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Total internal reflection fluorescence microscopy materials

Total internal reflection fluorescence microscopy (TIRFM), or simply TIRF, is the application of fluorescence imaging to evanescent-wave microscopy. The material of interest is tagged with fluorescent material that emits light at wavelengths greater than the excitation photons from the evanescent field, which additionally improves the detectability of the evanescent-wave microscopy technique. [Pg.3334]


See other pages where Total internal reflection fluorescence microscopy materials is mentioned: [Pg.122]    [Pg.1051]    [Pg.452]    [Pg.139]    [Pg.103]    [Pg.203]    [Pg.202]   
See also in sourсe #XX -- [ Pg.407 ]




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Fluorescence internal reflectance

Fluorescence microscopy

Fluorescent materials

Internal fluorescence

Internal reflectance

Internally reflected

Microscopy fluorescent

Microscopy materials

Reflectance total internal

Reflectivity total

Total internal reflectance fluorescence

Total internal reflectance fluorescence microscopy

Total internal reflection

Total internal reflection fluorescence

Total internal reflection fluorescence microscopy

Total internal reflection microscopy

Total internal reflection, fluorescent

Total reflection

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