Scanning electron microscopy, surface

QCMB RAM SBR SEI SEM SERS SFL SHE SLI SNIFTIRS quartz crystal microbalance rechargeable alkaline manganese dioxide-zinc styrene-butadiene rubber solid electrolyte interphase scanning electron microscopy surface enhanced Raman spectroscopy sulfolane-based electrolyte standard hydrogen electrode starter-light-ignition subtractively normalized interfacial Fourier transform infrared... 

Rutherford Backscattering Spectroscopy Reflection High-Energy Electron Diffraction Scanning Electron Microscopy Surface (Sensitive) Extended X-Ray Absorption Fine Structure... 

Electrons Auger Electron Spectroscopy, Extended X-Ray Absorption Fine Structure, Low-Energy Electron Diffraction, Scanning Electron Microscopy, Surface Extended X-Ray Absorption Fine Structure, Ultraviolet Photoelectron Spectroscopy, X-Ray Absorption Near Edge Fine Structure, and X-Ray Photon Spectroscopy. 

Adsorption (Chemical Engineering) Batch Processing Catalysis, Homogeneous Catalysis, Industrial Electrochemistry Infrared Spectroscopy Mossbauer Spectroscopy Nuclear Magnetic Resonance Raman Spectroscopy Scanning Electron Microscopy Surface Chemistry... 

Inductively Coupled Plasma. Mass Spectrometry Archaeological Applications. Microscopy Techniques Scanning Electron Microscopy. Surface Analysis X-Ray Photoelectron Spectroscopy Particle-Induced X-Ray Emission Auger Electron Spectroscopy. X-Ray Absorption and Diffraction X-Ray Diffraction - Powder. X-Ray Fluorescence and Emission X-Ray Fluorescence Theory. 

See also Air Analysis Sampling. Microscopy Applications Environmental. Microscopy Techniques Light Microscopy Specimen Preparation for Electron Microscopy Scanning Electron Microscopy. Surface Analysis Low... 

Dan] X-ray powder diffraction, scanning electron microscopy Surface analysis (0-60 pm in depth) after laser treatment... 

ABSTRACT. The paper details the use of scanning electron microscopy, surface reflectance infrared spectroscopy, Auger electron spectroscopy, ion scattering spectroscopy, secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy in the analysis of polymeric adhesives and composites. A brief review of the principle of each surface analytical technique will be followed by application of the technique to interfacial adhesion with an emphasis on polymer/metal, fiber/matrix, and composite/composite adhesion. 

Figure 7.18 Scanning electron microscopy surface and cross-section of a pure polyamide (a and c) and a graphene oxide embedded matrix (b and d). A clear decrease in surface...

Electron Microprobe Analysis of Minerals Microscopy Scanning Electron Microscopy Surface Chemistry Positron Microscopy Transmission Electron Microscopy X-Ray Analysis X-Ray Photoelectron Spectroscopy... 

SEM Scanning electron microscopy [7, 10, 14] A beam of electrons scattered from a surface is focused Surface morphology... 

Otlier fonns of microscopy have been used to evaluate nanocrystals. Scanning electron microscopy (SEM), while having lower resolution tlian TEM, is able to image nanoparticles on bulk surfaces, for direct visualization of... 

Physical testing appHcations and methods for fibrous materials are reviewed in the Hterature (101—103) and are generally appHcable to polyester fibers. Microscopic analyses by optical or scanning electron microscopy are useful for evaluating fiber parameters including size, shape, uniformity, and surface characteristics. Computerized image analysis is often used to quantify and evaluate these parameters for quaUty control. 

In contrast to many other surface analytical techniques, like e. g. scanning electron microscopy, AFM does not require vacuum. Therefore, it can be operated under ambient conditions which enables direct observation of processes at solid-gas and solid-liquid interfaces. The latter can be accomplished by means of a liquid cell which is schematically shown in Fig. 5.6. The cell is formed by the sample at the bottom, a glass cover - holding the cantilever - at the top, and a silicone o-ring seal between. Studies with such a liquid cell can also be performed under potential control which opens up valuable opportunities for electrochemistry [5.11, 5.12]. Moreover, imaging under liquids opens up the possibility to protect sensitive surfaces by in-situ preparation and imaging under an inert fluid [5.13]. 

Perhaps the most significant complication in the interpretation of nanoscale adhesion and mechanical properties measurements is the fact that the contact sizes are below the optical limit ( 1 t,im). Macroscopic adhesion studies and mechanical property measurements often rely on optical observations of the contact, and many of the contact mechanics models are formulated around direct measurement of the contact area or radius as a function of experimentally controlled parameters, such as load or displacement. In studies of colloids, scanning electron microscopy (SEM) has been used to view particle/surface contact sizes from the side to measure contact radius [3]. However, such a configuration is not easily employed in AFM and nanoindentation studies, and undesirable surface interactions from charging or contamination may arise. For adhesion studies (e.g. Johnson-Kendall-Roberts (JKR) [4] and probe-tack tests [5,6]), the probe/sample contact area is monitored as a function of load or displacement. This allows evaluation of load/area or even stress/strain response [7] as well as comparison to and development of contact mechanics theories. Area measurements are also important in traditional indentation experiments, where hardness is determined by measuring the residual contact area of the deformation optically [8J. For micro- and nanoscale studies, the dimensions of both the contact and residual deformation (if any) are below the optical limit. 

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

In order to see the effect of the compatibilizer more clearly, SEM (scanning electron microscopy) micrographs of the peeled back exposed surface of the spun fibers are shown in Fig. 7. In a noncompatibilized blend, the long TLCP fibrils are bundled together (Fig. 7A). The fibril surface looks quite clean and smooth along the... 

Scanning Electron Microscopy in the Study of Solid Propellant Combustion. Part 111. The Surface Structure and Profile Characteristics of Burning Composite Solid Propellants , NavWeps-Cent r TP 5142-Part 3 (1971) 48) B.T. 

T.L. Boggs et al, AIAA J 8 (2), 370-72 (1970) CA 72, 113371 (1970) Scanning electron microscopy is used to study the surface structure of solid proplnts, prepd from AP (1) and polyurethane or caiboxylated polybutadiene. Polyurethane proplnts are self-extinguish-ing at high pressure due to the flow of molten binder over I crystals. I crystals formed a thin surface melt with gas liberation in the molten phase... 

Some limitations of optical microscopy were apparent in applying [247—249] the technique to supplement kinetic investigations of the low temperature decomposition of ammonium perchlorate (AP), a particularly extensively studied solid phase rate process [59]. The porous residue is opaque. Scanning electron microscopy showed that decomposition was initiated at active sites scattered across surfaces and reaction resulted in the formation of square holes on m-faces and rhombic holes on c-faces. These sites of nucleation were identified [211] as points of intersection of line dislocations with an external boundary face and the kinetic implications of the observed mode of nucleation and growth have been discussed [211]. 

Scanning electron microscopy and replication techniques provide information concerning the outer surfaces of the sample only. Accurate electron microprobe analyses require smooth surfaces. To use these techniques profitably, it is therefore necessary to incorporate these requirements into the experimental design, since the interfaces of interest are often below the external particle boundary. To investigate the zones of interest, two general approaches to sample preparation have been used. 

---