Particles secondary

With the exception of the scanning probe microscopies, most surface analysis teclmiques involve scattering of one type or another, as illustrated in figure A1.7.11. A particle is incident onto a surface, and its interaction with the surface either causes a change to the particles energy and/or trajectory, or the interaction induces the emission of a secondary particle(s). The particles that interact with the surface can be electrons, ions, photons or even heat. An analysis of the mass, energy and/or trajectory of the emitted particles, or the dependence of the emitted particle yield on a property of the incident particles, is used to infer infomiation about the surface. Although these probes are indirect, they do provide reliable infomiation about the surface composition and structure. 

In the early days of the commercial development of PVC, emulsion polymers were preferred for general purpose applications. This was because these materials exist in the form of the fine primary particles of diameter of the order of 0.1-1.0 p,m, which in the case of some commercial grades aggregate into hollow secondary particles or cenospheres with diameters of 30-100 p,m. These emulsion polymer particles have a high surface/volume ratio and fluxing and gelation with plasticisers is rapid. The use of such polymers was, however, restricted because of the presence of large quantities of soaps and other additives necessary to emulsion polymerisation which adversely affect clarity and electrical insulation properties. 

Nearly all these techniques involve interrogation of the surface with a particle probe. The function of the probe is to excite surface atoms into states giving rise to emission of one or more of a variety of secondary particles such as electrons, photons, positive and secondary ions, and neutrals. Because the primary particles used in the probing beam can also be electrons or photons, or ions or neutrals, many separate techniques are possible, each based on a different primary-secondary particle combination. Most of these possibilities have now been established, but in fact not all the resulting techniques are of general application, some because of the restricted or specialized nature of the information obtained and others because of difficult experimental requirements. In this publication, therefore, most space is devoted to those surface analytical techniques that are widely applied and readily available commercially, whereas much briefer descriptions are given of the many others the use of which is less common but which - in appropriate circumstances, particularly in basic research - can provide vital information. 

A secondary particle formation process, which can increase crystal size dramatically, is crystal agglomeration. This process is particularly prevalent in systems exhibiting high levels of supersaturation, such as from precipitation reactions, and is considered along with its opposite viz. particle disruption in Chapter 6. Such high levels of supersaturation can markedly accentuate the effects of spatial variations due to imperfect mixing within a crystallizer. This aspect is considered further in Chapter 8. 

The significance of this novel attempt lies in the inclusion of both the additional particle co-ordinate and in a mechanism of particle disruption by primary particle attrition in the population balance. This formulation permits prediction of secondary particle characteristics, e.g. specific surface area expressed as surface area per unit volume or mass of crystal solid (i.e. m /m or m /kg). It can also account for the formation of bimodal particle size distributions, as are observed in many precipitation processes, for which special forms of size-dependent aggregation kernels have been proposed previously. 

All methods of surface analysis are based on primary particle irradiation of analyzed samples, causing primary flux disturbance or emission of secondary particles from the surface. Table 2 presents a classification of the most popular methods of analysis based on... 

For a given element, the sputter yield depends on the surface morphology surfaces that are rough on the scale comparable to the dimensions of the sputter cascade give higher yields of secondary particles than flat surfaces [4], For single crystals, sputter yields have been observed to vary with the plane exposed 17]. 

Coating of primary and secondary soil structures is an extremely important phenomenon for the analysis of soil. Without coating, the chemical activity of soil primary and secondary particles could be determined by knowledge of their structure and makeup. With coating, the chemistry becomes vastly more complex. This complexity is discussed in detail in later chapters. 

Figure 9.17 The basic schemes of (a) bidisperse (biporous) porous solid structure 1, nonporous primary particles, 2, aggregates of primary particles (secondary particles), 3, porous solid (granule, grain, pallet, etc.) (b) a bed of granules in a catalytic reactor 4.

Interesting and interrelated with the previous case is one of enclosed partitions, when one of two partitions can be further divided into two partitions. An illustrative example is shown in Figure 9.17a. A granule of catalyst can be divided into two partitions porous aggregates (secondary particles—partition 1) and pores between the aggregates (partition 2). Partition 1 can also be divided into two partitions nonporous particles (primary particles—partition 11) and pores between particles (partition 12), excluding pores between aggregates. Another case of enclosed partitions has already been considered the case of a porous supported catalyst, which can be divided into pores and a solid phase, while the solid phase can be divided into the support and the active component. 

Although, the true density of solid phase p=m/Vp (e.g., g/cm3) is defined by an atomic-molecular structure (/ ), it has become fundamental to the definition of many texture parameters. In the case of porous solids, the volume of solid phase Vp is equal to the volume of all nonporous components (particles, fibers, etc.) of a PS. That is, Vp excludes all pores that may be present in the particles and the interparticular space. The PS shown in Figure 9.17a is formed from nonporous particles that form porous aggregates, which, in turn, form a macroscopic granule of a catalyst. In this case, the volume Vp is equal to the total volume of all nonporous primary particles, and the free volume between and inside the aggregates (secondary particles) is not included. 

Wang, G.H. Aberth, W. Falick, A.M. Evidence Concerning the Identity of Secondary Particles in Post-Acceleration Detectors. Int. J. Mass Spectrom. Ion Proc. 1986, 69, 233-237. 

Coalescence does not immediatelyfollow after contact. Zsigmondy has noted, in the case of gold sols, under the ultramicroscope, that the small primary particles coalesce on contact to form secondary particles, that a primary will coalesce with a secondary, but two secondary particles do not coalesce. 

Another important characteristic is that ion beams can produce a variety of the secondary particles/photons such as secondary ions/atoms, electrons, positrons. X-rays, gamma rays, and so on, which enable us to use ion beams as analytical probes. Ion beam analyses are characterized by the respectively detected secondary species, such as secondary ion mass spectrometry (SIMS), sputtered neutral mass spectrometry (SNMS), electron spectroscopy, particle-induced X-ray emission (PIXE), nuclear reaction analyses (NRA), positron emission tomography (PET), and so on. 

Particles may be either directly emitted into the atmosphere or formed there by chemical reactions we refer to these as primary and secondary particles, respectively. The relative importance of primary and secondary particles will clearly depend on the phenomena examined, the geographical location with its particular mix of emissions, and the atmospheric chemistry. 

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