true nucleation time may be much shorter than that found by standard clinical analysis by light microscopy [75]. Kidney stones often form from crystals of calcium oxalates in urine. Inhibitors can prevent nucleation and influence the solid phase and intercrystallite interactions [76, 77]. Citrate, for example, is an important physiological inhibitor to the formation of calcium renal stones. Electrokinetic studies (see Section V-6) have shown the effect of various inhibitors on the surface potential and colloidal stability of micrometer-sized dispersions of calcium oxalate crystals formed in synthetic urine [78, 79]. [Pg.338]

Phospholipid molecules form bilayer films or membranes about 5 nm in thickness as illustrated in Fig. XV-10. Vesicles or liposomes are closed bilayer shells in the 100-1000-nm size range formed on sonication of bilayer forming amphiphiles. Vesicles find use as controlled release and delivery vehicles in cosmetic lotions, agrochemicals, and, potentially, drugs. The advances in cryoelec-tron microscopy (see Section VIII-2A) in recent years have aided their characterization [70-72]. Additional light and x-ray scattering measurements reveal bilayer thickness and phase transitions [70, 71]. Differential thermal analysis... [Pg.548]

With the exception of the scanning probe microscopies, most surface analysis teclmiques involve scattering of one type or another, as illustrated in figure A1.7.11. A particle is incident onto a surface, and its interaction with the surface either causes a change to the particles energy and/or trajectory, or the interaction induces the emission of a secondary particle(s). The particles that interact with the surface can be electrons, ions, photons or even heat. An analysis of the mass, energy and/or trajectory of the emitted particles, or the dependence of the emitted particle yield on a property of the incident particles, is used to infer infomiation about the surface. Although these probes are indirect, they do provide reliable infomiation about the surface composition and structure. [Pg.304]

Scaiming probe microscopies have become the most conspicuous surface analysis tecimiques since their invention in the mid-1980s and the awarding of the 1986 Nobel Prize in Physics [71, 72]- The basic idea behind these tecimiques is to move an extremely fine tip close to a surface and to monitor a signal as a fiinction of the tip s position above the surface. The tip is moved with the use of piezoelectric materials, which can control the position of a tip to a sub-Angstrom accuracy, while a signal is measured that is indicative of the surface topography. These tecimiques are described in detail in section BI.20. [Pg.310]

Takayanagi K, Tanishiro Y, Takahashi M and Takahashi S 1985 Structural analysis of Si(111)-7 7 by UFIV-transmission electron diffraction and microscopy J. Vac. Sot Technol. A 3 1502... [Pg.316]

Knoll G and Plattner H 1989 Ultrastructural analysis of biological membrane fusion and a tentative correlation with biochemical and biophysical aspects Electron Microscopy of Subcellular Dynamics ed H Plattner (London CRC) pp 95-117... [Pg.1650]

Berriman J and Unwin N 1994 Analysis of transient structures by cryo-electron microscopy combined with rapid mixing of spray droplets Ultramicroscopy 56 241-52... [Pg.1654]

Light microscopy is of great importance for basic research, analysis in materials science and for the practical control of fabrication steps. Wlien used conventionally it serves to reveal structures of objects which are otherwise mvisible to the eye or magnifying glass, such as micrometre-sized structures of microelectronic devices on silicon wafers. The lateral resolution of the teclmique is detennined by the wavelength of tire light... [Pg.1654]

Additional information on elastomer and SAN microstmcture is provided by C-nmr analysis (100). Rubber particle composition may be inferred from glass-transition data provided by thermal or mechanochemical analysis. Rubber particle morphology as obtained by transmission or scanning electron microscopy (101) is indicative of the ABS manufacturing process (77). (See Figs. 1 and 2.)... [Pg.204]

Physical testing appHcations and methods for fibrous materials are reviewed in the Hterature (101—103) and are generally appHcable to polyester fibers. Microscopic analyses by optical or scanning electron microscopy are useful for evaluating fiber parameters including size, shape, uniformity, and surface characteristics. Computerized image analysis is often used to quantify and evaluate these parameters for quaUty control. [Pg.332]

Optical Techniques. The most important tool in a museum laboratory is the low power stereomicroscope. This instmment, usually used at magnifications of 3—50 x, has enough depth of field to be useful for the study of surface phenomena on many types of objects without the need for removal and preparation of a sample. The information thus obtained can relate to toohnarks and manufacturing techniques, wear patterns, the stmcture of corrosion, artificial patination techniques, the stmcture of paint layers, or previous restorations. Any art object coming into a museum laboratory is examined by this microscope (see Microscopy Surface and interface analysis). [Pg.417]


See other pages where Microscopy analysis is mentioned: [Pg.363]    [Pg.94]    [Pg.227]    [Pg.570]    [Pg.228]    [Pg.4]    [Pg.677]    [Pg.655]    [Pg.372]    [Pg.338]    [Pg.296]    [Pg.363]    [Pg.94]    [Pg.227]    [Pg.570]    [Pg.228]    [Pg.4]    [Pg.677]    [Pg.655]    [Pg.372]    [Pg.338]    [Pg.296]    [Pg.435]    [Pg.693]    [Pg.1546]    [Pg.1625]    [Pg.1640]    [Pg.1675]    [Pg.1718]    [Pg.1892]    [Pg.2500]    [Pg.2788]    [Pg.341]    [Pg.65]    [Pg.268]    [Pg.269]    [Pg.288]    [Pg.384]   
See also in sourсe #XX -- [ Pg.363 ]




SEARCH



Additive analysis scanning electron microscopy-energy

Analysis microscopy, Analytical

Atomic force microscopy analysis

Atomic force microscopy section analysis

Automated image analysis-scanning electron microscopy

Damage analysis microscopy

Elastomer blends microscopy analysis

Electron microscopy analysis

Electron microscopy chemical analysis

Electron microscopy energy-dispersive analysis

Electron microscopy image-analysis

Experimental transmission electron microscopy analyses

Fluorescence Microscopy Techniques for the Structural Analysis of Polymer Materials

Fluorescence microscopy image analysis

High content screening microscopy analysis

Microscopy TEM analysis

Microscopy image analysis

Microscopy image analysis techniques

Microscopy thermogravimetric analysis

Optical microscopy analysis

Optical microscopy crystalline material analysis

Optical microscopy representative analysis

Particle size analysis microscopy

Polarized light microscopy analysis

Quantitative microscopy image analysis

Scanning Electron Microscopy and Energy Dispersive Spectrometry Analyses

Scanning electrochemical microscopy analysis)

Scanning electron microscopy SEM analysis

Scanning electron microscopy analysis

Scanning electron microscopy and energy dispersive analysis using X-rays

Scanning electron microscopy cross-sectional analysis

Scanning electron microscopy image analysis

Scanning electron microscopy mixture analysis

Scanning electron microscopy structural analysis

Scanning electron microscopy surface analysis

Scanning electron microscopy with polarisation analysis

Scanning electron microscopy with polarization analysis

Scanning electron microscopy/energy dispersive X-ray analysis (SEM

Solid-state analysis microscopy

Surface analysis scanning force microscopy

Surface analysis scanning tunneling microscopy

Surface analysis secondary electron microscopy-energy

Transmission electron microscopy TEM) analysis

Transmission electron microscopy particle size analysis

© 2024 chempedia.info