Internal reflectance

PTM Photon tunneling microscopy [12] An interface is probed with an evanescent wave produced by internal reflection of the illuminating light Surface structure... 

Protein adsorption has been studied with a variety of techniques such as ellipsome-try [107,108], ESCA [109], surface forces measurements [102], total internal reflection fluorescence (TIRE) [103,110], electron microscopy [111], and electrokinetic measurement of latex particles [112,113] and capillaries [114], The TIRE technique has recently been adapted to observe surface diffusion [106] and orientation [IIS] in adsorbed layers. These experiments point toward the significant influence of the protein-surface interaction on the adsorption characteristics [105,108,110]. A very important interaction is due to the hydrophobic interaction between parts of the protein and polymeric surfaces [18], although often electrostatic interactions are also influential [ 116]. Protein desorption can be affected by altering the pH [117] or by the introduction of a complexing agent [118]. 

In 1960, Harrick demonstrated that, for transparent substrates, absorption spectra of adsorbed layers could be obtained using internal reflection [42]. By cutting the sample in a specific trapezoidal shape, the IR beam can be made to enter tlirough one end, bounce internally a number of times from the flat parallel edges, and exit the other end without any losses, leading to high adsorption coeflScients for the species adsorbed on the external surfaces of the plate (Irigher than in the case of external reflection) [24]. This is the basis for the ATR teclmique. 

Tokunaga M, Kitamura K, Saito K, Iwane A H and Yanagida T 1997 Single molecule imaging of fluorophores and enzymatic reactions achieved by objective-type total internal reflection fluorescence microscopy Biochem. Biophys. Res. Commun. 235 47-53... 

The two ends of the laser diode in Figure 9.11 are polished to increase internal reflection. As a consequence of the cavity geometry the laser beam is, unlike that of most lasers, highly divergent. 

Attenuated total reflection, on which atr—ftir is based, occurs when the rarer medium is absorbing and is characterized by a complex refractive index (40). The absorbing characteristics of this medium allow coupling to the evanescent field such that this field is attenuated to an extent dependent on k. The critical angle in the case of attenuated total reflection loses its meaning, but internal reflection still occurs. Thus, if the internally reflected beam is monitored, its intensity will reflect the loss associated with the internal reflection process at the interface with an absorbing medium. 

The real utility of d comes in the analysis of thin films. Consider a substrate of refractive index supporting a thin film of thickness d and refractive index in contact with an internal reflection element (the prism) of refractive index as shown in Figure 24. In this case, d depends on the polarization of the incident light beam and is given by... 

The above discussion was based on the premise of a single internal reflection. An increase in sensitivity can be realized through the use of multiple internal reflections. In the case of multiple reflections, the absorbance A becomes... 

Atr—ftir can be readily performed on most commercial ftir spectrometers through the use of an attachment for atr spectroscopy. These devices provide ir-transparent internal reflection elements that are typically made of Ge, KRS-5, ZnSe, or ZnS. These internal reflection elements are made of materials that are of extremely high purity to avoid losses from absorption by impurities in these devices. Coupling of a thin film or surface sample to one of these reflection elements is accompHshed by pressing the sample against the element while acquiring the spectmm. 

N. J. Harrick, Internal Reflection Spectroscopy, ]olm. Wiley Sons, Inc., New York, 1967. 

Fig. 2. Waveguide stmcture showiag the total internal reflection of light. The diameter, is 50 p.m for a standard multimode system, 62.5 p.m for a large...

Attenuated total reflection (ATR), also called internal reflection, is based on the phenomenon of total internal reflection. In ATR the infrared beam is directed into an infrared-transmitting crystal so that it strikes the crystal surface at less than the critical angle and undergoes total internal reflection. 

Latexes of synthetic resins are identified by ir spectrometry. Selective extraction with organic solvents is used to obtain purified fractions of the polymers for spectrometric identification. Polymeric films can be identified by the multiple internal reflectance ir technique, if the film is smooth enough to permit intimate contact with the reflectance plate. TAPPI and ASTM procedures have not been written for these instmmental methods, because the interpretation of spectra is not amenable to standardization. 

Examples of nir analysis are polymer identification (126,127), pharmaceutical manufacturing (128), gasoline analysis (129,130), and on-line refinery process chemistry (131). Nir fiber optics have been used as immersion probes for monitoring pollutants in drainage waters by attenuated total internal reflectance (132). The usefulness of nir for aqueous systems has led to important biological and medical appHcations (133). 

Figure 4.7. Internal reflection of a shock wave from a free surface, (a) Reflection of a shock wave from a free surface causes a reflected rarefaction wave. As indicated in (b), this increases the velocity of the shocked material from u, to Uf. The path upon shocking is Rayleigh line 0-1, whereas unloading occurs along release isentrope curve I -O, (c) Release isentrope path in P- V plane is indicated.

For a simplified case, one can obtain the rate of CL emission, =ft GI /e, where /is a function containing correction parameters of the CL detection system and that takes into account the fact that not all photons generated in the material are emitted due to optical absorption and internal reflection losses q is the radiative recombination efficiency (or internal quantum efficiency) /(, is the electron-beam current and is the electronic charge. This equation indicates that the rate of CL emission is proportional to q, and from the definition of the latter we conclude that in the observed CL intensity one cannot distii pish between radiative and nonradiative processes in a quantitative manner. One should also note that q depends on various factors, such as temperature, the presence of defects, and the... 

A method for quantification of the CL, the so-called MAS corrections, in analogy with the ZAP correction method for X rays (see the article on EPMA), has been proposed to account for the effects of the excess carrier concentration, absorption and surface recombination. In addition, a total internal reflection correction should also be included in the analysis, which leads to the MARS set of corrections. This method can be used for further quantification efforts that also should involve Monte Carlo calculations of the generation of excess carriers. 

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