Total internal reflection curved interface

The possibility of reflection of electrons by an evanescent wave formed upon the total internal reflection of femtosecond light pulses from a dielectric-vacuum interface is quite realistic. The duration of the reflected electron pulses may be as long as 100 fs. In the case of electrons reflecting from a curved evanescent wave, one can simultaneously control the duration of the reflected electron pulse and affect its focusing (Fig. lc). Of course, one can imagine many other schemes for controlling the motion of electrons, as is now the case with resonant laser radiation of moderate intensity [9, 10]. In other words, one can think of the possibility of developing femtosecond laser-induced electron optics. Such ultrashort electron pulses may possibly find application in studies into the molecular dynamics of chemical reactions [1,2]. 

Here, a laser beam totally internally reflects at a sohd/hquid interface, creating an evanescent field, which penetrates only a fraction of the wavelength into the liquid domain. When using planar phosphoHpid bilayer and fluorescently labeled proteins, this method allows the determination of adsorption/desorption rate constants and surface diffusion constants [171—173]. Figure 6.29 shows a representative TIRF-FPR curve for fluorescein-labeled prothrombin bound to planar membranes. In this experiment the experimental conditions are chosen such that the recovery curve is characterized by the prothrombin desorption rate. It should be mentioned that, similar to other applications of fluorescence microscopy, two and three photon absorption might be combined with FRAP in the near future. 

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