Surface Microscopies

Sumetsky, M. Dulashko, Y. DiGiovanni, D. J., Optical surface microscopy with a moving microsphere, In Nanophotonics Topical Meeting, OSA, Uncasville, 2006... 

A second example of the way in which deformation can be examined using surface microscopy is shown in fig. 13.2. What this figure reveals is a series of snapshots of the surface profile fhat attends a series of points on the stress-strain curve once plastic deformation has commenced. In keeping with our discussion of the emergence of slip traces, it is clear that with increasing deformation, both the number of active slip planes and the number of dislocations per slip plane increase. 

Depending on the sensitivity and experimental conditions, the methods of surface microscopy are many and varied. ... 

The second section of this volume is concerned with electroanalytical techniques, starting with the principles of standard voltammetric and amperometric methods, then progressing to more specialized, but equally important, experimental approaches that can provide major insights into electrochemical processes. Finally, the last section of this volume focuses on spectroelectrochemistry and surface microscopy techniques. 

It is hoped that this review is a useful introduction to the characteristics of semiconductor surfaces and molecular modeling approaches to address their structure, stability, and reactivity. These materials are complex, and an impression of the current utility and pitfalls of modeling to capture the important processes operative at these surfaces should be evident. The combination of ab initio modeling and experiment is clearly an incredibly powerful tool in this area. The ability of the calculations and the surface microscopies and spectroscopies to elucidate a convergent description is remarkable, and the connection between the two is quite natural. Much more information stands to be gained when the two methods are applied in parallel, and certainly more concretely than could be gained from either approach alone. The calculations allow observables to be explained in useful physical terms, and nonobservables to be quantified. At the scale of atoms and molecules, this approach is indispensable. 

The interpretation of CV data is ambiguous. However, if complemented with data from surface microscopy, x-ray absorption. Auger or photoelectron spectroscopy, and mass-sensitive techniques using electrochemical quartz crystal nanobalance (EQCN),... 

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