Particle-induced

By inserting a semiconductor x-ray detector into the analysis chamber, one can measure particle induced x-rays. The cross section for particle induced x-ray emission (PIXE) is much greater than that for Rutherford backscattering and PIXE is a fast and convenient method for measuring the identity of atomic species within... 

Each of the elements has a number of isotopes (2,4), all radioactive and some of which can be obtained in isotopicaHy pure form. More than 200 in number and mosdy synthetic in origin, they are produced by neutron or charged-particle induced transmutations (2,4). The known radioactive isotopes are distributed among the 15 elements approximately as follows actinium and thorium, 25 each protactinium, 20 uranium, neptunium, plutonium, americium, curium, californium, einsteinium, and fermium, 15 each herkelium, mendelevium, nobehum, and lawrencium, 10 each. There is frequently a need for values to be assigned for the atomic weights of the actinide elements. Any precise experimental work would require a value for the isotope or isotopic mixture being used, but where there is a purely formal demand for atomic weights, mass numbers that are chosen on the basis of half-life and availabiUty have customarily been used. A Hst of these is provided in Table 1. 

X-radiation can also be induced by high energy (several Me proton beams from ion accelerators. Such particle-induced x-ray emission (PIXE) (284) is useful for thin samples and particulates, having detection Hmits of g. Intense synchrotron x-ray sources have found appHcations in... 

Three techniques involving the use of X-ray emission to obtain quantitative elemental analysis of materials are described in this chapter. They are X-Ray Fluorescence, XRF, Total Reflection X-Ray Fluorescence, TXRF, and Particle-Induced X-Ray Emission, PIXE. XRF and TXRF use laboratory X-ray tubes to excite the emission. PIXE uses high-energy ions from a particle accelerator. 

Particle Induced X-Ray Emission Hydrogen/Helium Induced X-ray Emission... 

Vol. 133. Particle-Induced X-Ray Emission Spectrometry. By Sven A. E. Johansson, John L. Campbell, and Klas G. Malmqvist... 

X-Ray irradiation of quartz or silica particles induces an electron-trap lattice defect accompanied by a parallel increase in cytotoxicity (Davies, 1968). Aluminosilicate zeolites and clays (Laszlo, 1987) have been shown by electron spin resonance (e.s.r.) studies to involve free-radical intermediates in their catalytic activity. Generation of free radicals in solids may also occur by physical scission of chemical bonds and the consequent formation of dangling bonds , as exemplified by the freshly fractured theory of silicosis (Wright, 1950 Fubini et al., 1991). The entrapment of long-lived metastable free radicals has been shown to occur in the tar of cigarette smoke (Pryor, 1987). 

Although sophisticated methods may constitute the core methods for certification it is useful to include good, well executed routine methods. In order to further minimize systematic error, a conscious purposeful attempt should be made to get methods and procedures with wide-ranging and different sample preparation steps, including no decomposition as in instrumental neutron activation analysis and particle induced X-ray emission spectrometry. 

Energy dispersive, wavelength dispersive and particle induced techniques... 

Neutron Activation Analysis X-Ray Fluorescence Particle-Induced X-Ray Emission Particle-Induced Nuclear Reaction Analysis Rutherford Backscattering Spectrometry Spark Source Mass Spectrometry Glow Discharge Mass Spectrometry Electron Microprobe Analysis Laser Microprobe Analysis Secondary Ion Mass Analysis Micro-PIXE... 

Principles and Characteristics Particle-induced X-ray emission spectrometry (PIXE) is a high-energy ion beam analysis technique, which is often considered as a complement to XRF. PIXE analysis is typically carried out with a proton beam (proton-induced X-ray emission) and requires nuclear physics facilities such as a Van der Graaff accelerator, or otherwise a small electrostatic particle accelerator. As the highest sensitivity is obtained at rather low proton energies (2-4 MeV), recently, small and relatively inexpensive tandem accelerators have been developed for PIXE applications, which are commercially available. Compact cyclotrons are also often used. 

HTE High-throughput experimentation iPIXE Imaging particle-induced X-ray... 

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